“信号与系统”与“通信原理”的教学关系研究

"信号与系统"与"通信原理"两课程,均是电子信息与工程专业的专业基础课。"信号与系统"作为"通信原理"的先修课之一,为"通信原理"课程的学习奠定了知识储备。而"通信原理"的顺利开展,不仅要紧密联系"信号与系统"中的相关概念,更会对"信号与系统"加深理解。本文梳理了"通信原理"教学过程中最常用的一些"信号与系统"课程中的知识点,并对两课程教学之间的关系给予了一定的分析。     

通信原理翻转课堂教学研究——以“通信基本概念”为例

通信原理是电子信息工程、通信工程专业学生必不可少的一门专业核心课程,"通信基本概念"是本课程的第一章的学习内容,这一章讲解的教学质量,对后续专业知识的学习将起到至关重要的作用。本文通过课前视频自学、课中重点分析、课后深入讨论三位一体的翻转课堂教学方式进行"通信基本概念"部分教学,实现了"以学生为中心"的自主学习,提高学生的综合素质。     

《通信原理》教学中的微课应用探索

微课作为一种新型的教育信息资源形式就以其“主题突出、短小精悍、交互性好、应用面广”等特点被广泛认可,结合微课和《通信原理》的特点来看,《通信原理》课程特别适合采用微课教学,将难以理解的知识点、案例教学的知识点都用微课形式来体现。针对我校指挥类教育模式和课程设置以及学员特点,在《通信原理》实践教学中尝试引入微课模式,达到了较好的教学效果。     

“通信原理”多元化教学的探索实践

本文结合我系"通信原理"课程的教学实践情况,从教学内容设置、课堂教学方法、课程实验和课程考查方式等四个方面,介绍了"通信原理"课程多元化教学的构架体系.本文通过实际教学情况以及学生反馈,深入探讨和分析了基于以上教学体系的多元化改进手段.通过精炼筛选的教学内容、多媒体课堂教学、规范化的课程实验及科学的考查方式,提高了课程的教学质量,有效地培养了学生自主学习和创新的能力.     

通信原理课程的多维度教学设计

阐述通信原理课程的教学现状,通信原理课程的教学目标和教学实践,形成了面向新工科的通信原理课程教学大纲、课程教学教案、课程教学课件、教学案例的改革成果,对新工科专业相关课程改革起到了示范作用。     

基于Labview的通信原理课程教学平台的构建

针对通信原理课程中的模拟和数字调制解调等授课内容抽象,课堂讲授难度较大等问题,文章提出利用Labview软件构建通信原理课程教学平台。该教学平台主要实现了模拟调制和解调的波形仿真、数字调制和解调的波形仿真以及脉冲编码调制的编码和解码波形,而且仿真参数可以任意设置。该教学平台的构建有效地提高了课堂授课效率,提高了学生的学习效率,而且更利于学生对通信原理课程重点和难点的掌握,全面提高了通信原理课程的课堂教学质量。     

基于LabVIEW的"通信原理"虚拟实验平台设计

针对"通信原理"课程特点及现有实验教学条件的不足,文章提出将LabVIEW软件引入"通信原理"课程教学,并以"通信原理"课程的重点内容模拟调制系统、数字调制系统为例,给出"通信原理"虚拟实验平台的实现方式,并以2FSK为例展现整个实验的实现过程.     

“通信原理”双语教学探索与实践

本文介绍了“通信原理”双语课程建设中进行的一些有益探索和实践.阐述了开展“通信原理”双语教学的原因和意义,针对课程特点从教学理念更新、教学内容改革、教学方法综合运用三个方面总结了教学过程中的问题和相应的解决方法,最后针对进一步提升教学效果提出了几点思考.     

新工科背景下“通信原理”教学研究

"通信原理"课程是电子信息类专业的一门重要的基础必修课程,也是大部分高校考研的必考课程之一。如何在新工科背景下提高"通信原理"课程的教学质量、培养学生学习能力、创新能力、独立思考等能力的作用至关重要。文章主要阐述如何在新工科背景下,对"通信原理"课程教学进行调整,使其更适应新工科对电子信息类人才培养的要求,使培养出的学生能更好地适应飞速发展的社会。     

通信原理教学改革与“3+3”实践教学模式

基于通信原理课程的特点,针对三亚学院学生的情况,对通信原理课程教学改革进行了研究。从教材选择到课堂教学以及如何强化学生实践能力的实践教学分别进行了分析,提出将课堂教学和"3+3"实践教学模式相融合的教学思路。综合运用多媒体手段,使用基于Matlab、SystemView等平台的仿真实验手段提高学生的学习兴趣和对课程相关内容的理解深度。     

Development of the readout system for waveguide multilayer optical card

Waveguide multilayer optical card （WMOC） is a novel storage device of three-dimensional optical information. An advanced readout system fitting for the WMOC is introduced in this paper. The hardware mainly consists of the light source for reading, WMOC, motorized stages addressing unit, microscope imaging unit, CCD detecting unit and PC controlling ＆ processing unit. The movement of the precision motorized stage is controlled by the computer through Visual Basic （VB） language in software. A control panel is also designed to get the layer address and the page address through which the position of the motorized stages can be changed. The WMOC readout system is easy to manage and the readout result is directly displayed on computer monitor.     

Nanoimprint Lithography -A Next Generation High Volume Lithography Technique

IntroductionNanoimprint Lithography is a well-acknowl-edged low cost, high resolution, large area pattern-ing process. It includes the most promising methods,high-pressure hot embossing lithography (HEL) [2],UV-cured imprinting (UV-NIL) [3] and micro contactprinting (m-CP, MCP) [4]. Curing of the imprintedstructures is either done by subsequent UV-lightexposure in the case of UV-NIL or by cooling downbelow the glass transition temperature of the ther-moplastic material in case of HEL…     

Collinear phase-matching study of terahertz-wave generation via difference frequency mixed in GaAs and Inp

The collinearly phase-matching condition of terahertz-wave generation via difference frequency mixed in GaAs and InP is theoretically studied. In collinear phase-matching, the optimum phase-matching wave hands of these two crystals are calculated. The optimum phase-matching wave bands in GaAs and lnP are 0.95-1.38μm and 0.7-0.96μm respectively. The influence of the wavelength choice of the pump wave on the coherent length in THz-wave tuning is also discussed. The influence of the temperature alteration on the phase-matching and the temperature tuning properties in GaAs crystal are calculated and analyzed. It can serve for the following experiments as a theoretical evidence and a reference as well.     

Effects of the alloy compositions on the phonon-polaritons in ternary mixed crystals

Composition dependence of bulk and surface phonon-polaritons in ternary mixed crystals are studied in the framework of the modified random-element-isodisplacement model and the Bom-Huang approximation. The numerical results for Several Ⅱ - Ⅵ and Ⅲ- Ⅴ compound systems are performed, and the polariton frequencies as functions of the compositions for ternary mixed crystals AlxGa1-xAs, GaPxAS1-x, ZnSxSe1-x, GaAsxSb1-x, GaxIn1-xP, and ZnxCd1-xS as examples are given and discussed. The results show that the dependence of the energies of two branches of bulk phonon-polaritons which have phonon-like characteristics, and surface phonon-polaritons on the compositions of ternary mixed crystals are nonlinear and different from those of the corresponding binary systems.     

Influence of PVK ： NPB hole transporting layer on the characteristics of organic light-emitting devices

A doping system consisting of NPB and PVK is employed as a composite hole transporting layer （CHTL）. By adjusting the component ratio of the doping system, a series of devices with different concentration proportion of PVK ： NPB are constracted. The result shows that doping concentration of NPB enhances the competence of hole transporting ability, and modifies the recombination region of charge as well as affects the surface morphology of doped film. Optimum device with a maximum brightness of 7852 cd/m^2 and a power efficiency of 1.75 lm/W has been obtained by choosing a concentration proportion of PVK ： NPB at 1：3.     

New insert layer structure OLEDs

An insert layer structure organic electroluminescent device（OLED） based on a new luminescent material （Zn（salen）） is fabricated. The configuration of the device is ITO/CuPc/NPD/Zn（salen）/Liq/LiF/A1/CuPc/NPD/Zn（salen）/Liq/LiF/A1. Effective insert electrode layers comprising LiF（1nm）/Al（5 nm） are used as a single semitransparent mirror, and bilayer cathode LiF（1 nm）/A1（100 nm） is used as a reflecting mirror. The two mirrors form a Fabry-Perot microcavity and two emissive units. The maximum brightness and luminous efficiency reach 674 cd/m^2 and 2.652 cd/A, respectively, which are 2.1 and 3.7 times higher than the conventional device, respectively. The superior brightness and luminous efficiency over conventional single-unit devices are attributed to microcavity effect.     

Analysis of error performance on Turbo coded FDPIM

Due to variable symbol length of digital pulse interval modulation（DPIM）, it is difficult to analyze the error performances of Turbo coded DPIM. To solve this problem, a fixed-length digital pulse interval modulation（FDPIM） method is provided. The FDPIM modulation structure is introduced. The packet error rates of uncoded FDPIM are analyzed and compared with that of DPIM. Bit error rates of Turbo coded FDPIM are simulated based on three kinds of analytical models under weak turbulence channel. The results show that packet error rate of uncoded FDPIM is inferior to that of uncoded DPIM. However, FDPIM is easy to be implemented and easy to be combined, with Turbo code for soft-decision because of its fixed length. Besides, the introduction of Turbo code in this modulation can decrease the average power about 10 dBm, which means that it can improve the error performance of the system effectively.     

A method for calculating the center position of collimated light

It is a key problem to accurately calculate beam spots＇ center of measuring the warp by using a collimated laser. A new method, named double geometrical center method （DGCM）, is put forward for the first time. In this method, a plane wave perpendicularly irradiates an aperture stop, and a charge couple device （CCD） is employed to receive the diffraction-beam spots, then the geometrical centers of the fast and the second diffraction-beam spots are calculated respectively, and their mean value is regarded as the center of datum beam. In face of such adverse instances as laser intension distributing defectively, part of the image being saturated, this method can still work well. What＇s more, this method can detect whether an unacceptable error exits in the courses of image receiving, processing and calculating. The experimental results indicate the precision of this method is high.     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.