共查询到20条相似文献,搜索用时 46 毫秒
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非视距误差的TDOA/AOA混合定位算法 总被引:2,自引:0,他引:2
在非视距(NLOS)误差时,无线网络的目标定位性能急剧下降。提出一种针对NLOS误差的TDOA/AOA混合定位算法,首先利用量测值多项式拟合的Wylie鉴别算法辨别出具有NLOS误差的基站,根据NLOS附加时延的统计特性估计出附加时延的均值和方差,并重构到达时间差(TDOA)测量值;然后采用基于泰勒级数展开的TDOA/AOA混合定位算法,得出无线网络联合目标定位的位置估计值。仿真结果证实,该方法在存在NLOS误差下能有效提高无线网络的目标定位精度。 相似文献
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在蜂窝无线网络中,单基站定位是最简单易行的定位方法,其需要利用基站测量移动终端信号的到达时间(TOA,time of arrival)和到达角(AOA,Angle of Arrival)信息.但是非视距(NLOS,Non Line of Sight)误差是影响定位精度的主要原因,为了抑制NLOS对定位精度的影响,提出了一种利用移动终端和中继节点之间的协作信息来提高定位精度的算法.该算法通过处理基站测量的TOA/AOA信息,以及移动终端到中继节点的TOA信息,利用中继节点与MS间的协作信息对估计的位置进行修正.仿真分析结果表明,在单基站蜂窝网中,提出的算法不仅整体提高了系统定位性能,而且在MS距离基站比较远的情况下,提出的协作定位算法的定位精度比现有的算法有明显提高. 相似文献
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一种基于TOA的定位优化算法 总被引:1,自引:0,他引:1
提出了一种在非视距环境下,当基站处于不良布站情况,即基站不能如蜂窝状包围住移动台时,测电波到达时间(TOA)定位算法的一种优化方法。其主要思想为先利用三基站相交线定位方法测得一个移动台的初始值坐标,再通过初始值坐标,确定基站选择和坐标优化机制,选择两两基站最优搭配,利用最优基站的圆周线相交定位方法,经过多次测量,消除NLOS误差对测量值的影响,最终确定出移动台坐标。此方法计算量小,结构简单,经验证,此方法比原来方法有更高的测量精度。 相似文献
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提出了一种在难以获得TDOA测量值误差的先验信息时多基站无规则分布下的时差定位方法——多站组合定位方法。通过将基站分组,利用每组基站的定位结果情况,分为无模糊解、模糊解、无解三类进行处理,计算每类中每组基站的TDOA计算值与TDOA测量值之间的残差为其加权系数,采用不同类的数据组合方法,最终得到定位结果。仿真实验验证了该方法的有效性。 相似文献
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张龙玉 《无线电技术与信息》2006,(1):63-65
1、3G无线网络的规划原则
1.13G无线网络规划内容
3G无线网络规划包括在各种情况下计算链路预算、容量和小区基站数目,同时要对基站覆盖进行预测,对其参数进行规划。除此之外,还需要对整个网络进行策划,计算基站中信道单元的数目、传输线路容量、基站控制器、交换机等其他单元的数目。在规划中需引入性能测量,如掉话率和闭塞等指标,用它们来衡量网络性能。 相似文献
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通过覆盖优化来改善GSM无线网络的性能是一种普遍又有效的方法。本文首先阐述了在密集市区进行基站扇区覆盖范围精确控制的必要性,然后给出了基站扇区的理想覆盖范围及与天线下倾角之间的关系,最后通过一个实例验证了上述GSM无线网络覆盖优化的效果。 相似文献
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Meihua Shen Wilfred Pau Nicolas Gani Jianping Wen Shashank Deshmukh Thorsten Lill Jian Zhang Hanming Wu Guqing Xing 《半导体技术》2004,29(8)
This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration. 相似文献
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White organic light-emitting devices based on fac tris(2- phenylpyridine) iridium sensitized 5,6,11,12-tetraphenylnap -hthacene 总被引:1,自引:0,他引:1
We have fabricated the white organic light-emitting devices (WOLEDs) based on 4,4' -bis(2,2 -diphenyl vinyl)-1,1' - biphenyl (DPVBi) and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene (rubrene). The device structure is ITO/2T-NATA (20 nm)/NPBX (20 nm)/CBP: x%Ir(ppy)3:0.5% rubrene (8 nm)/NPBX (5 nm)/DPVBi (30 nm)/Alq(30 nm)/LiF(0.5 nm)/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris (2-phenylpyridine) iridium [Ir(ppy)3], acts as a yellow light-emitting layer, and N,N' -bis- (1-naphthyl)- N,N' -diphenyl -1, 1' -biphenyl-4,4' -diamine (NPBX) acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir (PPY)3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V. 相似文献
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Complete approach to automatic identification and subpixel center location for ellipse feature 总被引:1,自引:0,他引:1
XUE Ting WU Bin SUN Mei YE Sheng-hua 《光电子快报》2008,4(1):51-54
To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction. 相似文献
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In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal (200) (2d = 0.4027 nm) is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line(w), the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line(x), the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines(y), the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line(z) in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line(q) in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution(λ/△ 2) is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy. 相似文献
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High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET > PDMAT > TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center. 相似文献
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Credence Systems Corporation 《半导体技术》2004,29(9)
Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V. 相似文献
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This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors. 相似文献
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YUXiao-hua XIANGYu-qun 《半导体技术》2005,30(2):30-32,37
An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB. 相似文献
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It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer (LDV). 相似文献