基于FTTx的下一代通信网精确覆盖系统的设计与实现

在"宽带中国"上升为国家战略的大背景下,有效支撑移动宽带和固定宽带业务的发展是当前及今后一段时期通信网络转型的一项重大举措,也是室内深度覆盖建设转型的契机。通过探讨基于FTTx的下一代通信网精确覆盖系统的设计、系统基本原理、硬件电路原理及系统硬件实现等方面,为各运营商在无线网室内精确覆盖方案的制定提供一定的参考。     

5G室内覆盖系统的探讨

鉴于5G时代将有超过85%的移动业务发生在室内场景,文章梳理5G室内覆盖面临的来自高容量、高频段、新技术、可视化运维需求等方面的挑战,然后比较4种现有的室内覆盖方案,指出通过室外频信号覆盖室内、Wi-Fi、传统室分的局限,详细分析数字化室分的特征,得出数字化室分是一种理想的面向5G演进的室内覆盖方案,最后给出5G室内网络部署节奏。     

基于EOC的家庭移动通讯覆盖技术的实现

随着移动通信建设步伐的不断加快、移动用户的飞速增加,在大中城市的室外地区已经基本可以做到无缝覆盖。为了提高网络质量、提高用户满意度、增加话务量,室内覆盖越来越成为网优的重点。本文主要论述了一种无线信号覆盖的接入系统,和现有的EOC设备相结合,利用CATV同轴电缆实现无线信号入楼或者入户的深度覆盖,提供了更好的室内移动通信环境。     

WCDMA室内覆盖距离理论计算方法

一、引言作为深度覆盖的主要手段之一,室内覆盖在移动通信建设中已存在了十数年时间,然而在现有网络中,室内覆盖的效果仍然存在这一些弱覆盖情况,并集中体现在对居民住宅、密集建筑城中村等的覆盖中。因此,本文将研究一套通过理论计算来初步评估室内覆盖建设方案能否达到信号覆盖强度要求的方法,便于指导方案制定和     

现代建筑地下空间与高层建筑无线网络覆盖设计分析

结合实际应用情况,深入研究和分析了现代建筑地下空间与高层建筑无线网络的覆盖设计中的问题和设计方法。其中包含常用的室内分布系统的组成和特点,以及室内移动信号覆盖系统的具体要求和指标,最后是室内移动通信信号覆盖系统的设计与信号的科学合理选取。     

基于射线追踪传播模型实现5G室内分布系统仿真的研究

室内分布系统的建设已经成为解决深度覆盖问题的有效手段。目前,5G网络建设发展迅速,室内分布系统建设呈爆炸式增长,室内分布系统的网络规划和设计需要更加精细化。如何有效评估室内信号覆盖效果,成为当前室内分布系统规划设计的重要任务之一。以某大楼为研究对象,用射线追踪传播模型仿真计算覆盖性能指标,并将结果与现有网络的路测数据进行对比。经过校正相关模型参数实现仿真与实测一致,论证仿真为网络部署提供了参考依据。     

DAS分布式天线系统

该文主要介绍室内信号覆盖系统的应用和设计,如何使用高质量的器件,设计性能优良的室内移动通讯覆盖网络,相关系统性能指标。     

TD-LTE室内覆盖规划方案

TD-LTE室内覆盖是网络规划、建设的重要环节.本将TD-LTE 3种室内覆盖规划方案划分为三大类方式:分别是通过室外基站、室内分布系统和室内微基站进行室内覆盖.通过室外基站进行室内覆盖具有节省投资,建网速度较快,室内室外覆盖联合规划等优点.通过有源和无源分布系统进行室内覆盖适合于对业务数据速率和业务量要求较高,需要深度覆盖的场所,是大多数中大型场所的室内覆盖解决方案.通过室内微基站进行室内覆盖主要适合小型的办公娱乐场所,以及住宅弱信号覆盖楼层,具有传输接入简单,建网成本等优点.     

一种基于家庭宽带与MR数据的室内无线测量方法

室内无线信号的准确测量一直是电信运营商的工作难题,室内信号的准确性是基站小区的规划、无线网优化工作的重要依据。当前网络运营商对于无线网络覆盖质量情况主要通过DT(道路测试)、CQT以及MR (Measurement Report)采集来获得。其中路测数据仅能反映道路覆盖情况,无法采用用户家庭内部覆盖情况;现有MR数据上报的原始数据并无经纬度信息,只能反映整体小区信号覆盖情况,并不能反映精确位置的覆盖信息。而带有经纬度信息的MDT数据又面临着网络开销大、占用硬盘多、空数据比例大和室内定位误差大等缺点,所以如何获得用户在小区居民住宅内覆盖情况对移动运营商解决弱覆盖有着很大的意义。文章提出一种基于移动家庭宽带信息与MR数据关联的方法,利用关键字段实现信息关联从而获得居民室内无线信号的覆盖指标,在测量准确率和测试效率上有了明显提升。     

论移动专业室内分布的网络构造及实现

随着我国经济的飞速发展,人们对生活质量的要求也越来越高,移动网络已成为现在生活不可或缺的一部分。当今城市的规模不断扩大,高层建筑,地下设施大量出现,超过60%的人需在室内室内使用移动终端服务,所以室内需要良好的移动信号覆盖。室内分布主要针对室内用户群,是改善移动通信环境在建筑物内的良好覆盖的优秀方案,其原理是利用室内天线分布系统将移动信号均匀分布在室内各个角落,以此保证室内区域覆盖信号良好。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.