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1.
陈飞  窦高奇  高俊  万志毅 《通信技术》2015,48(5):541-545
连续相位调制(CPM)信号是一种具有高频谱效率和功率效率的恒包络调制技术,但基于传统相位网格的CPM信号调制解调算法复杂度高、计算量大。提出了一种基于倾斜相位网格的CPM调制解调算法,通过分析CPM相位网络图和分解模型,给出了CPM信号倾斜相位网格设计、状态存储、初始化及译码的实现方法,相比传统相位,该算法更加简洁、计算量更小,并通过仿真验证了设计方案的正确性。  相似文献   

2.
连续相位调制(Continuous Phase Modulation)是一类包络恒定且相位连续的调制方式,具有很高的带宽和功率利用率,优良的包络和相位特性使其适用于空间通信。在分析CPM信号的模型基础上,研究了基于微积分的代数运算方法来完成对CPM信号的解调,该方法几乎不需要任何的先验信息和参数信息就能实现信号的盲解调,目的能够降低接收机的复杂度,是一种优秀的CPM信号解调方式。  相似文献   

3.
连续相位调制具有频谱利用率高、较低的带外功率、信号恒包络等特性,广泛地应用于无线通信系统中。然而现有的基于概率域的解调算法复杂度较高,不具有实用价值。针对这一问题对高效的相位连续调制技术进行了详细讨论,进而提出了基于可靠度的低复杂度CPM软解调算法。提出的软解调算法计算接收信号与调制信号之间的相关值,并将其作为信息度量。算法不依赖于信道噪声方差,避免了信道噪声方差估计不准确对解调性能带来的影响。仿真结果表明,提出的基于可靠度的软解调算法的性能与概率域下的解调算法几乎没有差异,并且完全能够与现代纠错码相结合,从而提高通信系统的可靠性。  相似文献   

4.
钟凯  葛临东  巩克现 《信号处理》2011,27(5):715-720
针对现有的多指数连续相位调制(CPM)信号解调中存在的运算量大,工程实现难度高等问题,本文提出了一种基于Laurent分解的低复杂度序列检测算法。该算法采用两个近似处理过程来有效减少解调中所使用的匹配滤波器的个数以及维特比译码器中所使用的网格状态数,并结合基于判决反馈的减少状态序列检测(RSSD)算法进一步减少后端处理中使用的网格状态。为了估计本文提出的接收机的性能,把该算法应用到一个实际中使用的多指数调制方案。仿真结果给出了与传统的最大似然序列检测(MLSD)相比,该调制方案中译码器的网格状态数从32个减少到4个,匹配滤波器的数目从8个减少到2个,然而仅仅带来0.9dB的性能损失。表明该算法能有效的降低多指数CPM接收机的复杂度,适合于实际应用。   相似文献   

5.
连续相位调制(CPM)是一种恒包络的高效调制方式,由于其解调算法复杂度高,其应用长期以来受到限制。传统的CPM解调算法基本上是基于幅度信息而未考虑相位信息,因此复杂度较高。本文提出了一种依据CPM信号特征的相位距离的定义,利用2RC-4CPM对该定义的有效性进行了验证,并将其应用于降低最大似然序列检测算法的路径数,从而大幅降低了最优接收机解调的复杂度。仿真表明,在选取适当门限值的情况下,基于相位距离的最大似然序列检测算法性能接近最优接收机。  相似文献   

6.
以8CPFSK为例对连续相位调制(CPM)信号的同步技术和解调技术进行研究,并提出一种新颖的解调和同步联合的接收方案。该方案利用了“多符号差分检测”和CPM信号特有的相位特性,反馈地修正同步误差。仿真结果表明使用该方案不但能简便准确地同步信号接收。而且能大幅度提高连续相位调制信号的误码性能。  相似文献   

7.
提出了一种幅度准恒包络、相位连续的差分相移键控调制与解调方法.该方法设计了一组基带信号集合,根据输入的信息值和状态值选择基带信号来实现信号调制.在信号解调中,通过计算接收信号在一个符号持续时间内的相位变化累积量来判决发送信息.仿真结果表明,该调制方法具有良好的频谱特性和准恒包络特性,并且避免了本振偏离、多普勒频移等引起的符号间相位变化对信号解调的影响.  相似文献   

8.
通信系统中存在多种调制技术,比如高阶调制,幅度调制,相位调制等,但由于调制阶数越高,对环境的要求就越严格,即要求的信噪比就必须越大,否则误码率会严重上升.文章就针对于整个无线通信系统的可靠性来和实现复杂度来说,选择了一种基于Matlab的DQPSK调制解调方式,它不仅能够最大程度保证系统的可靠性,同时还能降低误码率和方案的复杂度.  相似文献   

9.
付更超  周世新 《无线电工程》1998,28(2):35-38,34
本文介绍了单片机(8031)以软件方式实现FSK调制解调的原理和方法,它不仅具有硬件调制解调器的基本功能,而且有较高抗干扰能力。采用数字调频器原理及限幅鉴频的非相干解调器原理对信号进行调制和解调。该调制解调器具有相位连续,数据奇偶校验等功能。给出了电路框图和软件框图。  相似文献   

10.
针对常规接收方法接收自适应编码调制信号时存在的接收过程易中断、数据不连续等问题,提出了一种适用于卫星信道的自适应编码调制信号接收方法.该方法通过采用统一的解调结构实现对不同调制信号的连续跟踪;利用接收端保存的帧同步字调制波形副本与接收信号中的帧同步字波形的相关结果,对解调方式切换时载波相位跳变值进行估计和补偿,解决了帧同步的连续跟踪问题.与现有方法相比,该方法不需要导频信号,可节省系统开销.  相似文献   

11.
DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.  相似文献   

12.
High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET > PDMAT > TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.  相似文献   

13.
In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal (200) (2d = 0.4027 nm) is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line(w), the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line(x), the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines(y), the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line(z) in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line(q) in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution(λ/△ 2) is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.  相似文献   

14.
From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.  相似文献   

15.
The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.  相似文献   

16.
The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.  相似文献   

17.
Today, micro-system technology and the development of new MEMS (Micro-Electro-Mechanical Systems) are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.  相似文献   

18.
This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel's.  相似文献   

19.
This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.  相似文献   

20.
An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.  相似文献   

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