共查询到17条相似文献,搜索用时 812 毫秒
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针对BSIM3v3模型在35K低温下无法模拟LDD(轻掺杂漏区)所引起的串联电阻异常,提出了可以模拟这一异常的SPICE宏模型.通过修改CMOS器件常温BSIM3v3模型中的一些与温度有关的参数值,得到35K BSIM3v3模型.模拟结果表明,根据此模型进行参数提取后的Ⅰ-Ⅴ特性曲线与实测曲线十分吻合.最后,运用此模型对CMOS传输门和两级运算放大器进行仿真,结果表明LDD串联电阻效应对这些电路产生了重要影响,该模型明显提高了低温BSIM3v3的仿真精度. 相似文献
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针对SPICE BSIM3模型在对大量应用于高压集成电路中的轻掺杂漏高压MOS(简称HV MOS)晶体管建模上的不足,提出了基于BSIM3的高压MOS晶体管I-V模型改进.研究中使用Agilent ICCAP测量系统对HVMOS晶体管进行数据采集,并分析其源漏电阻受栅源、源漏和衬底电压的影响及与标准工艺低压MOS晶体管的差异,针对BSIM3模型源代码中源漏电阻R ds的相关参数算法进行了改进,保留BSIM3v3原有参数的同时增加了R ds的二次栅压调制因子Prwg2和有效Vas参数δ的栅压调制因子δ1,δ2,在开放的SPICE和BSIM3v3源代码上对模型库文件进行修改并实现了优化.仿真结果表明采用改进后的模型,在ICCAP下的测量曲线与参数提取后的I-V仿真曲线十分吻合,该模型大大提高了BSIM3 I-V模型模拟HV MOS晶体管时的精确度,对于高压集成电路的设计与仿真有着极其重要的意义. 相似文献
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针对SPICE BSIM3模型在对大量应用于高压集成电路中的轻掺杂漏高压MOS(简称HV MOS)晶体管建模上的不足,提出了基于BSIM3的高压MOS晶体管I-V模型改进.研究中使用Agilent ICCAP测量系统对HVMOS晶体管进行数据采集,并分析其源漏电阻受栅源、源漏和衬底电压的影响及与标准工艺低压MOS晶体管的差异,针对BSIM3模型源代码中源漏电阻R ds的相关参数算法进行了改进,保留BSIM3v3原有参数的同时增加了R ds的二次栅压调制因子Prwg2和有效Vas参数δ的栅压调制因子δ1,δ2,在开放的SPICE和BSIM3v3源代码上对模型库文件进行修改并实现了优化.仿真结果表明采用改进后的模型,在ICCAP下的测量曲线与参数提取后的I-V仿真曲线十分吻合,该模型大大提高了BSIM3 I-V模型模拟HV MOS晶体管时的精确度,对于高压集成电路的设计与仿真有着极其重要的意义. 相似文献
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基于BSIM3的超深亚微米器件建模及模型参数提取 总被引:2,自引:0,他引:2
对适用于超深亚微米电路模拟的 MOSFET器件模型进行了研究 ,完成计入量子效应、多晶硅耗尽效应等基于 BSIM3的 MOSFET模型。针对阈值电压模型以及 I- V模型中的参数编写了模型参数提取程序 ,采用最小二乘法原理 ,并采用麦夸脱算法以降低参数提取结果对初值的依赖 ,对已有参数进行了修正。模型以及参数提取结果都分别进行了验证。 相似文献
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器件模型作为工艺与设计之间的接口,对保证集成电路设计成功具有决定意义.本文介绍了BSIM3模型的原理,并完成了低温下(77K) BSIM3模型的参数提取.同时探讨了使用参数提取软件的具体工作步骤. 相似文献
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一种新的单边高压器件的模拟及参数提取方法 总被引:2,自引:0,他引:2
单边高压器件具有源、漏电阻不对称且与工作电压成非线形的依赖关系的特点 ,文中提出一种单边高压 MOS器件的模型 ,在不改变 BSIM3 V3模拟模型方程的基础上 ,对 BSIM3 V3模型参数的物理意义和取值进行重新的定义来表示单边高压器件的这些特点。同时使用模型参数提取软件 BSIMPro提取了该模型的参数 ,模拟结果与实验数据进行拟合 ,两者符合得很好 ,证明了改进模型的可行性。 相似文献
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研究中提出了用于描述HCI(热载流子注入)效应的MOSFET可靠性模型及其建模方法,在原BSIM3模型源代码中针对7个主要参数,增加了其时间调制因子,优化并拟合其与HCI加压时间(Stress time)的关系式,以宽长比为10μm/0.5μm5 V的MOSFET为研究对象,在开放的SPICE和BSIM3源代码对模型库文件进行修改,实现了该可靠性模型。实验表明,该模型的测量曲线与参数提取后的I-V仿真曲线十分吻合,因而适用于预测标准工艺MOS器件在一定工作电压及时间下性能参数的变化,进而评估标准工艺器件的寿命。 相似文献
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Sinitsky D. Tang S. Jangity A. Assaderaghi F. Shahidi G. Chenming Hu 《Electron Device Letters, IEEE》1998,19(9):323-325
A versatile SOI model derived from the BSIM3v3 bulk MOSFET model is capable of simulating partially and fully depleted devices with options for self-heating and floating body effects. The model can automatically switch between fully and partially depleted regimes. After refining body current models we for the first time present successful dc and transient device and circuit simulation of an SOI MOSFET technology with Leff below 0.2 μm 相似文献
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Yuhua Cheng Min-Chie Jeng Zhihong Liu Jianhui Huang Mansun Chan Kai Chen Ping Keung Ko Chenming Hu 《Electron Devices, IEEE Transactions on》1997,44(2):277-287
A new physical and continuous BSIM (Berkeley Short-Channel IGFET Model) I-V model in BSIM3v3 is presented for circuit simulation. Including the major physical effects in state-of-the art MOS devices, the model describes current characteristics from subthreshold to strong inversion as well as from the linear to the saturation operating regions with a single I-V expression, and guarantees the continuities of Ids, conductances and their derivatives throughout all Vgs, Vds, and Tbs, bias conditions. Compared with the previous BSIM models, the improved model continuity enhances the convergence property of the circuit simulators. Furthermore, the model accuracy has also been enhanced by including the dependencies of geometry and bias of parasitic series resistances, narrow width, bulk charge, and DIBL effects. The new model has the extensive built-in dependencies of important dimensional and processing parameters (e.g., channel length, width, gate oxide thickness, junction depth, substrate doping concentration, etc.). It allows users to accurately describe the MOSFET characteristics over a wide range of channel lengths and widths for various technologies, and is attractive for statistical modeling. The model has been implemented in the circuit simulators such as Spectre, Hspice, SmartSpice, Spice3e2, and so on 相似文献
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Suet Fong Tin Osman A.A. Mayaram K. Chenming Hu 《Solid-State Circuits, IEEE Journal of》2000,35(4):612-624
An accurate and simple lumped-element extension of the BSIM3v3 MOSFET model for small-signal radio-frequency circuit simulation is proposed and investigated. Detailed comparisons of the small-signal y and s parameters with both two-dimensional device simulations and measurement data are presented. A procedure is developed to extract the values of two lumped resistors-the only added elements. The non-quasi-static and substrate effects can be modeled with these two resistors to significantly improve the model accuracy up to a frequency of 10 GHz, which is about 70% of the fT of the 0.5 μm NMOS transistor 相似文献
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Molnar K. Rappitsch G. Huszka Z. Seebacher E. 《Electron Devices, IEEE Transactions on》2002,49(7):1206-1211
This paper presents a subcircuit model for an MOS varactor based on the BSIM3v3 model suitable for simulator implementation within circuit-design environments. The development of the model and BSIM3v3 model parameter settings are discussed in detail. By varying the length (L) of the device, CMAX/CMIN ratios as high as five or minimum quality factors of 21.5 at 2.4 GHz can be achieved using a standard 0.35 μm CMOS process. The investigation of different geometries resulted in a tradeoff between capacitance tuning and quality factor. A medium length varactor has been characterized 相似文献
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In general, models at the device and circuit levels are very important in system design. Building compact models at the circuit level is complicated, needs a lot of physical information about the circuit and moreover it has a long simulation time. We present in this paper an alternative modeling methodology, black box modeling. In this technique, we need only the output behavior of the circuit. We get this behavior either from measurements or simulations from previously built compact models. We apply this technique to the operational amplifier as a case study. We use the Op-Amp, BSIM3v3-based compact transistor model, to obtain the performance of the circuit. An excellent agreement is obtained between the output voltage from the black box model of the Op-Amp (for both of the effect of the switching power supply on and the steady state behavior) and the corresponding output from the model used to build it. 相似文献