小波尺度空间形状特征提取方法的研究

基于形状的图像检索技术是基于内容的图像检索技术的一个重要组成部分。现有的形状特征检索技术主要集中于形状特征的提取及相似性度量、形状特征与颜色和纹理特征结合、形状特征与高层的语义特征结合的研究。在分析现有的基于形状的图像检索技术的一些关键技术的基础上,对基于小波尺度空间特征(WSS)的形状检索方法进行了研究,并提出了一些改进算法。     

基于综合特征和SVM相关反馈的图像检索

提出综合纹理、颜色和形状特征的图像检索方法。首先采用Gabor小波计算ROIs(Regions of Interest)的位置和数目;然后在ROIs中,使用Gabor小波提取纹理特征,采用YUV空间直方图和颜色矩表示颜色特征,使用Zernike矩提取形状特征。为了提高图像检索的准确度,最后采用基于支持向量机(SVM)的相关反馈算法。实验结果表明,提出的方法具有较好的检索性能。     

基于形状的图像检索技术研究

基于形状的图像检索技术是基于内容的图像检索技术的一个重要组成部分。现有的形状特征检索技术主要集中在形状特征的提取及相似性度量、形状特征与颜色和纹理特征结合、形状特征与高层的语义特征结合的研究。在分析现有的基于形状的图像检索技术的一些关键技术的基础上,对基于小波-傅里叶特征(WFD)的形状检索方法进行了研究,并提出了一些改进算法。结合Matlab和ACCESS实现了一个基于形状的图像检索实验系统,建立了用户界面,选取与设计了4个图像测试集,使用检索性能评价方法对形状特征的检索结果进行了客观的评价。实验结果表明,利用本文所提出改进的形状特征进行检索取得了较好的检索效果。     

基于多特征的对象检索技术

提出了一种融合图像颜色、纹理和形状特征的提取及归一化方法,并将其应用于基于内容的对象检索中,实验证明,融合颜色、纹理、和形状特征的对象检索比单一特征的对象检索效果要好。     

一种改进的综合BTC颜色矩和DT-CWT的图像检索算法

摘 要：特征提取是基于内容的图像检索中的关键技术。针对基于单一特征检索效果不理想的问题,提出一种改进的综合颜色和纹理特征的图像检索算法。该算法在YIQ颜色空间中进行特征提取,首先结合方块编码（BTC）的思想,提取颜色矩作为颜色特征;采用双树复小波变换（DT-CWT）提取纹理特征,融合两种特征并利用相似性度量方式进行图像检索。实验结果表明算法所提取的颜色、纹理特征更利于检索,使用综合特征检索的平均查准率比同类算法更高。     

改进的综合BTC颜色矩和DT-CWT的图像检索算法

特征提取是基于内容的图像检索中的关键技术.针对基于单一特征检索效果不理想的问题,提出一种改进的综合颜色和纹理特征的图像检索算法.该算法在YIQ颜色空间中进行特征提取,首先结合方块编码(BTC)的思想,提取颜色矩作为颜色特征;采用双树复小波变换(DT-CWT)提取纹理特征,融合两种特征并利用相似性度量方式进行图像检索.实验结果表明算法所提取的颜色、纹理特征更利于检索,使用综合特征检索的平均查准率比同类算法更高.     

一种基于颜色连通的图像纹理检索新方法

提出并实现一种结合图像颜色连通区域信息及其纹理特征的图像检索新方法.首先提取图像的分块主颜色,根据提出的相关颜色定义,搜索确定图像中的颜色连通区域集.然后,提取图像中各颜色连通区域对应的四种颜色共生矩阵特征,利用针对该特征设计的图像相似性度量函数实现基于内容的图像检索.实验结果表明,该方法能有效结合图像的纹理信息及其颜色构成和分布信息,具有良好的检索效果和性能.     

基于感兴趣区域多特征加权融合的图像检索算法

基于内容的图像检索有着广阔的应用前景,但存在检索性能不高的缺点.综合兴趣点和多特征融合的优点,提出一种基于感兴趣区域多特征加权融合的图像检索算法.采用Harris算法提取图像的兴趣点,确定感兴趣区域;再采用累积灰度直方图、共生矩阵和形状不变矩分别提取感兴趣区域的颜色、纹理和形状特征;经归一化后,最后采用距离函数级融合来度量图像的相似度,以检索图像.实验表明,算法有效地提高了图像的检索性能.     

一种新的图像检索方法

常规基于内容图像检索的方法是提取图像的颜色、纹理等物理特征,运用相似性度量准则从图像库中查询相似的图像。为了提高图像检索的正确率,这里提出改进的方法。具体方法是:提取图像的物理特征,并将特征作为支持向量机(SVM)的输入向量,对图像进行分类,然后利用分类结果,对检索图像进行相似性匹配,从同类图像中找出相似的图像。实验结果显示,该方法的检索结果优于常规方法。     

一种遥感影像挖掘的相似性度量方法

遥感影像数据挖掘是一个有着广阔应用前景的研究领域。对图像检索、图像分类、图像聚类、空间关联规则挖掘和图像变化检测等数据挖掘应用而言,相似性度量是基础和前提。采用了图像空间划分的策略,在此基础上计算颜色、纹理和形状等3方面的低层视觉特征来描述图像,采用多维特征空间的网格划分来降低数据维数并建立了影像的相似性度量。实验结果表明,该方法对影像具有一定的几何和光照不变性。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.