| Complete approach to automatic identification and sub-pixel center location for ellipse feature |
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| 作者姓名： | XUE Ting WU Bin SUN Mei YE Sheng-hua |
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| 作者单位： | [1]College of Electrical and Automation Engineering, Tianjin University, Tianjin 300072, China [2]State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China [3]Tianjin Engine Research Institute, Tianjin 300072, China |
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| 基金项目： | This work has been supported by the Special Funds of NationalNatural Science Funds of China ( No. 50327501)，the MajorProject of Natural Science Fundation of Tianjin in China[05YFJZJC01700] |
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| 摘 要： | To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.
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| 关 键 词： | 光检测技术 自动识别 椭圆 中心定位 |
| 文章编号： | 1673-1905（2008）01-0051-04 |
| 收稿时间： | 2007-09-05 |
Complete approach to automatic identification and subpixel center location for ellipse feature |
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| XUE Ting WU Bin SUN Mei YE Sheng-hua.Complete approach to automatic identification and sub-pixel center location for ellipse feature[J].Opto-electronics Letters,2008,4(1):51-54. |
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| Authors: | Ting Xue Bin Wu Mei Sun and Sheng-hua Ye |
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| Affiliation: | (1) College of Electrical and Automation Engineering, Tianjin University, Tianjin, 300072, China;(2) State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, 300072, China;(3) Tianjin Engine Research Institute, Tianjin, 300072, China |
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| Abstract: | To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction. |
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| Keywords: | image features ellipse location center subpixel automatic identification approach instrumentation easy realization interaction experiment practical valid algorithm area based edge attribute method |
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