共查询到20条相似文献,搜索用时 79 毫秒
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导频污染问题是限制大规模多输入多输出(MIMO)系统性能的主要影响因素.针对这个问题,提出了一种基于改进预编码和最优导频分配策略的大规模MIMO系统导频污染抑制算法.首先,在系统下通过基于改进遗传优化算法的最大化信干噪比(SINR)预编码算法,获得最优预编码矩阵;然后,通过基于用户信道条件优劣的最优导频分配策略对每个小区用户进行导频分配,从而实现大规模MIMO系统导频污染抑制.通过Matlab仿真结果可知,相对于传统的SINR预编码算法,所提算法的复杂度降低了65%左右,而导频污染抑制性能提升了30%左右.该算法能够有效抑制导频污染,提升大规模MIMO系统的性能. 相似文献
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针对边端协同联邦学习中边缘服务器与设备终端频繁交互更新模型和梯度参数时,窃听者容易通过导频攻击干扰信道估计,从而达到降低模型更新效率和窃取模型参数的问题,基于异构导频能量估计提出一种导频攻击检测算法。首先,通过深入分析导频攻击对系统安全速率的影响,构建联邦学习导频攻击系统模型。进而,基于随机分割和加密方法提出一种信号平均能量差的导频攻击检测方法,能够准确地检测出潜在的导频攻击并进行污染信道的恢复。实验结果表明,与其他已有算法相比,所提算法适用于检测发射功率小、隐蔽性强的导频攻击,基于恢复的信道状态信息进行预编码可以大幅度提高边缘服务器的数据传输速率。 相似文献
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针对电气与电子工程师协会802.11正交频分复用通信系统研究了一种利用导频间隔优化导频位置的方法,进而提出了一种利用导频序列更好的对频偏进行估计和补偿的算法。在电气与电子工程师协会802.11标准规定的帧格式基础上,利用数值仿真方法对提出方法所确定的导频位置和所提出的频偏估计补偿算法进行了性能分析。数值仿真结果表明,所提出的导频位置确定方法和频偏估计和补偿算法,在不提高系统复杂度的情况下,所提算法能够显著改善系统性能。 相似文献
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针对现有正交频分复用(Orthogonal Frequency Division Multiplexing, OFDM)系统信道估计和迭代检测算法中频谱效率低和鲁棒性差等问题,提出了一种基于酉近似消息传递和叠加导频的信道估计与联合检测方法。首先,在软调制/解调中叠加导频对正交幅度调制的星座点进行预处理,检测时将叠加的导频作为频域符号的先验分布,利用置信传播算法进行调制和解调,实现检测模型的简化。然后,应用因子图-消息传递算法对OFDM传输系统和信道进行建模和全局优化,引入酉变换加强信道估计算法的鲁棒性。最后,建立OFDM仿真环境对现有方法进行仿真分析。仿真结果表明,相对于现有的独立导频类算法,所提算法能够以相同复杂度显著提升OFDM系统的频谱效率和鲁棒性。 相似文献
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基于导频辅助的无循环前缀SFBC-OFDM系统 总被引:1,自引:0,他引:1
设计了一种基于导频辅助的无循环前缀空频分组编码-OFDM系统(Non-CP SFBC-OFDM).区别于传统的循环前缀空时分组编码-OFDM系统(CP STBC-OFDM),新系统发射端将块状导频序列和由空频分组编码构成的OFDM符号交替排布发射,并且每个OFDM符号前不再附加循环前缀,而接收端针对这一新的数据发射结构设计出一种基于干扰抵消的信号检测和信道估计联合递归算法.理论推导和仿真结果表明:相对于应用最小平方(LS)、迭代最小平方(iterative LS)的信道估计算法的循环前缀STBC-OFDM系统,引入联合递归算法的新系统可以得到更高的信息数据传输效率和更低的系统误比特率. 相似文献
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Michael Reilly 《半导体技术》2004,29(12)
DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system. 相似文献
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High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET > PDMAT > TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center. 相似文献
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In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal (200) (2d = 0.4027 nm) is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line(w), the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line(x), the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines(y), the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line(z) in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line(q) in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution(λ/△ 2) is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy. 相似文献
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Thomas M.Trexler 《半导体技术》2004,29(5)
From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test. 相似文献
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The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high. 相似文献
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The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation. 相似文献
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Today, micro-system technology and the development of new MEMS (Micro-Electro-Mechanical Systems) are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible. 相似文献
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Qi-jiang Ran Pei-de Han Yu-jun Quan Li-peng Gao Fan-ping Zeng Chun-hua Zhao 《光电子快报》2008,4(4):239-242
This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel's. 相似文献
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This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors. 相似文献
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YUXiao-hua XIANGYu-qun 《半导体技术》2005,30(2):30-32,37
An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB. 相似文献