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嵌入式系统的低功耗设计技术 总被引:2,自引:0,他引:2
随着嵌入式系统的广泛应用,低功耗问题摆在了设计人员面前.低功耗设计包括系统设计、硬件设计、软件设计、器件的工艺设计等诸多方面.其中器件的工艺设计主要由半导体器件的厂家来完成,嵌入式系统的应用设计人员只需要关心器件的功耗指标,更多的工作集中于系统的硬件、软件以及它们之间的配合方面.本文主要从这些方面讨论嵌入式系统的低功耗设计问题和设计方法. 相似文献
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计算机领域中,嵌入式系统的出现是计算机软硬件和功能模块化的具体体现,是面向应用设计的软硬件可裁剪的计算机系统,能够满足不同行业、环境等的特殊要求.随着计算机技术的发展和深度应用,嵌入式系统的优势得到体现,发展极为迅速,对人们的日常活动产生极为深刻的影响.为了把握计算机嵌入式系统的基本特征、设计流程,分析其存在的发展阻碍和发展趋势,本文对计算机嵌入式系统的设计技术做详细阐述. 相似文献
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基于嵌入式处理器的系统级低功耗管理研究 总被引:1,自引:0,他引:1
针对嵌入式系统低功耗设计问题,分析了动态功率管理DPM和动态电压/频率调节DVFS两种嵌入式功耗管理策略,并提出了系统级低功耗控制框架.讨论了基于嵌入式处理器i.MX1硬件平台实现系统级功耗控制方案,并给出了具体的设计方法.实际应用表明,该设计方案可有效降低系统能耗. 相似文献
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用于嵌入式计算机性能评测技术及其方法研究 总被引:2,自引:1,他引:1
嵌入式系统及应用与市场密切关联,其设计受成本、功耗、芯片体积和开发周期等多种因素的制约,嵌入式系统的性能在满足应用需求的条件下,其性能冗余量不宜太大。在产品开发周期内,以尽可能低的原材料成本和开发成本设计具有适当性能的嵌入式系统,是嵌入式系统项目成功的关键。为此,需要对嵌入式微处理器及嵌入式系统的整体性能进行评测和分析,作为嵌入式系统性能设计的依据。介绍嵌入式系统性能测试的基本原理、测试方法,描述多种嵌入式系统性能评测基准及其适用范围。并在此基础上,分析这些嵌入评测基准程序的应用情况,结合当前嵌入式系统级设计过程中需要早期进行性能评估的需要,介绍E3S评测基准及系统级设计评价方法,给出嵌入式计算机设计中测评技术的未来发展趋势。 相似文献
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介绍了嵌入式系统的概念和Linux系统的嵌入式特性,分析了嵌入式Linux系统的开发流程、工具链、内核移植和文件系统的设计,并从系统启动、体积和内存占有率等方面着手,讨论了嵌入式Linux系统的优化方案。该设计在国家体育总局的嵌入式计时产品中得到应用,提高了系统的稳定性、响应速度和运行效率。 相似文献
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基于ARM的以太网接口电路设计 总被引:1,自引:1,他引:0
阐述了基于ARM处理器LPC2294的嵌入式系统的以太网接口电路的设计,针对当前嵌入式研究领域的技术热点,实现了以太网功能在嵌入式系统上的开发与应用.详细介绍了ARM处理器的硬件设计,LPC2294与以太网控制器RTL8019AS的接口电路设计和以太网传输层的UDP协议、TCP/IP协议的软件设计流程,以及系统的通信调试过程.ARM处理器与RTL8019AS通过外部数据总线连接,具有非常好的实时性和可靠性,很好地实现了嵌入式系统的以太网功能. 相似文献
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为适应嵌入式技术在现代工业及电子等更多领域的广泛应用,通过对ARM9嵌入式微处理器芯片S3C2410的研究,设计出基于S3C2410核心板的嵌入式系统开发底板,更多的需求及功能可在其底板上进行扩展与实现.首先对ARM9嵌入式微处理器S3C2410进行介绍,然后给出了基于S3C2410核心板的嵌入式系统开发底板的设计与功能扩展,包括开发板总体设计,电源模块设计,各种通信模块设计如串口、JTAG接口、网络接口、CAN总线通信接口等.该模板的设计实现了嵌入式系统在更多更广泛领域应用的灵活性. 相似文献
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Meihua Shen Wilfred Pau Nicolas Gani Jianping Wen Shashank Deshmukh Thorsten Lill Jian Zhang Hanming Wu Guqing Xing 《半导体技术》2004,29(8)
This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration. 相似文献
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White organic light-emitting devices based on fac tris(2- phenylpyridine) iridium sensitized 5,6,11,12-tetraphenylnap -hthacene 总被引:1,自引:0,他引:1
We have fabricated the white organic light-emitting devices (WOLEDs) based on 4,4' -bis(2,2 -diphenyl vinyl)-1,1' - biphenyl (DPVBi) and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene (rubrene). The device structure is ITO/2T-NATA (20 nm)/NPBX (20 nm)/CBP: x%Ir(ppy)3:0.5% rubrene (8 nm)/NPBX (5 nm)/DPVBi (30 nm)/Alq(30 nm)/LiF(0.5 nm)/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris (2-phenylpyridine) iridium [Ir(ppy)3], acts as a yellow light-emitting layer, and N,N' -bis- (1-naphthyl)- N,N' -diphenyl -1, 1' -biphenyl-4,4' -diamine (NPBX) acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir (PPY)3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V. 相似文献
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Complete approach to automatic identification and subpixel center location for ellipse feature 总被引:1,自引:0,他引:1
XUE Ting WU Bin SUN Mei YE Sheng-hua 《光电子快报》2008,4(1):51-54
To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction. 相似文献
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In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal (200) (2d = 0.4027 nm) is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line(w), the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line(x), the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines(y), the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line(z) in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line(q) in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution(λ/△ 2) is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy. 相似文献
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High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET > PDMAT > TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center. 相似文献
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Credence Systems Corporation 《半导体技术》2004,29(9)
Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V. 相似文献
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This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors. 相似文献
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YUXiao-hua XIANGYu-qun 《半导体技术》2005,30(2):30-32,37
An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB. 相似文献
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It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer (LDV). 相似文献