一种14位125MHz采样/保持电路的设计

设计了一种高性能采样/保持(S/H)电路,采用全差分电容翻转型的主体结构,有效减小了噪声和功耗.在电路设计中,采用栅压自举开关,极大地减小了非线性失真,同时,有效地抑制了输入信号的直流偏移.采样/保持放大器电路采用折叠共源共栅结构,由于深亚微米工艺中器件本征增益减小,S/H电路为达到更高增益,采用增益提升技术.设计的采样/保持电路采用0.18μm1P5M工艺实现,在1.8V电源电压、125 MHz采样速率下,输出差动摆幅达到2 V(VP-P),输入信号到奈奎斯特频率时仍能达到98 dB以上的无杂散动态范围(SFDR),其性能满足14位精度、125MHz转换速率的流水线ADC要求.     

12位100MS/s ADC中采样/保持电路的分析与设计

设计了一种高性能的采样保持(S/H)电路,在1.8V的电源电压下,其性能满足12位精度、100MS/s转换速率的ADC的要求。设计中采用了一种新型的自举采样开关,提高了S/H电路的可靠性和线性度;对于高增益大带宽的运算跨导放大器OTA的带宽设计,在分析了主运放和辅助运放在带宽和相位裕度等方面的关系的基础上,提出了新的设计方法。仿真结果表明:S/H电路的差动输出摆幅达到了2V;对于输入为49MHz的正弦波,测得其信号噪声失真比达到了82dB,满足12位ADC的要求;整个电路的功耗约为20mW。     

一种高性能14位采样保持电路

设计了一种应用于流水线型模数转换器的14位100 MHz采样保持电路,并在电路设计中,提出了一种改进型的栅压自举采样开关电路。在不增加电路复杂性的情况下,栅压自举采样开关电路可以有效地增加采样开关管的开启时间和关断时间,以及电路的可靠性。采样保持电路采用电容翻转式结构,以及采用增益提高的全差分折叠式共源共栅跨导放大器来实现。采用SMIC 1.8 V/3.3 V 0.18 μm 1P6M CMOS工艺对电路进行设计与仿真。仿真结果显示,在10.009765 MHz输入信号,100 MHz工作频率下,输出信号的无杂散动态范围(SFDR)为95.9 dB,与传统自举开关相比,提高了16.3 dB。     

一种欠采样应用的高精度低功耗采样/保持电路

设计了一种可用于欠采样情况的高精度、低功耗采样/保持电路。在40 MHz时钟频率下,采样90 MHz输入信号时可达11位以上精度。采用电容翻转结构的采样/保持电路,以消除电容失配的影响;使用栅压自举开关,以提高线性度,实现欠采样输入;并设计了一种高增益、大带宽、低功耗的增益自举套筒式共源共栅(telescopic cascode)运算放大器。电路采用SMIC 0.35μmCMOS工艺实现,电源电压为3.3 V,功耗仅为7.6 mW。     

两倍增益10位100 MSPS CMOS采样/保持电路

提出了一种两倍增益高线性、高速、高精度采样/保持电路。该采样/保持电路通过对输入信号实现两倍放大,改善了高频非线性失真;一种新型的消除衬底偏置效应的采样开关,有效地提高了采样的线性度;高增益和宽带宽的折叠共源共栅运算放大器保证了采样/保持电路的精度和速度。整个电路以0.35μm AMS Si CMOS模型库验证。模拟结果显示,在输入信号为49.21875MHz正弦波,采样频率为100 MHz时,增益误差为70.9μV,SFDR可达到84.5 dB。     

一种10位160 MS/s采样保持电路的设计

设计了一种用于流水线型A/D转换器的10位160 MS/s CMOS采样保持器.电路采用电容翻转式结构,以及运用增益提高技术(gain-boosting)的折叠式共源共栅放大器,以满足高速、高精度的要求;优化采样电容和运算放大器指标,以保证噪声容限和线性指标;优化辅助运放,从而保证运放的稳定性.HSPICE仿真结果表明,在78.83 MHz输入信号、160.34 MHz工作频率下,输出信号的无杂散动态范围为77.3 dB.     

一种用于流水线A/D转换器的低功耗采样/保持电路

文章介绍了一种适用于10位20MS／s流水线A／D转换器的采样／保持（S／H）电路。该电路为开关电容结构，以0．6μm DPDM CMOS工艺实现。采用差分信号输入结构，降低对共模噪声的敏感度，共模反馈电路的设计稳定了共模输出，以达到高精度。该S／H电路采用低功耗运算跨导放大器（OTA），在5V电源电压下，功耗仅为5mW。基于该S／H电路的流水线A／D转换器在20MHz采样率下，信噪比（SNR）为58dB，功耗为49mW。     

一种12位125MS/s的SiGe BiCMOS采样保持放大器

提出了基于TSMC 0.35μm锗硅(SiGe)BiCMOS工艺的全差分跨导运算放大器(OTA),充分利用了异质结晶体管(HBT)共射共基结构的大跨导、小寄生效应、低噪声等特性.采用共源共栅以及增益倍增技术的负载管,在3.3V单电源下,开环增益为92.2dB,单位增益频率为1.26GHz,相位裕度为61.1o(负载为550fF时),差分输出摆幅为3V,以此OTA为核心的采样保持放大器(SHA)的最大采样频率为125MHz.     

一种具有高线性度MOS采样开关的采样保持电路

通过采样保持电路中运放的复用,提出了一种具有高线性度MOS采样开关的模数转换器前端采样保持电路结构。这种结构可以显著降低采样开关导通电阻变化引入的非线性,从而在不增加开关面积和功耗的情况下,实现了高性能的采样保持电路。基于0.13?m的标准CMOS工艺,对提出的采样保持电路进行了仿真。在采样时钟频率为100MHz,输入信号频率1MHz时,仿真结果显示,无杂散动态范围(SFDR)达到了116.6dB,总谐波失真(THD)达到了112.7dB,信号谐波噪声比（SNDR）达到103.7dB,可以满足14比特流水线ADC对采样保持电路的要求。     

一种57.6mW,10位,50MS/s流水线操作CMOS A/D转换器

在1.8V,0.18μm CMOS工艺下,实现了10位,50MS/s流水线操作A/D转换器的设计和测试.通过优化采样电容和运算跨导放大器(OTA)电流,并采用动态比较器,从而降低功耗;采用复位结构的采样/保持和余量增益电路消除OTA失调电压的影响;优化OTA的次极点,保证其工作稳定.测试结果表明:ADC在整个量化范围内无失码,功耗为57.6mW,失调电压为0.8mV,微分非线性为-0.6～0.7LSB.对5.1MHz的输入信号量化,可获得44.9dB的信号与噪声及谐波失真比.电路面积为0.52mm2.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

GaAsSb/InAlAs PA DHBTs Grown by Production MBE

The epi material growth of GaAsSb based DHBTs with InAlAs emitters are investigated using a 4 × 100mm multi-wafer production Riber 49 MBE reactor fully equipped with real-time in-situ sensors including an absorption band edge spectroscope and an optical-based flux monitor. The state-of-the-art hole mobilities are obtained from 100nm thick carbon-doped GaAsSb. A Sb composition variation of less than ± 0.1 atomic percent across a 4 × 100mm platen configuration has been achieved. The large area InAlAs/GaAsSb/InP DHBT device demonstrates excellent DC characteristics,such as BVCEO＞6V and a DC current gain of 45 at 1kA/cm2 for an emitter size of 50μm × 50μm. The devices have a 40nm thick GaAsSb base with p-doping of 4. 5 × 1019cm-3 . Devices with an emitter size of 4μm × 30μm have a current gain variation less than 2% across the fully processed 100mm wafer. ft and fmax are over 50GHz,with a power efficiency of 50% ,which are comparable to standard power GaAs HBT results. These results demonstrate the potential application of GaAsSb/InP DHBT for power amplifiers and the feasibility of multi-wafer MBE for mass production of GaAsSb-based HBTs.     

Teleportation of an arbitrary unknown N-qubit entangled state under the controlling of M controllers

A new quantum protocol to teleport an arbitrary unknown N-qubit entangled state from a sender to a fixed receiver under M controllers(M < N) is proposed. The quantum resources required are M non-maximally entangled Greenberger-Home-Zeilinger (GHZ) state and N-M non-maximally entangled Einstein-Podolsky-Rosen (EPR) pairs. The sender performs N generalized Bell-state measurements on the 2N particles. Controllers take M single-particle measurement along x-axis, and the receiver needs to introduce one auxiliary two-level particle to extract quantum information probabilistically with the fidelity unit if controllers cooperate with it.