基于傅里叶变换的彩色滤波阵列插值新算法与实验验证

在数码摄像系统中,CCD彩色滤波阵列(CFA,color filter array)被用于对颜色信息进行采样,然而每个像素只能对一种颜色进行采样,为了得到全彩色图像,必须对采样数据进行处理以估计其它颜色的像素值,这个过程通常利用插值来完成。CCD彩色滤波阵列插值算法是决定全彩色图像质量的最重要的因素之一,如果插值算法不够完善,图像的色彩就会出现失真。目前已有多种插值算法被提出,针对双线性插值图像在高频处失真严重及Gunturk自适应投影迭代法计算代价较高等问题,本文从傅里叶变换域分析彩色滤波阵列采样图像,根据采样图像在频率域上可以分为处于基带的亮度信息和高频段的色差信息的特点,提出一种色差调制插值算法。通过多组实验结果对比,本文插值算法在CPSNR(color peak-signal-to-noise ratio)值与ΔEs(S-CIELABdelta E)值以及还原图像的视觉效果上均要优于一般的插值算法。     

自适应陷波滤波器频率估计新方法及性能分析

现有的自适应陷波滤波器（ANF）受误差函数所限,导致其自适应频率估计方法收敛速度较慢,对初始迭代频率值设定范围要求较高,特别针对频率接近于0或π的信号,还存在频率估计精度不高、算法稳定性差的问题,为此,提出一种ANF频率估计新方法.首先,分析现有ANF方法估计信号频率时存在精度低、速度慢、稳定性差的原因,提出一种新误差函数以提升ANF收敛速度;然后,根据ANF估计信号频率时偏差产生的机理,通过偏差补偿方式,降低噪声对ANF的影响,以获得近似无偏的频率估计结果,提高ANF频率估计精度,同时与离散卡尔曼滤波相结合,以改善算法的稳定性,并对该方法进行稳态条件下的性能分析;最后,给出了ANF频率估计结果,并讨论了ANF各参数对频率估计精度的影响,给出了具体计算结果.计算表明本文方法的有效性与正确性.     

自适应陷波滤波器频率估计新方法及性能分析

现有的自适应陷波滤波器(ANF)受误差函数所限,导致其自适应频率估计方法收敛速度较慢,对初始迭代频率值设定范围要求较高,特别针对频率接近于0或π的信号,还存在频率估计精度不高、算法稳定性差的问题,为此,提出一种ANF频率估计新方法.首先,分析现有ANF方法估计信号频率时存在精度低、速度慢、稳定性差的原因,提出一种新误差函数以提升ANF收敛速度;然后,根据ANF估计信号频率时偏差产生的机理,通过偏差补偿方式,降低噪声对ANF的影响,以获得近似无偏的频率估计结果,提高ANF频率估计精度,同时与离散卡尔曼滤波相结合,以改善算法的稳定性,并对该方法进行稳态条件下的性能分析;最后,给出了ANF频率估计结果,并讨论了ANF各参数对频率估计精度的影响,给出了具体计算结果.计算表明本文方法的有效性与正确性.     

视点相关光线投射算法在三维云可视化方面的应用

针对绘制海量云数据时传统光线投射算法计算量大、绘制缓慢等问题,提出了一种基于视点相关光线投射算法的三维云可视化方法。该方法首先采用基于多分辨率方法的数据预处理策略,然后采用基于视点相关系数的自适应采样频率计算方法确定重采样点的位置,并利用三阶段插值算法计算重采样点的值,最后采用基于块重要性加权香农熵的二维传输函数完成颜色值和不透明度的映射关系,从而实现图像的合成。实验结果表明,该方法计算复杂度低、执行效率高,与现有的光线投射算法相比,不仅图像的重构质量得到了提高,绘制时间也减少了约30%。     

一种类箕舌线函数的变步长归一化自适应滤波算法

在综合考虑自适应滤波算法设计中收敛速度、稳态误差、计算复杂度和跟踪性能等指标的基础上,该文提出一种类箕舌线函数的变步长归一化自适应滤波算法,用类箕舌线函数代替Sigmoid函数作为步长迭代公式,引入基于相关误差的变步长调整原则,在大大增强算法稳定性的同时大幅度提升了算法的收敛速度、跟踪性能,减小了算法的计算复杂度.在Matlab平台上分析了改进的步长函数中参数α;β以及γ的不同取值对算法的影响,并将该文算法与已有的基于Sigmoid函数和基于箕舌线函数的变步长LMS算法进行了比较,仿真结果表明,该文算法有更快的收敛速度、更好的跟踪能力以及较小的稳态误差和较强的鲁棒性.     

用SystemView仿真LMS自适应算法

最小均方误差(LMS)算法是自适应信号处理中最常用的算法.本文在给出LMS算法的原理的基础上,设计了一种单一频率的自适应陷波器的仿真方案.采用SystemView通信系统仿真工具,仿真了该自适应陷波器工作过程,给出了各点工作波形,并通过实验给出了不同参数条件下的陷波器收敛性能.实验结果表明,在合适的参数条件下,LMS算法可以兼顾收敛速度和稳态误差两方面的性能,实现性能良好的陷波器.同时,由于采用迭代算法,LMS算法更适合DSP或FPGA的数字实现.     

基于AJTF的ISAR成像算法研究

自适应联合时间-频率（AJTF）分析是一种被证实了的基于刚体目标二维运动模型的逆合成孔径雷达（ISAR）成像算法,但它在进行运动补偿参数搜索时使用的穷尽搜索方法收敛不稳定且计算量较大。介绍了一种改进的AJTF算法,它用粒子群优化方法进行运动补偿参数的搜索,提高了算法的稳定性和效率。仿真结果证明了该算法的优越性。     

一种频率无关的正弦信号相量计算方法

为寻求一种频率无关的实时相量计算方法,通过分析传统算法,提出一种可变数据窗正弦相量插值计算方法。该算法通过等间隔采样获得信号一个周期左右的样本数据,采样数据计算出信号的基波频率并确定信号的一个基频周期所需的最大采样点数N,计算信号N点DFT和N+1点DFT,再利用两次DFT计算结果进行线性插值得到信号真实频点上各次谐波的实部和虚部,计算出信号各次谐波的幅值和瞬时相位。仿真分析和实际测量表明,该算法的计算精度和实时性较高,能够满足频率随机变化的应用要求。     

自适应MPAM解调方法研究

提出了一种新型的基于自适应滤波器权系数解调多进制幅度调制(MPAM)信号的方法.文中以常用的最小均方误差自适应算法(LMS)为例,讨论了新型的MPAM自适应解调的过程及其性能.该解调算法不需要自适应滤波器完成收敛,从而降低了采样频率和处理速度.给出的理论性能与仿真结果表明,MPAM自适应解调的误码率仿真结果与理论值吻合非常好;而且该方法具有抗干扰性能强、输出响应快、便于数字信号处理(DSP)技术实现等特点,在相同的采样频率下其误码率优于相关解调的误码率.     

基于SAGA的通信抗干扰决策引擎

为使抗干扰通信系统能够更好地实现参数自适应调整功能,在传统频率、功率自适应的基础上研究频率、功率、信道编码码率、调制方式四种参数的自适应。设计了一种基于模拟退火遗传算法（SAGA,Simulated Annealing Genetic Algorithm）的通信抗干扰决策引擎,并给出了该算法计算流程。在六种不同模式下对算法性能进行了仿真分析,结果表明,该算法能够实现决策引擎参数的自适应选择,并且提高了标准遗传算法的收敛速度,增强了标准遗传算法的爬山能力。     

Technology innovation and process integrations for sub-100nm gate patterning

This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.     

White organic light-emitting devices based on fac tris（2- phenylpyridine） iridium sensitized 5,6,11,12-tetraphenylnap -hthacene

We have fabricated the white organic light-emitting devices （WOLEDs） based on 4,4＇ -bis（2,2 -diphenyl vinyl）-1,1＇ - biphenyl （DPVBi） and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene （rubrene）. The device structure is ITO/2T-NATA （20 nm）/NPBX （20 nm）/CBP： x%Ir（ppy）3：0.5% rubrene （8 nm）/NPBX （5 nm）/DPVBi （30 nm）/Alq（30 nm）/LiF（0.5 nm）/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris （2-phenylpyridine） iridium [Ir（ppy）3], acts as a yellow light-emitting layer, and N,N＇ -bis- （1-naphthyl）- N,N＇ -diphenyl -1, 1＇ -biphenyl-4,4＇ -diamine （NPBX） acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir （PPY）3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.     

Complete approach to automatic identification and subpixel center location for ellipse feature

To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.     

小角度扩展相关性近似算法分析

本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

A Versatile Mixed-Signal Pin Approach for Cost-Effective Test of Automotive ICs

Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

Optical vibration and deviation measurement of rotating machine parts

It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer （LDV）.