Ⅰ-型硅基笼合物Ba8Ga16ZnxSi30-x的合成及电传输特性

用固相反应法结合熔融法合成Zn掺杂单相n型Ba8Ga16ZnxSi30-x化合物,探索Zn在Si位的取代对其结构及电传输特性的影响规律.研究结果表明:x=1时化合物的平均键角畸变△θ最大为4.4°;当取代分数x=0,2,4时,对应样品的电导率明显高于x=1,3时对应样品的电导率,在室温附近,Ba8Ga16Zn2Si28化合物表现出较高的电导率,约为3.0×105 S/m,当x=1时,对应化合物的电导率在测试温度范围内最低;当取代分数x=0,2,4时对应样品的Seebeck系数明显高于x=1,3时对应样品的Seebeck系数,且随着填充分数的增加,Seebeck系数分别逐渐降低;Ba8Ga16Zn2Si28化合物在测试温度范围内表现出较好的电性能,在1000K处具有最大的功率因子1.03×10-3 W/(m·K2).     

Ⅰ-型硅基笼合物Ba8Ga16ZnxSi30-x的合成及电传输特性

用固相反应法结合熔融法合成Zn掺杂单相n型Ba8Ga16ZnxSi30-x化合物,探索Zn在Si位的取代对其结构及电传输特性的影响规律.研究结果表明:x=1时化合物的平均键角畸变△θ最大为4.4°;当取代分数x=0,2,4时,对应样品的电导率明显高于x=1,3时对应样品的电导率,在室温附近,Ba8Ga16Zn2Si28化合物表现出较高的电导率,约为3.0×105 S/m,当x=1时,对应化合物的电导率在测试温度范围内最低;当取代分数x=0,2,4时对应样品的Seebeck系数明显高于x=1,3时对应样品的Seebeck系数,且随着填充分数的增加,Seebeck系数分别逐渐降低;Ba8Ga16Zn2Si28化合物在测试温度范围内表现出较好的电性能,在1000K处具有最大的功率因子1.03×10-3 W/(m·K2).     

AgIn共掺杂(AgIn)xPb1-2xTe化合物的合成及热电传输性能

用高温熔融法合成了Ag和In共掺的单相n型(AgIn)xPb1-2xTe化合物,研究了(AgIn)掺杂量x对(Ag-In)xPb1-2xTe(x=0.01～0.05)物相组成及热电性能的影响.结果表明:掺杂量x≤0.04时得到单相四元化合物,x=0.05时样品中出现了组成为AgInTe2第二相;(AgIn)xPb1-2xTe化合物的Seebeck系数随着x增加而增大,电导率随着掺杂量x增加而降低;化合物的热导率随着掺杂量x增大而减小;当x=0.01时,(AgIn)xPb1-2xTe化合物的热电性能指数值最大,在800K时达到1.1.     

AgIn共掺杂(AgIn)xPb1-2xTe化合物的合成及热电传输性能

用高温熔融法合成了Ag和In共掺的单相n型（AgIn）x Pb1-2x Te化合物,研究了（AgIn）掺杂量x对（AgIn）x Pb1-2x Te（x=0.01～0.05）物相组成及热电性能的影响.结果表明：掺杂量x≤0.04时得到单相四元化合物,x=0.05时样品中出现了组成为AgInTe2第二相;（AgIn）x Pb 1-2x Te化合物的Seebeck系数随着x增加而增大,电导率随着掺杂量x增加而降低;化合物的热导率随着掺杂量x增大而减小;当x=0.01时,（AgIn） x Pb1-2x Te化合物的热电性能指数值最大,在800K时达到1.1.     

硫掺杂对ZnO热电性能的影响

采用固相反应法制备了ZnO1-xSx块体材料(0≤x≤0.05);通过对样品X射线衍射谱(XRD)、电导率和Seebeck系数的测量,研究了S掺杂对ZnO晶体结构及热电性能的影响。结果表明:所有试样均为六方纤锌矿结构。在573 K时,ZnO1-xSx(0相似文献   

Ba(Zn_((1-x)/3)Ni_(x/3)Nb_(2/3))O_3微波介质陶瓷的介电性能

利用 Ni2 取代Ba(Zn1/3Nb2/3)O3 的B位Zn2 来改善其介电性能.XRD表明,系统的主晶相为立方钙钛矿的BZNN,并有少量第二相如Ba5Nb4O15、BaNb6O16等.当系统中x(Ni2 )=0.7时,1 500 ℃烧结时系统得到优异的介电性能,介电常数为35.7,容量温度系数为-4.7×10-6/℃,损耗tan δ为0.33×10-4(1 MHz).     

p型方钴矿化合物BayFeCo3Sb12的热电性能研究

用两步固相反应法合成了单相的p型BayFeCo3Sb12化合物,并系统地研究了Ba不同填充分数对方钴矿化合物热电性能的影响:化合物载流子浓度强烈地依赖于填充原子的填充分数,随Ba填充分数y的增加,载流子浓度及电导率降低;塞贝克系数随温度T的上升而增加,比CoSb3的塞贝克系数有一定程度的提高,尤其是在中温部分有大幅度提高,得到的最大塞贝克系数由CoSb3的107μVK-1提高到Ba1.0FeCo3Sb12的235μVK-1晶格热导率随Ba的填充分数y的增加而进一步下降,Ba08FeCo3Sb12甚至降到2.2 Wm1K1;Ba08FeCo3Sb12化合物显示最大热电性能指数,在850K左右其最大无量纲热电性能指数ZT值达0.75.     

（Zn1-xMgx）2SiO4基微波陶瓷的介电性能研究

对(Zn1-xMgx)2SiO4系统的微观结构和微波介电性能进行了研究。通过Mg取代硅锌矿Zn2SiO4中的Zn,用溶胶-凝胶法制得单一晶相的(Zn1-xMgx)2SiO4固溶体微波陶瓷。当Mg取代量超过其在硅锌矿Zn2SiO4中的最大溶解度时,分解为Zn2SiO4相和Mg2SiO4晶相;同时,通过调整x值(x=0.1~0.4,摩尔分数)可获得介电性能优良的微波瓷料。当x=0.2时,在1 170℃烧结,其微波介电性能为:介电常数rε=6.34,品质因数与频率之积Q×f=189 800 GHz(在f=15 GHz下测试的数据),谐振频率温度系数τf≈-62×10-6/℃。     

Ti、Zn掺杂对Co2Z电磁性能的影响

用固相反应法制备了Ti4+、Zn2+取代的Co2Z(Ba3Co2Fe24-xMO41,M=Ti、Zn, x=0.2～0.6)平面六角结构软磁铁氧体并对其电磁特性进行了研究.X-射线衍射结果表明样品表现出典型的Z型平面六角铁氧体构型.Ti4+、Zn2+ 取代会增加铁氧体内载流子的浓度,从而影响Co2Z的电磁性能.实验中用4991A阻抗/材料分析仪测试室温条件下Ba3Co2Fe24-xTixO41(x=0、0.2、0.4)和Ba3Co2Fe24-xZnxO41(x=0、0.2、0.4、0.6)样品在5 MHz～1 GHz 范围内的磁导率频谱和介电常数频谱.实验结果表明,Ti4+取代Fe3+会增加Co2Z的起始磁导率,降低Co2Z的介电共振.而Zn2+取代Fe3+会引起起始磁导率的下降,增加Co2Z的介电共振,且在共振频率附近介电常数为负值.Co2Z的负介电常数特性使它可作为负介电常数介质用于左手材料的制备.     

N2气氛烧结La掺杂BaTiO3陶瓷的结构与介电性能

采用水热法合成的BaTiO3粉体，分别掺入La(NO)3摩尔分数为0～2．0％，N2气氛1250℃烧结。利用XRD和SEM观测样品的微观结构，用阻抗分析仪测量了在-50～150℃温度范围内样品的介电性能，研究La(NO)3掺杂量对陶瓷样品显微结构和介电性能的影响。试验结果表明：随着La(NO)3掺杂量增大，样品晶粒尺寸逐渐增大。掺杂摩尔分数小于2．0％时，样品主晶相为BaTiO3四方相，介电损耗变化不明显；掺杂摩尔分数大于0．2％时，有第二相Ba5La4Ti8O22存在，介电损耗激增。室温下的表观介电常数ε1呈倒U型变化，当掺杂摩尔分数为0．8％时，室温下ε1达最大值280000。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

A rigorous proof of MIMO channel capacity’s increase with antenna number

It is well known that adding more antennas at the transmitter or at the receiver may offer larger channel capacity in the multiple-input multiple-output（MIMO） communication systems. In this letter, a simple proof is presented for the fact that the channel capacity increases with an increase in the number of receiving antennas. The proof is based on the famous capacity formula of Foschini and Gans with matrix theory.