浅谈单片机的自动检测系统的设计

CPLD是一种可实现复杂逻辑编程的器件,是本文所研究系统的核心。该系统包括CPLD控制模块、串口收发模块、JTAG并口下载模块等。其检测原理为:由CPLD完成信号检测,并实现与单片机的串行。对单片机存储数据进行分析,确保其写入与读出信息相一致,对串口通讯功能进行检测。继续对单片机GPIO进行检测,判断单片机的整体运行效率。     

基于EPM1240的SDRAM控制器的设计

SDRAM的读写逻辑复杂,最高时钟频率达100 MHz以上,普通单片机无法实现复杂的SDRAM控制操作。复杂可编程逻辑器件CPLD具有编程方便,集成度高,速度快,价格低等优点。因此选用CPLD设计SDRAM接口控制模块,简化主机对SDRAM的读写控制。通过设计基于CPLD的SDRAM控制器接口,可以在STM系列、ARM系列、STC系列等单片机和DSP等微处理器的外部连接SDRAM,增加系统的存储空间。     

多阶母盘刻录系统中的激光多阶功率写入控制

描述了多阶母盘刻录系统中一种基于丁业标准结构(ISA)总线接口和复杂可编程逻辑器件(CPLD)技术的激光多功率写入控制方法及其控制电路的设汁实现。控制电路以丁业标准结构总线接口与计算机通信。以复杂可编程逻辑器件为核心处理单元，采用外加功率探测器进行功率反馈。可以同时控制激光器的写入功率和写入时间，使半导体激光器可以对母盘上感光材料进行多阶功率的曝光刻写，同时写入时间可调，从而实现母盘的多阶刻录。已经用于多阶母盘刻录实验系统，可以兼容不同类型的半导体激光器。实验结果表明，使用此控制电路可以在光致变色材料盘片上实现至少8阶功率写入。并获得8阶信号。其最小写入时间125ns，长时间工作输出功率的不稳定性小于1％，可满足只读型多阶光盘的刻录需要。     

高精度双路相关脉冲激光器的设计

基于复杂可编程逻辑器件(CPLD)和单片机技术,设计了一种高精度多功能双路相关脉冲激光器,从整体上介绍了设计此设备需考虑的几个方面,并重点阐述了单片机模块、CPLD处理单元、高精度时钟和驱动电路的基本设计方法。通过实验测试验证展示了本设计的功能和精度要求。     

高速编码半导体激光器控制电路设计

基于单片机和高速复杂可编程逻辑器件(CPLD)技术,介绍了单片机模块、CPLD处理模块和驱动电路模块的基本设计方法.重点阐述了通过CPLD硬件电路对外围RAM进行寻址的设计思想,同时给出RAM寻址电路的读写时序关系图.通过示波器(TDS5104B)观测,证明控制电路产生的脉冲序列编码具有精度高、速度快、间隔可变等优点.     

基于MCU+CPLD的相位差和频率的测量方法研究及实现

介绍了一种基于复杂可编程逻辑器件CPLD与单片机的相位和频率测量方法,其中单片机完成控制和数据处理.给出了硬件原理图和CPLD设计核心模块,可有效提高测量精度和抗干扰能力.     

基于CH372的USB通信技术研究

以Silicon Laboratorcs公司的C8051F020为系统单片机,并以CH372作为USB接口芯片,进行USB传输;同时利用CPLD实现地址译码与读写控制,从而可根据需要扩展外围功能模块,不仅方便电路的改进,同时达到了很好的传输效果,充分发挥了USB高速传输的特点。     

基于单片机与CPLD的无线控制系统

介绍一种基于单片机与CPLD结合的传感器网络节点的无线控制系统.节点中单片机对无线命令进行译码,并对外围子模块进行控制,CPLD扩展控制系统的并行I/O端口、SPI串行接口等,从而根据系统需要可扩展无线传感网络节点的外围功能模块.采用单片机与CPLD模块化设计方法,降低了设计成本,方便电路的多次改进,为传感器网络节点在不同场合的应用提供了一种通用的方法.     

CPLD在伺服控制系统中的应用

以对EPM1270T144I5 CPLD的开发为例,介绍了一种基于CPLD的伺服控制系统设计方法。做为单片机等主控芯片的协处理器,CPLD的应用有效的分担了主控芯片的任务量,为其节省内部资源并提高系统的可靠性。     

视频图像选场显示控制器的设计与应用

介绍了一种基于单片机和CPLD的视频图像选场显示控制系统.利用可编程视频输入处理芯片SAA7111A,实现了基于单片机和CPLD控制的对PAL制式全电视图像信号的选场显示,交流了设计实现中的一些体会.     

Technology innovation and process integrations for sub-100nm gate patterning

This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.     

White organic light-emitting devices based on fac tris（2- phenylpyridine） iridium sensitized 5,6,11,12-tetraphenylnap -hthacene

We have fabricated the white organic light-emitting devices （WOLEDs） based on 4,4＇ -bis（2,2 -diphenyl vinyl）-1,1＇ - biphenyl （DPVBi） and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene （rubrene）. The device structure is ITO/2T-NATA （20 nm）/NPBX （20 nm）/CBP： x%Ir（ppy）3：0.5% rubrene （8 nm）/NPBX （5 nm）/DPVBi （30 nm）/Alq（30 nm）/LiF（0.5 nm）/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris （2-phenylpyridine） iridium [Ir（ppy）3], acts as a yellow light-emitting layer, and N,N＇ -bis- （1-naphthyl）- N,N＇ -diphenyl -1, 1＇ -biphenyl-4,4＇ -diamine （NPBX） acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir （PPY）3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.     

Complete approach to automatic identification and subpixel center location for ellipse feature

To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.     

小角度扩展相关性近似算法分析

本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

A Versatile Mixed-Signal Pin Approach for Cost-Effective Test of Automotive ICs

Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

Optical vibration and deviation measurement of rotating machine parts

It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer （LDV）.