面向光纤通信的大气激光应急通信系统设计

应急通信是指在突发事故造成通信中断或通信阻塞情况下的临时通信。结合应急通信的特点,给出一个面向光纤的大气激光应急通信系统,较为详细地说明了该系统中应急数字光端机的各模块功能,分析了PPM调制和锁相环原理和作用,最后指出了应急通信系统的应用前景。     

面向光纤通信的大气激光应急通信系统设计

应急通信是指在突发事故造成通信中断或通信阻塞情况下的临时通信。结合应急通信的特点,给出一个面向光纤的大气激光应急通信系统,较为详细地说明了该系统中应急数字光端机的各模块功能,分析了PPM调制和锁相环原理和作用,最后指出了应急通信系统的应用前景。     

一种基于单线通信方法的LED显示系统

该文介绍了一种基于单线串接通信的LED显示系统。该LED显示系统可以有效地解决传统LED通信系统信号传输苛刻的时序配合问题,提高整个LED显示系统的稳定性和控制灵活性,同时也比当前LED通信系统具有更高的效率,具有通信方式简单、生产成本低、应用支持方便等特点。     

一种单线串接通信的LED显示系统

该文介绍了一种基于单线串接通信的LED显示系统。该LED显示系统可以有效地解决传统LED通信系统信号传输苛刻的时序配合问题,提高整个LED显示系统的稳定性和控制灵活性,同时也比当前LED通信系统具有更高的效率,具有通信方式简单、生产成本低、应用支持方便等特点。     

2010全国应急通信研讨会召开

日前,第五届全国城市应急联动高层论坛在北京举办。本次大会围绕“完善应急通信体系,促进社会和谐发展”的主题,重点探讨了如何建设安全可靠的应急联动通信系统,并更好更高效地运用;如何制订各专网与公网应急通信系统之间的协调机制,充分发挥专网在应急通信中的作用;如何构建卫星网络与地面通信网络天地一体化的应急通信保障系统;如何更好地研发符合国家应急指挥要求的应急通信设备,做好应急联动通信系统的优化、运营与维护;城市突发事件中的通信网络构建与通信安全保障;     

卫星通信的应急通信系统探究

本文通过对应急通信含义和意义的探讨,结合卫星通信的原理,论述了卫星通信的应急救援系统在地震灾害中的重要作用,说明发展卫星通信的应急通信系统能够有力紧急情况的救援能力.     

西部边远地市基于集群通信技术的350M无线应急通信系统建设

西部边远地市,地质灾害多,紧急、突发事件频发,基于集群通信技术的无线应急通信系统发挥着越来越重要的作用。本文针对西部边远城市发展需求和应急通信状况,提出了发展350M无线集群应急通信系统的思路和方案,并在实施过程中取得了较好的效果。     

西部边远地方基于集群通信技术的350M无线应急通信系统建设

西部边远地市,地质灾害多,紧急、突发事件频发,基于集群通信技术的无线应急通信系统发挥着越来越重要的作用,本文针对西部边远城市发展需求和应急通信状况,提出了发展350M无线集群应急通信系统的思路和方案,并在实施过程中取得了较好的效果。     

应用于LED显示系统的单线串接通信方法

该文介绍了一种先进的发光二极管（LED）显示系统的单线串接通信方法,该通信方法具有通信效率高、指令丰富、控制灵活、同步效果好等特点。可以有效地解决传统LED通信系统信号传输苛刻的时序配合问题,提高整个LED显示系统的稳定性和控制灵活性,同时也比当前LED通信系统具有更高的效率。     

论重特大灾害消防应急通信技术

消防应急通信在各类的灾害的消防抢险,特别是重特大灾害的应急抢险中具有重要的作用。建立高效的消防应急通信系统,是对消防部队提高其应急反应速度及应急救援效率的要求,是消防部队指挥部门进行及时指挥调度的有效保障。要确保消防应急通信系统的高效运行,离不开消防应急通信技术。本文就我国重特大灾害消防应急通信的现状进行分析,简单介绍了我国重特大灾害消防应急通信的技术,并提出了在重特大灾害中我国消防应急通信技术应该改进的地方。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.