基于PVT法自发形核生长AlN晶体的研究

根据物理气相传输法(PVT) AlN晶体生长特点及工艺要求,自主设计了AlN晶体生长炉及其配套热场.FEMAG软件热场模拟结果表明,自主设计的晶体生长炉及其配套热场可以达到AlN晶体生长所需坩埚内部温度梯度要求.基于设计的PVT生长炉,开展了在2 250℃生长温度、40 h长晶时间条件下的自发形核生长实验.实验研究结果表明,在该工艺条件下,通过自发形核可生长得到典型长度为3～Smm、直径为2 mm的高质量AlN单晶;AlN晶体的c-plane(0001)生长速率最快,易形成尖锥形晶体结构,不利于晶体的扩径;Raman表征图谱中AlN晶体的E2 (high)半峰宽仅为5.65 cm-1,表明AlN晶体质量非常高;SEM、EDS分析得出晶体内部质量较为均匀,c-plane和m-plane腐蚀形貌特征明显.     

物理气相传输法生长大尺寸AlN晶体及其性质表征

利用物理气相传输法生长了直径40～50 mm、厚约8～10 mm的AlN多晶锭,最大晶粒尺寸为5 mm.用喇曼散射和阴极荧光谱研究了AlN晶体的结晶质量、缺陷和结构特性.分析了不同温度下AlN晶体的导电特性,并确定在AlN晶体中存在一个激活能约为0.98eV的深能级缺陷.结合这些结果分析了PVT法生长条件对AlN体单晶生长和晶体质量的影响.     

物理气相传输法生长大尺寸AlN晶体及其性质表征

利用物理气相传输法生长了直径40～50 mm、厚约8～10 mm的AlN多晶锭,最大晶粒尺寸为5 mm.用喇曼散射和阴极荧光谱研究了AlN晶体的结晶质量、缺陷和结构特性.分析了不同温度下AlN晶体的导电特性,并确定在AlN晶体中存在一个激活能约为0.98eV的深能级缺陷.结合这些结果分析了PVT法生长条件对AlN体单晶生长和晶体质量的影响.     

氮化时间对脉冲激光沉积AlN薄膜性能的影响

应用脉冲激光沉积(PLD)技术在氮化处理后的蓝宝石衬底上外延生长AlN薄膜。研究了氮化处理时间对AlN薄膜结构性能和表面形貌的影响,利用原位反射式高能电子衍射(RHEED)对生长过程进行实时观测,利用高分辨X射线衍射仪(HRXRD)和扫描电子显微镜(SEM)对AlN薄膜的结构性能以及表面形貌等进行表征和分析。结果表明,随着氮化时间的增加,AlN形核种子数量增加并逐渐有序,促进AlN薄膜由多晶转为单晶并提高其晶体质量,有利于AlN薄膜由三维生长转为二维生长,改善AlN薄膜表面形貌。为采用PLD技术制备高质量AlN基器件提供了一种新思路。     

坩埚位置对PVT生长AlN晶体过程中物质传输的影响

使用FEMAG晶体生长模拟仿真软件以及自主开发的PVT法有限元传质模块对全自动、双电阻加热物理气相沉积炉开展了AlN晶体生长工艺过程中不同坩埚埚位对温度场、过饱和度场及烧结体升华速率等影响的模拟仿真分析研究。模拟仿真结果表明:在给定工艺条件下,坩埚埚位较低时烧结体温度较高且内部温差较小,烧结体升华表面存在较大的Al蒸气分压梯度,各表面升华速率较快且均匀,籽晶衬底生长前沿温度场呈微凸分布,有利于晶体扩径及生长高质量晶体。随着坩埚埚位的上升,低温区向坩埚壁扩展,预烧结体内轴向及径向温度梯度增加,籽晶衬底附近径向温度梯度逐步降低,过饱和度区域扩大且增强。在坩埚埚位较高情况下,坩埚内原料升华变得不均匀,坩埚侧壁存在高过饱和区域,极易在坩埚壁上发生大量的AlN多晶沉积。模拟分析结果与大量实际晶体生长实验后的坩埚壁处沉积现象及剩余烧结体原料形态相符,较好地验证了模拟仿真分析结果的准确性。     

SiC单晶生长界面形状计算机模型的建立及验证

利用多物理场耦合模拟软件研究了3英寸(1英寸=2.54 cm)碳化硅(SiC)单晶生长中感应线圈位置对单晶生长系统温度场的影响.分析了感应线圈位置变化对晶体表面径向温度、晶体内部轴向温度以及晶体生长界面形状的影响.同时分析了不同生长时期晶体的界面形状和各向温差的变化规律,建立了3英寸SiC单晶生长界面形状计算机模型,进而将计算机模拟得到的晶体界面形状与单晶生长对照实验获得晶体的界面形状相对比,验证了该模型的可靠性.以此为依据,优化了单晶生长工艺参数,获得了理想的适合3英寸SiC单晶生长的温度场,并成功获得了高质量的3英寸SiC单晶.     

AlN缓冲层厚度对脉冲激光沉积技术生长的GaN薄膜性能的影响

在蓝宝石(Al2O3)衬底上应用脉冲激光沉积技术(PLD)生长不同厚度的AlN缓冲层后进行GaN薄膜外延生长。采用高分辨X射线衍射仪(HRXRD)和扫描电子显微镜(SEM)对外延生长所得GaN薄膜的晶体质量和表面形貌进行了表征。测试结果表明: 相比直接在Al2O3衬底上生长的GaN薄膜, 通过生长AlN缓冲层的GaN薄膜虽然晶体质量较差, 但表面较平整; 而且随着AlN缓冲层厚度的增加, GaN薄膜的晶体质量和表面平整度均逐渐提高。可见, AlN缓冲层厚度对在Al2O3衬底上外延生长GaN薄膜的晶体质量和表面形貌有着重要的影响。     

AlN缓冲层厚度对脉冲激光沉积技术生长的GaN薄膜性能的影响

在蓝宝石(Al2O3)衬底上应用脉冲激光沉积技术(PLD)生长不同厚度的AlN缓冲层后进行GaN薄膜外延生长。采用高分辨X射线衍射仪(HRXRD)和扫描电子显微镜(SEM)对外延生长所得GaN薄膜的晶体质量和表面形貌进行了表征。测试结果表明:相比直接在Al2O3衬底上生长的GaN薄膜,通过生长AlN缓冲层的GaN薄膜虽然晶体质量较差,但表面较平整;而且随着AlN缓冲层厚度的增加,GaN薄膜的晶体质量和表面平整度均逐渐提高。可见,AlN缓冲层厚度对在Al2O3衬底上外延生长GaN薄膜的晶体质量和表面形貌有着重要的影响。     

SiC籽晶上生长AlN单晶的断裂特性研究

通过扫描电镜(SEM)观察了SiC籽晶上生长AlN单晶的断裂面形貌。模拟了SiC籽晶与AlN晶体之间的应力分布。通过计算不同晶面的面间距,确定了六方晶系的AlN晶体中m面为解理面。拉曼光谱仪对不同晶面的特性进行了表征。结果表明,断裂面为m面,即裂纹扩展并沿m面解理形成断裂面。切割面为c面,AlN沿垂直于c方向生长。拉曼光谱中波数为656.2 cm-1的（E2(high)声子模为AlN单晶中的特征拉曼峰） 声子模式的半高宽为6.5 cm-1,晶体质量高。残余的张应力是裂纹产生的主要原因。     

通过双中温AlN插入层提高半极性(1122)面AlN薄膜的表面形貌和晶体质量

利用金属有机化学气相沉积方法在蓝宝石衬底上生长了一系列具有双中温AlN插入层(MTG-AlN)的半极性AlN薄膜样品。中温生长的AlN插入层具有较大的表面粗糙度,形成了类似纳米级图形化衬底结构,能够有效阻断高温生长的半极性AlN样品中堆垛层错的传播,从而提高半极性AlN样品的表面形貌和晶体质量。通过原子力显微镜和X射线衍射仪的表征,研究了MTG-AlN插入层厚度在20～100 nm之间的变化对半极性AlN样品的表面形貌和晶体质量的影响。结果表明,所有半极性AlN样品都具有■取向。当插入的MTG-AlN中间层厚度约为80 nm时,半极性AlN样品表面粗糙度显著降低,晶体质量明显改善。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.