基于S3C6410和WinCE6.0的嵌入式立体摄像系统

针对目前立体对图像同步采集问题,提出一种基于S3C6410处理器和WinCE6.0系统的实时同步采集方案.首先,完成立体摄像模块硬件设计;其次,开发相应的OV3640摄像头驱动程序并定制WinCE6.0操作系统;最后,开发基于DirectShow技术的立体摄像系统应用程序.应用程序利用摄像数据流反馈实现左右格式立体对图像的同步采集,关联左右两路摄像数据流,基于视差约束实现双摄像采集帧同步.系统利用ARM 11处理器的数据处理能力和WinCE系统的可裁剪,提高了嵌入式立体摄像系统的可靠性与便携性.     

单镜头真3D立体摄像技术*

【】针对集成成像技术记录立体图像显示深度小,图像摄取技术要求高等缺点,提出一种单镜头真3D立体摄像系统,并从系统结构、原理、核心元件参数设计、显示效果几方面对系统进行分析。研究表明,单镜头真3D立体摄像系统能记录与呈现更深的三维场景,并可在一定范围内进行焦距调整,其结构简单,有利于真3D立体图像技术推广,具有较高的研究与应用价值。     

激光平面扫描3D测量系统快速标定技术

建立了激光平面扫描3D测量数学模型，提出了一种全新的3D测量系统参数的快速标定方法，设计了由2个完全垂直的平面组成的立体标定靶标，使用1个靶标可同时标定测量系统的摄像机参数和光平面方程参数。采用该方法对激光平面扫描测量系统进行了参数标定，用标定后的系统对标准平面进行了测量，空间测量精度优于0．1mm。     

便携式组合测量系统坐标统一的标定方法

针对便携式结构光测量系统和光学三 坐标测量系统的测量坐标系的全局统一问题,提出了一种基于手眼标定模型的标定方法 。利用 在全局坐标系下固定的平面标靶以及与便携式结构光测量系统具有刚性约束关系的 主动光立体标 靶作为中介坐标系,分别估计便携式结构光测量系统与平面标靶的位姿参数以及光学三 坐标测量系统 与主动光立体标靶之间的位姿参数,然后基于手眼标定模型标定出主动光立体标靶与便携式 结构光测量系 统之间的刚性位姿关系,进而完成便携式结构光测量系统和光学三坐标测量系统的坐标统一 。实验结果表 明,本文方法标定结果相对误差标准差约为0.151mm,标定精度合理 有效,可以实现便携式组合测量系统坐标统一的快速标定。     

基于图像的模拟相机标定方法的研究

从光学测量角度出发,结合计算机主动视觉中的相机标定方法及数字图像处理技术,提出了一种CCD摄像系统畸变校正方法.该法通过使用经纬仪,不需相机做任何运动就能实现全过程的标定.该方法在摄像机模型中全面考虑了镜头的径向畸变,利用图像中心附近点畸变量较小的性质,用中心附近点和全场视点对摄像机内部参数和像差修正参数进行标定,最后由最小二乘法得到摄像系统畸变模型的畸变系数,解决了CCD摄像系统的畸变校正问题.与传统的相机标定不同,畸变校正中仅标定数字图像中像素间距和相机焦距.该法运用了亚像素细分算法,提高了测试系统的精度,是一种简单、有效、实用的标定法.     

基于Matlab的计算机视觉测量中摄像机标定方法研究

本文以视觉测量系统中的摄像机标定为研究对象,以物体在摄像机上所成的像与物体实际的形状之间具有一定的函数关系为基础,以获得该函数参数为目的用Matlab进行摄像机标定。该方法利用了Matlab的工具箱及VC＋＋6.0编译软件,设计标定方法及软件程序,方便准确的完成了单摄像头标定和双摄像头的立体标定,得出摄像机的内部参数和外部参数,简化了标定求解过程,提高了标定速率,并具有良好的移植性,适合于其他视觉测量系统。     

高逼真度3D实时成像与显示系统

3D显示技术应用于航空或医学等领域时,对其真实感和观看舒适度要求很高.介绍了一套双视点3D实时成像与显示系统,并对系统的关键技术和算法实现进行阐述,包括硬件系统的设计、双视点图像的标定、畸变矫正、实时监测与校正、3D效果调整等主要模块.该系统可对3D场景进行高逼真还原,并降低观看者的视觉疲劳感,对运行在动态环境中的应用场景有较好的参考价值.     

利用立体视觉的线结构光参数标定

准确标定系统参数是利用线结构光进行高精度测量的前提,文中提出了一种基于双目立体视觉的线结构光参数标定算法,以期达到在工业现场进行高精度、强鲁棒性标定的目的。算法首先采用Tsai两步法标定摄像机内参数和双目相机坐标系间的刚体变换,然后利用立体视觉极线约束条件匹配双目激光条纹点,并将其重构到三维空间以进行光平面标定。相对于...     

基于单摄像头双目成像系统在计算机视觉中的应用研究

利用单个摄像头和一平面镜的舍体实现了双目成像系统的三维视觉功能,并理论证明了平面镜相对于摄像头按一定条件放置时,利用合体可以得到适于三维立体视觉的图像。在已知舍体内外部参数的情况下,由舍体所得图像进行点的三维立体恢复的理论推导。对合体的标定、内外部参数的确定也进行了理论推导。最终证明,由合体进行三维立体恢复,其实质相当于双目成像。通过实验对合体和一双目成像系统分别进行了标定,利用标定的结果进行了对点的三维立体恢复。结果表明两者精度相当。     

二摄像机式立体摄像系统几个参数的分析

本文分析二摄像机式立体摄像系统几个参数，这些参数是①深度分辨力，②立体摄像区域，③显示畸变量。并且分析了这些参数之间的相互关系。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.