基于电信级网络营造“随时随地和诚信安全”的电子支付服务环境

本文介绍和分析了电信运营商在电信网上构架随时随地和诚信安全的电信级支付业务环境的尝试和探索。基于支付服务的4大支付角色,提出营造开放式应用环境的电信支付平台架构,是构建符合中国国情、随时随地和诚信安全支付环境的技术基础。     

移动支付相关技术及应用研究

移动支付手机钱包通过手机短信、语音、POS(销售点)等操作,随时随地为手机用户提供方便快捷的金融服务。文章介绍移动支付的支付场景以及支付业务类别,简要描述移动支付的账户体系、账户类型,研究移动支付平台的系统架构、管理功能以及与周边平台的对接关系,探讨用户开销户流程以及各类场景下的支付交易流程等。     

基于可信根的移动设备安全研究

随着移动通信技术的不断成熟,移动用户数量飞速增长,人们希望在工作场合使用自带设备（Bring your own device,BYOD）的意愿不断增强。移动设备的运用在给用户带来随时随地接入系统、方便快捷获取数据和交流业务的同时,也给用户带来了移动设备固有的相关安全风险。目前的移动设备由于缺乏基于硬件的可信根功能,不能为用户提供强有力的安全保证。文章详细介绍移动设备安全组件,给出移动设备体系架构,着重描述使移动设备能够更安全使用所需的基本安全功能。     

移动互联网流量经营分析系统方案研究

结合电信运营商对移动互联网流量经营的实际需求,通过对流量分析目标、系统技术架构、系统功能架构、平台组网方案等方面进行分析,提出移动互联网流量经营分析系统建设方案,该系统可对用户访问移动互联网行为进行分析,从而展开精细化流量经营,提升流量价值。     

关于运营商手机办公系统建设方案研究

随着电信运营商内部管理逐步走向精细化、标准化,运营商内部人员日常工作更多的是流程化办公。流程处理的及时性会影响公司的整体运转效率。智能移动终端的不断发展及应用的不断深入,使得通过手机等移动终端处理日常办公事务、提高公司整体工作效率成为可能。本文着眼于研究运营商内部移动化办公平台,即手机办公系统的建设方案,从系统功能架构、技术架构、网络架构、系统功能及安全等方面进行了思考和探索,并对手机办公平台的硬件承载方案进行了探讨。     

移动支付的发展动态与运营商应对策略

为帮助电信运营商更好地了解移动支付市场形势,有的放矢地发展移动支付业务,文章从政策导向、技术发展、场景建设、主体竞争与市场发展五个角度阐述移动支付的发展动态,并从产业、用户、运营商自身三个角度就移动支付业务对电信运营商提出了发展建议。经过分析与归纳,发现移动支付的政策、经济、社会、技术环境良好,移动支付业务正处于快速发展阶段,市场竞争激烈,增长空间巨大,电信运营商应该把握时机,分别从产业、用户、运营商角度考虑,充分发挥自身优势,完善移动支付业务,进一步促进移动支付产业更好更快发展。     

移动支付系统研究及其安全性分析

本文从工程实现的角度对移动支付系统的体系结构、系统功能模块进行了详细的阐述;然后分别从移动通信本身的安全性和电子商务在移动平台上的安全性两个层次考虑了移动支付系统的安全现状,分析其中存在的问题,并提出一些相应的解决方案和建议。     

基于NFC的移动支付安全解决方案研究与应用

随着互联网技术和电子商务的不断发展,越来越多的用户选择移动支付业务,与此同时,移动支付的安全性变得尤其重要,设计一种安全的移动支付解决方案具有重要的现实意义.本文通过详细分析现有的移动支付系统,并结合NFC和安全支付的特点,提出基于NFC的移动支付安全解决方案,并验证该方案的安全性.     

移动终端支付的安全性研究

各种移动支付应用在方便了用户的同时,也面临很多安全问题.个人信息泄露及电信诈骗等安全事件屡见不鲜,时刻在提醒我们要注意移动终端支付安全.手机病毒、垃圾信息、山寨APP、流氓软件、钓鱼网站等无处不在,用户使用移动终端设备稍不留意,就会不幸中招.提高安全意识,正确使用移动终端,安全支付,保障用户的权益不受侵害.     

移动互联网安全审计云

基于移动互联网的信息技术产品为人们带来随时随地便捷上网的同时,也迫使人们不得不考虑移动互联网对传统安全审计系统的威胁。目前,现有的安全审计系统只能对局域网内部进行监控,无法对具有跨地域、跨网段特点的移动互联网设备进行实时和持续的审计。文中提出了一种针对移动互联网设备的安全审计框架,利用嵌入式智能探针技术,并结合现有云平台和大数据处理技术,提出了跨地区跨网段移动互联网审计云,来应对移动互联网安全审计的新挑战。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

A rigorous proof of MIMO channel capacity’s increase with antenna number

It is well known that adding more antennas at the transmitter or at the receiver may offer larger channel capacity in the multiple-input multiple-output（MIMO） communication systems. In this letter, a simple proof is presented for the fact that the channel capacity increases with an increase in the number of receiving antennas. The proof is based on the famous capacity formula of Foschini and Gans with matrix theory.