宽带宽与新波段光纤放大器进展

宽带、高速、长距离和智能化是目前光纤通信系统发展的趋势所在。迅速膨胀的信息服务量使宽带成为最迫切的需求,新波段与长增益带宽光纤放大器的研究炙手可热。本文阐述了近期各波段光纤放大器以及拉曼放大器的进展,并揭示了光纤放大器向短波段和混合型发展的趋势。     

宽波段光放大器技术

光纤通信系统宽带化和大容量的实现，离不开光放大器。目前光纤通信的发展明显趋向于挖掘光纤的低损耗波长资源，相应的宽带放大技术就成为关键技术之一，文中简介可望而且正在实现的各种光放大器，这些技术有机会实现石英玻璃光纤在1300－1700nm波段的宽波段通信。     

S—波段光纤放大器及其研究进展

介绍了实现S-波段放大的3种光纤放大器；掺铥光纤放大器（TDFA）、增益位移TDFA（GSTD-FA）和光纤喇曼放大器，就其原理、结构、特点和发展现状进行了综述。     

掺铒碲基光纤放大器最新研究进展

掺铒碲基光纤放大器(EDTFA)由于能同时在C L波段(1530-1610nm)或L波段(1580-1620nm)对光信号进行有效的放大，目前已成为通信领域内竞相开发的一种新型宽带光纤放大器，为此简单介绍了该放大器的研究历程，综述了其最新研究进展和应用情况。     

L-波段光纤放大器及其研究进展

介绍了实现Ｌ－波段放大的三种光纤放大器:增益移位掺饵光纤放大器、掺饵碲化物光纤放大器和光纤拉曼放大器,就每一种光纤放大器的原理、结构、特点和发展现状进行了综述．     

正在崛起的新型光纤放大器——拉曼光纤放大器

拉曼(Raman)光纤放大器(RFA)是被誉为光纤通信发展里程碑的掺饵光纤放大器(EDFA)之后又一个引人注目的光放大器。RFA的出现,将会对光纤放大器和光纤通信产生重大的影响。人们对RFA的兴趣来源于这种放大器可以提供整个光纤波长波段的放大,通过适当改变泵浦激光光波波长可达到在任意波段进行光放大的宽带放大器,甚至可以在1270nm～1670nm整个光纤波段内提供光放大。     

用于WDM系统的S-波段光纤放大器的研究

介绍了用于WDM系统的S－波段光纤放大器的两种实现方案：掺铥光纤放大器和拉曼光纤放大器。并对其原理、特点、性能、研究现状及存在的难点进行了详细的论述和分析。     

宽带、超宽带光纤放大器研究进展

目前,实现宽带、超宽带光纤放大器的技术主要有四种:宽带掺铒光纤放大(EDFA)技术、宽带拉曼放大技术、宽带混合放大技术和光纤参量放大技术.综述了宽带和超宽带光纤放大器的研究现状,并分别分析了其特点及发展趋势.     

宽带与超宽带光纤放大器研究进展及展望

对目前实现1.55μm窗口宽带／超宽带放大的各种方案进行综述和分析，讨论了各类光纤放大器应用中涉及的关键问题并指出各自的优缺点，提出了对宽带、超宽带光纤放大器发展趋势的理解。     

掺铥光纤放大器及其研究进展

介绍了S-波段光纤放大器——掺铥光纤放大器和增益位移掺铥光纤放大器的原理、结构、发展现状。     

Technology innovation and process integrations for sub-100nm gate patterning

This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.     

White organic light-emitting devices based on fac tris（2- phenylpyridine） iridium sensitized 5,6,11,12-tetraphenylnap -hthacene

We have fabricated the white organic light-emitting devices （WOLEDs） based on 4,4＇ -bis（2,2 -diphenyl vinyl）-1,1＇ - biphenyl （DPVBi） and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene （rubrene）. The device structure is ITO/2T-NATA （20 nm）/NPBX （20 nm）/CBP： x%Ir（ppy）3：0.5% rubrene （8 nm）/NPBX （5 nm）/DPVBi （30 nm）/Alq（30 nm）/LiF（0.5 nm）/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris （2-phenylpyridine） iridium [Ir（ppy）3], acts as a yellow light-emitting layer, and N,N＇ -bis- （1-naphthyl）- N,N＇ -diphenyl -1, 1＇ -biphenyl-4,4＇ -diamine （NPBX） acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir （PPY）3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.     

Complete approach to automatic identification and subpixel center location for ellipse feature

To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.     

小角度扩展相关性近似算法分析

本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

A Versatile Mixed-Signal Pin Approach for Cost-Effective Test of Automotive ICs

Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

Optical vibration and deviation measurement of rotating machine parts

It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer （LDV）.