毛细管平面辐射空调系统的应用分析研究

毛细管辐射空调系统作为一种绿色环保的空调系统,具有施工方便、舒适、节能、免维护、免清洗等诸多优点。具体从毛细管辐射空调系统的优势和弊端、在我国的应用情况等方面进行了分析研究。     

上海某会议室毛细管辐射空调系统设计

毛细管辐射空调将空调区域的显热负荷和潜热负荷分别处理,可以节省空气处理过程中的大量能耗。对上海某建筑设计一套毛细管辐射空调系统,以其中的某一会议室为例进行说明,系统主要由毛细管辐射末端,热泵式溶液调湿新风机组,地埋管地源热泵机组构成。并简述该系统的负荷计算、风系统和水系统及冷热源的设计计算等内容。     

毛细管网空调系统的研究现状

毛细管网空调系统是一种新型的节能系统。介绍毛细管网系统运行的基本原理,对毛细管网舒适度进行分析,以及毛细管网与低品位热源结合应用,提出了毛细管网空调系统中结露问题的解决方法,对未来普遍毛细管网空调系统奠定了基础。     

某医学院附属医院洁净手术部空调设计

介绍了工程的空调设计,包括设计指标,空调冷热源,水系统,风系统,自动控制系统等.总结了工程中的节能设计.     

基于蒸发冷却的辐射供冷/暖与工位空调复合系统设计方法

在我国西北地区,利用蒸发冷却技术制取高温冷水和新风,分别送到房间的辐射末端和工位空调,消除室内负荷达到室内热舒适和节能目的的基于蒸发冷却的辐射供冷/暖与工位空调复合系统,介绍了系统的形式特点及运行模式,提出了基于蒸发冷却的辐射供冷/暖与工位空调复合系统的设计方法,以乌鲁木齐地区的某高档办公建筑为例,对基于蒸发冷却的辐射供冷/暖与工位空调复合系统进行了设计计算,背景空调采用辐射顶板,工位空调采用桌面工位空调,以此为同类其他空调系统的设计提供参考,拓展蒸发冷却的应用范围,使基于蒸发冷却的辐射供冷/暖与工位空调复合系统得到更为广泛的应用。     

吊顶辐射加新风系统的设计探讨

吊顶辐射加新风系统不同于其他空调系统,其具有更好的节能性及舒适性,但有对吊顶防结露要求高等特点。针对吊顶辐射加新风的优缺点以及系统设计进行了简单探讨。     

四种供暖末端形式下及舒适性的比较

对四种供热末端形式下单位面积的耗炯量及节能率进行了分析与比较,得出毛细管顶板辐射供热耗能量最少,最节能环保;通过airpak软件对室内的热环境进行了模拟,分别得出室内供热房间的温度云图、PMV云图,并进行了分析与比较得出结论:地板辐射供暖在经过人体的截面处温度梯度小于毛细管顶板辐射供热,不会产生"辐射吹风感",人体感觉更舒适。     

无人值守基站节能方案

主要针对无人值守基站无红外遥控功能的空调,依据无人值守基站设施内现有的设备,实现对空调的自动控制及远程控制,推进节能减排。     

自动化技术在供热空调系统中的应用

阐述供热空调自动控制系统的特点，自动控制系统在供热空调中的应用，包括前馈控制系统、串级调节系统、DCC控制系统、新风机组控制系统、空调机组控制系统。     

两种新型蒸发冷却辐射空调系统的研究

从目前所采用和研究的辐射空调系统着手,系统的总结出该空调系统的应用情况。同时,针对西北地区特殊的气候条件,空气相对湿度较小的特点,分析现存的辐射空调系统各个优缺点及其适用地区。在此基础上,提出两种新型的蒸发冷却辐射空调系统,该系统不仅避免了低温冷水机组的使用,同时在夜间,采用辐射的方式进行散热,用于制取冷水。并且介绍其...     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.