基于.net的科研管理系统的设计研究

随着科研信息量的不断增加,人工进行科研信息的管理已经无法满足科研工作的开展需求。而在.net平台上进行科研管理系统的开发,则可以使科研管理工作的效率得到提升。因此,文章对基于.net的科研管理系统的设计问题展开了研究,以便为关注这一话题的人们提供参考。     

基于区块链技术的高校科研管理系统设计

随着信息化大数据时代的发展,高校的科研工作因课题数量增多以及工作的烦琐复杂,仅依靠传统的数据表格逐级下发汇总、反复确认,不仅工作量大,而且存在信息失真和基本信息泄露的风险。基于此,文章以.NET为平台,采用Framework框架,融合区块链技术,设计了4层网络架构的科研管理系统。经测试,该系统有效地提高了科研管理效率,降低了管理费用,为高校科研工作的开展提供了有力支持。     

基于工作流的高校科研管理信息系统分析与设计

工作流技术是实现业务过程建模、优化、过程管理与集成的核心技术。基于工作流技术,本文对高校科研管理系统的功能框架和用例模型进行了分析,对系统工作流引擎和总体架构进行了设计。将工作流技术应用于高校科研管理系统中,将增加该系统的可用性和灵活性,最终提高高校科研管理的效率和水平。     

Android智能导游应用开发技术研究

随着科学教育的不断发展进步,我国众多的科研院所与科研企业的科研工作日益增多,随之而来的科研管理工作也日益繁杂化,那么对科研管理系统的建设便成了强化科研单位管理水准的关键因素。文章通过对系统需求的深入分析、为科研管理人员设计出一套便利的软件系统,为科研管理工作提供了保障。     

科研综合管理系统分析与设计

随着科学教育的不断发展进步,我国众多的科研院所与科研企业的科研工作日益增多,随之而来的科研管理工作也日益繁杂化,那么对科研管理系统的建设便成了强化科研单位管理水准的关键因素。文章通过对系统需求的深入分析、为科研管理人员设计出一套便利的软件系统,为科研管理工作提供了保障。     

某高校科研管理信息系统分析与设计

高校科研管理系统是提升科研管理工作效率,提升科研服务水平的一大利器。而对新兴独立学院,科研处于起步阶段,科研管理仍是原始的手工办公的状态。针对A高校科研管理工作业务需求,设计开发科研管理系统,包含科研管理、学术讲座管理、科研成果管理、基础信息管理等模块,以B/S模式为基础,以实现科研管理信息化、科学化、制度化、动态化,提高工作效率,促进科研信息资源的共享和应用。     

高校科技文献信息管理系统的设计与实现

随着高校数字化建设的不断深入,科技文献管理系统是提高高校数字化水平的一个重要手段。该系统不但能提高管理部门的管理效率、减轻工作负担,而且为广大教师和科研工作者提供更多更快捷的服务。根据实际需求出发,提出了一个科技文献管理系统,并进行了系统功能和流程的设计与开发,阐述了部分功能特色的具体实现,并对系统实施后的运行情况进行了讨论。     

数字化技术在科研管理中的应用

在我国高等教育信息化建设中,高校数字化建设是一个十分必要的环节。数字化技术可以应用在科研管理的以下多个方面,如科研政策和文件、项目的申报和批准立项、科研成果等。将数字化技术应用于科研管理,有利于使高校科研工作更具有科学性、更加规范、更加现代以及更加具有服务性。     

遗传算法在高校科研管理系统开发中的应用

科技创新和科技发展永不止步,高校的科研管理日新月异。随着我院科研规模的不断扩大和科研管理水平的不断提升,学院于2015年成立了南洋产业研究院,设立开放基金,重点资助原创技术研究、技术发明研究、产品开发研究。为了有效管理科研项目,开发适合本校的科研管理系统非常必要。本文通过对遗传算法研究与应用,实现了高校科研管理系统中的子模块-基金项目评审功能。应用评审指标体系,模拟专家群体智慧,充分发挥基金作,实现对项目择优资助。系统的开发与运营对南洋产业研究院基金项目的管理和促进学院科研发展具有非常重要的意义。     

知识经济背景下高校科研管理系统的优化设计研究

在知识经济背景下，研究建立一个适应知识经济发展的高校科研管理系统，该系统提供有标准接口实现高校科研管理系统互连互通并构建一个知识资源库；为科研人员提供订制信息与系统主动推送信息的个性化科研信息服务；提供有利于高校科研团队知识创新的知识管理服务；提供科研成果推广服务。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.