3D电视试验频道已在全国26省区市开通

截至2012年2月8日,《中国3D电视试验频道》开通地区分别为:吉林、山东、青海、宁夏、内蒙古、江苏、湖南、浙江、广东、广西、新疆、河北、陕西等22省、自治区的部分城市,以及北京、天津、上海、重庆、合肥、六安、厦门、武汉、太原、运城、铁岭     

中国高等学校电子教育学会第26届学术年会会议纪要

中国高等学校电子教育学会第26届学术年会,于2011年8月5日至8日在贵州安顺学院召开。参加会议的有：湖南科技大学、延安大学、中南民族大学、西华大学、青海师范大学、温州大学、广东外语外贸大学、遵义师范学院、楚雄师范学院、咸阳师范学院、长江师范学院、陇东学院、河北北方学院、邢台学院、韶关学院、湖南人文科技学院、宿州学院、     

第22届华东电视技术年会暨第3届华协体发展峰会成功召开

2009年6月8—10日，第二十二届华东电视技术年会暨第三届华协体发展峰会在上海大宁福朋喜来登大酒店隆重召开。来自上海、厦门、江苏、江西、安徽、山东、浙江、福建、济南、青岛、宁波、南京、杭州13家电视台，索尼、松下、新奥特、大洋、索贝、哈里斯、安达斯、安恒利、文广科技、STR，捷成世纪、北京星光12家厂商的代表参加了年会。     

第二十四届华东电视技术年会暨第五届华协体发展峰会在沪隆重召开

2011年6月6～10日,华东电视行业的年度盛会——＂第二十四届华东电视技术年会暨第五届华协体发展峰会＂在上海大宁福朋喜来登大酒店隆重召开。来自上海、浙江、江西、江苏、安徽、山东、福建、济南、厦门、青岛、宁波、南京、杭州等13家电视台,索尼、松下、索贝、大洋、新奥特、安达斯、安恒利、文广科技、STR、哈里斯、捷成世纪、...     

冬季常吃四类水果有益健康

冬季首选的水果有:梨、甘蔗、柚子、柑橘。梨梨中含苹果酸、柠檬酸、葡萄糖、果糖、钙、磷、铁以及多种维生素,且有润喉生津、润肺止咳、滋     

2009厦门·华协体高峰会议隆重召开

2009年11月6日,由华东电视技术协作体主办、厦门广播电视集团承办的“2009厦门·华协体高峰会议”在厦门市马哥孛罗大酒店隆重举行。来自江苏、上海、浙江、福建、安徽、江西、山东、厦门、杭州、南京、济南等11家电视媒体;索尼、松下、新奥特、大洋、索贝、哈里斯、安达斯、安恒利、STR、捷成世纪、北京星光等11家厂商以及《广播与电视技术》、     

业余无线电通信卫星的魅力

从1961年至今全世界已经研制和发射的业余卫星超过一百颗,参与策划、设计和制造业余卫星的国家包括美国、澳大利亚、德国、英国、法国、俄国、日本、意大利、芬兰、挪威、新西兰、韩国、墨西哥、哥伦比亚、以色列、泰国、智利、巴西、阿根廷、葡萄牙、南非、沙特阿拉伯、马来西亚、印度等发达国家和发展中国家,参加业余卫星通信活动的业余无线电爱好者以及体检过业余卫星通信的青少年学生更是遍及全世界的每个角落。我国的业余无线电爱好者也已完成业余卫星的研制,正在积极筹备准备发射。     

本刊来稿须知

1．本刊设有专题论坛、专业改革、教学改革、课程改革、自动控制、教学研究、电子信息、电气工程、教材建设、实践教学、教学方法、机辅教学、争鸣论坛、高职教育、教学仪器及电坛人物等栏目。     

市委常委副市长马正其到三家电信基础运营企业调研农村信息化工作

2008年12月10日，重庆市市委常委、副市长马正其和市政府副秘书长丁先军及市通信管理局、发展改革委、财政局、农委、信息产业局、劳动保障局、商委、粮食局、供销总社、气象局、广电集团、报业集团等单位到我市电信、移动、联通三大基础电信公司调研农村信息化工作。     

ARC-Based YouTube世代电子产品在CES 2008引领风骚

可组态多媒体子系统暨CPU/DSP处理器领导厂商ARC International宣布,2008年拉斯韦加斯国际消费性电子展(Consumer Electronics Show:CES)共有超过15家以上ARC的客户和伙伴展出最新的ARC-Based方案,包括BiTMICRO、Broadcom、Chips&Media、D-Link、Fujitsu、Intel、NemeriX、Oki、Qpixel、ReaINetworks、SanDisK、Siano、SiConnect、Sony和Toshiba等.     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.