有源OLED像素电路的设计与仿真

设计了有源OLED显示用非晶硅薄膜晶体管恒流型4-TFT像素驱动电路，并给出了驱动方法。应用HSPICE仿真了恒流型像素驱动电路的工作过程，详细分析了源（Source）电压VDD、存储电容Cs，以及开关晶体管T1、驱动晶体管T3的宽长比等参数对电路的输出特性的影响。仿真结果表明，此电路可以在整个帧周期持续供给OLED器件电流，并且解决了由于各像素驱动管阈值电压的差异带来的OLED亮度的不均匀问题。     

多晶硅TFTAMLCD的现状与前景

多晶硅有源矩阵液晶显示技术，特别是一体化多晶硅有源矩阵液晶显示技术以它独特的优点，越来越受到重视，并将在液晶显示领域中占有重要地位，但是，多晶硅有源矩阵液晶显示技术还存在一些问题，这也正是目前研究的主要内容，本文对低温下淀积高质量多晶硅薄膜技术；通过退火使非晶硅结晶为多晶硅技术；器件层转移技术；钝化技术；一体化技术以及多晶硅有源矩阵液晶显示的前景等进行了分析和讨论。     

基于不同TFT技术的AMOLED像素电路仿真分析

非晶硅、非晶氧化铟镓锌、多晶硅薄膜晶体管是可用于设计AMOLED像素驱动电路的3种典型的薄膜晶体管(TFT)技术。文中基于3种TFT的模型,针对大尺寸、高分辨率的AMOLED,分别在典型的电压式驱动和电流式驱动像素电路进行了建模仿真,并对仿真结果做了分析和比较。该研究方法为像素电路的设计提供了一定理论依据。     

多晶硅有源矩阵液晶显示器

本文首先就用来制造有源矩阵液晶显示器的非晶硅和多晶硅材料作了性能比较,然后描述了多晶硅薄膜晶体管阵列的制造方法,以及在制造方法上取得的进展。     

氧化物半导体薄膜晶体管的研究进展

简要说明了非晶硅、多晶硅和有机半导体用作薄膜晶体管沟道层的不足,从电学性质、光学性质和制备温度等几方面介绍了氧化物薄膜晶体管在有源阵列驱动显示技术中的优势,并介绍了氧化物沟道层制备工艺的优化和掺杂方法.最后,展望了氧化物半导体薄膜晶体管应用前景.     

非晶硅薄膜晶体管的热阻模型

基于能量方程、热流方程和边界条件,推导出了非晶硅薄膜晶体管的沟道热阻模型。采用该模型可准确预估器件有源层内的平均温度。在沟道热阻模型的基础上,考虑器件间场氧化层和金属互联线的影响,建立了非晶硅薄膜晶体管的二维热阻模型。采用该模型可描述器件有源层内温度的横向分布,并快速预估沟道内的最高结温。最后,将模型预测结果与器件模拟仿真结果进行了对比,两者拟合良好。     

非晶硅薄膜晶体管有机电致发光单元像素的设计

介绍了两管薄膜晶体管(TFT)和四管TFT有源驱动有机发光二极管工作原理,结合TFT工作条件限制以及实现显示的要求完成了四管TFT有源驱动有机电致发光单元像素的设计,利用Hspice软件验证了单元像素的设计结果,最大输出电流为2.1 μA,一帧的时间后变化到2.0 μA,变化量小于一个灰阶电流,满足显示要求.     

受激光辐照而局部晶化的新型多晶硅TFT

提出一种新型多晶硅ＴＦＴ结构，它在沟道中设置了高阻的非晶硅区，从而有效地减小了漏电流。这种新器件的有源层被局部晶化，而沟道区中与源极相邻的两个边界层未被晶化，保持非晶硅态。     

用于OLED的a-Si TFT有源驱动阵列保护电路的分析

在模拟与仿真的基础上．根据MOS器件的源漏击穿特性．分析了用于a-Si TFT有源驱动阵列的外围保护电路的工作原理;同时根据所采用的有源OLED单元像素驱动电路的特点,确定了电源线、数据线、信号线上的相应保护电路形式。该保护电路可应用于OLED的有源驱动TFT阵列。     

有机薄膜晶体管阵列面向电子纸像素设计

讨论了有机薄膜晶体管(Organic Thin Film Transistor,OTFT)作为开关器件来驱动电子纸的像素设计,特别是像素电路结构、HSPICE模拟用模型参数和像素平面结构。讨论了有机薄膜晶体管制造过程,并用HSPIC模拟分析了有机薄膜晶体管结构和存贮电容大小对像素波形的影响,结果表明TFT结构的选择依赖于存贮电容的大小。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

A rigorous proof of MIMO channel capacity’s increase with antenna number

It is well known that adding more antennas at the transmitter or at the receiver may offer larger channel capacity in the multiple-input multiple-output（MIMO） communication systems. In this letter, a simple proof is presented for the fact that the channel capacity increases with an increase in the number of receiving antennas. The proof is based on the famous capacity formula of Foschini and Gans with matrix theory.