关于降低OFDM系统中峰均功率比技术的研究

主要围绕降低OFDM（正交频分复用）系统中峰均功率比（PAPR）展开研究.先对目前降低OFDM峰均功率比的各种技术进行了分析总结.然后,对信号畸变技术中的加权信号调制技术进行深入的研究和分析,通过仿真证明该技术可以有效地降低PAPR.本文所研究的内容均利用Matlab软件进行仿真.     

OFDM系统降低峰均功率比的主要技术及其比较

正交频分复用（OFDM）技术在无线移动通信系统中具有抗多路径衰落和频带间干扰等优点。然而,其主要瓶颈在于OFDM信号的峰均功率比（PAPR）很大,因而容易导致OFDM信号的交调失真和系统性能的下降。阐述了降低OFDM系统峰均比的三类技术：预畸变技术、编码类技术、概率类技术,并对其性能做了比较。     

OFDM技术及其峰均功率比降低的一种有效方法的研究

正交频分复用（OFDM）是一种多载波调制技术，其特有的调制特性决定了它有较高的峰均功率比值。高峰均功率比信号会对实际放大器提出很高的线性要求，因此它是限制OFDM技术实用化的主要障碍。目前虽然有很多降低OFDM信号的峰均功率比（PAPR）的方案，但大多是以增加系统的复杂程度为代价的。本文提出了一种降低OFDM信号PAPR的方法，可以在不过分增加系统复杂性的基础上解决其PAPR在一定程度上降低的问题。     

一种抑制PAPR信号峰均功率比的有效方法

OFDM技术的应用越来越广泛,但是其发送信号功率的峰均功率比（PAPR）比较大是其主要的缺陷之一。本文提出了一个降低OFDM信号PAPR的有效灵活的技术。该方法是通过恰当的选择OFDM调制中各个子载波的时域脉冲波形。仿真结果表明该方法能够大大降低OFDM信号的PAPR值。该技术与现有的其他方法相比实现复杂度也更低。     

降低OFDM系统峰均比的SLM和PTS技术研究

正交频分复用（OFDM）是一种多载波调制技术,它具有良好的抗多径干扰能力、频谱利用率高和数据传输率高等优点。但OFDM信号的高峰均功率比（PAPR）会引起非线性失真并导致误码率性能恶化,因此,有必要研究降低PAPR的方法。本文首先介绍了SLM和PTS技术的基本原理,然后与原始OFDM系统的CCDF、功率谱和系统误码率进行比较。仿真结果表明：采用SLM和PTS技术可以有效改善OFDM信号的PAPR。     

应用PTS降低MIMO-OFDM信号峰均比技术研究

多输入多输出正交频分复用（MIMO—OFDM）系统已成为新一代高速通信系统研究中的热点。而系统所产生的高峰均比（PAPR）信号是限制MIMO—OFDM技术实用化的主要障碍。在对部分传输序列（PTS）技术进行研究的基础上。本文提出了一种应用PTS降低MIMO—OFDM信号峰均比（PAPR）的方案一并行PTS。仿真结果表明。该方法能有效降低MIMO—OFDM信号峰均比。     

降低OFDM系统高峰均功率比的方法研究

针对OFDM技术具有较高的峰均功率比（peak to average power ration,PAPR）这一主要缺点,提出一种控制OFDM载波信号衍生频谱的迭代算法,在降低系统高峰均功率比的同时,也降低系统的误码率.利用该算法对数据序列长度为64的OFDM信号进行仿真验证,随着迭代次数的增加,衍生频谱系数增大,系统平均功率增加,OFDM信号的峰值功率比得到一定的降低.     

OFDM系统中降峰均比研究及PTS改进算法

正交频分复用（OFDM）技术在解决无线移动通信系统中显示了许多特点,如抗多路径衰落和频际间的干扰等。然而,OFDM系统中一个最主要的瓶颈在于OFDM信号的峰均功率比（PAPR,Peak-to-Average Power Ratio）很大,因而容易导致OFDM信号的交调失真和系统性能的下降。如何有效地解决OFDM系统中的峰均功率比是亟待解决的问题。为此,提出一种新的PTS（部分传输序列）改进算法。     

线性变换和预留子载波降低光OFDM系统的PAPR

正交频分复用(OFDM)技术存在着高峰值平均功率比(PAPR)的缺点,在光OFDM系统中,由于其调制器、D/A转换器件、功率放大器及光纤本身的非线性,较大PAPR的信号将会产生严重的畸变,从而大大降低系统的有效性.为抑制光OFDM系统中的PAPR,提出了一种基于线性变换和预留子载波技术的光OFDM系统PAPR降低算法.仿真结果表明,该方案不仅有效地降低了峰均功率比,而且对系统误码率的影响较小,能够获得可靠的系统误码率性能.     

OFDM信号限幅滤波的性能分析

OFDM是一种多载波调制技术,其特有的调制特性决定了它有较高的峰均功率比值PAPR（Peak-to-Average Power Ratio）。高峰均功率比信号会对实际放大器提出很高的线性要求,因此它是限制OFDM技术实用化的主要障碍。目前虽有很多降低OFDM信号的PAPR的方案,但大多是以增加系统的复杂程度为代价的。限幅滤波法是一种计算复杂度较小的算法。文中针对600Mb/s高速数传数据经4路子载波（每路150Mb/s）调制后的OFDM信号的PAPR进行了分析,并对限幅滤波法进行了仿真。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

A rigorous proof of MIMO channel capacity’s increase with antenna number

It is well known that adding more antennas at the transmitter or at the receiver may offer larger channel capacity in the multiple-input multiple-output（MIMO） communication systems. In this letter, a simple proof is presented for the fact that the channel capacity increases with an increase in the number of receiving antennas. The proof is based on the famous capacity formula of Foschini and Gans with matrix theory.