SiGe HBT小信号等效电路的参数直接提取

提出了一种求解硅锗异质结双极型晶体管(SiGe HBT)小信号等效电路模型的参数直接提取方法.整个提取过程使用由小信号等效电路推导出的一系列解析表达式,不使用任何数值优化方法.参数提取结果使用ADS软件仿真验证.结果表明,该方法简单易行,较为精确.     

SiGe HBT高频噪声等效模型研究

对硅锗异质结双极型晶体管（SiGe HBT）等效高频噪声模型进行了研究,在建模过程中,SiGe HBT的等效电路为小信号准静态等效电路,使用二端口网络噪声相关矩阵技术从实测噪声参数提取基极和发射极的散粒噪声,提取结果与几种散粒噪声模型进行对比分析,重点研究半经验模型建立过程,对半经验模型与常用的噪声模型使用CAD仿真验证,结果表明了半经验模型的有效性、更具准确性,该半经验模型能够用到不同工艺SiGe HBT的高频噪声模拟。     

SiGe HBT小信号和大信号建模与分析北大核心CSCD

基于异质结双极晶体管(HBT)优良的微波特性,精确建模对使用该类器件进行电路设计具有重要的意义。介绍了HBT所具有的独特优越性,采用Gummel-Poon等效电路模型对常用HBT进行了小信号和大信号模型的建立,加入了寄生电感等效衬底寄生参数,测试了SiGe HBT在不同偏置下的S参数及I-V特性曲线,利用半解析方法分析了非线性模型的参数提取,讨论了本征参数和寄生参数的拟合优化。给出了关于HBT大信号和小信号等效电路模型,对比实测参数进行验证,建立模型在测试频率范围内拟合结果和测试结果吻合良好。     

一种改进的InP HBT小信号模型的直接提取法

提出了一种改进的直接提取方法来提取InP HBT小信号等效电路中的模型参数,并将其成功地应用InP异质结双极晶体管（HBT）小信号等效电路。在所采用的模型中考虑了分布式基极-集电极电容效应。与其他直接参数提取方法相比,该方法从外围寄生元件到内部本征元件依次进行参数提取,提取过程较为清晰。除寄生参数外,其余所有的参数计算均未经过任何简化近似。该方法依赖于S参数的测量,所有等效电路参数直接从S参数数据中提取,而无需任何基于初始值的近似。在0.1 ~ 40 GHz的频率范围内,直接提取法在InP HBT上得到了成功的验证,并在整个频率范围内得到了较好的测量结果与计算结果的一致性。     

一种改进的InP HBT小信号模型的直接提取法（英文）

提出了一种改进的直接提取方法来提取InP HBT小信号等效电路中的模型参数,并将其成功地应用InP异质结双极晶体管(HBT)小信号等效电路。在所采用的模型中考虑了分布式基极-集电极电容效应。与其他直接参数提取方法相比,该方法从外围寄生元件到内部本征元件依次进行参数提取,提取过程较为清晰。除寄生参数外,其余所有的参数计算均未经过任何简化近似。该方法依赖于S参数的测量,所有等效电路参数直接从S参数数据中提取,而无需任何基于初始值的近似。在0.1～40 GHz的频率范围内,直接提取法在InP HBT上得到了成功的验证,并在整个频率范围内得到了较好的测量结果与计算结果的一致性。     

SiGe HBT大信号扩散电容模型研究

基于SiGe HBT（异质结双极晶体管）大信号等效电路模型,建立了SiGe HBT大信号发射结扩散电容模型和集电结扩散电容模型．该模型从SiGe HBT正反向传输电流出发,研究晶体管内可动载流子所引起的存储电荷（包括正向存储电荷和反向存储电荷）的基础上,同时考虑了厄利效应对载流子输运的影响,其物理意义清晰,拓扑结构简单。将基于大信号扩散电容模型的SiGe HBT模型嵌入PSPICE软件中,实现对SiGe HBT器件与电路的模拟分析。对该模型进行了直流特性模拟分析,直流模拟分析结果与文献报道的结果符合得较好,瞬态特性分析结果表明响应度好。     

一种改进的用于SiGe HBT的焊盘模型参数提取技术

提出了一种适用于Si基器件的焊盘寄生参数的提取方法,并将此方法提取的焊盘寄生参数结果与用近似法提取的焊盘寄生参数结果的精度作了比较。比较结果表明,文中提出的线性拟合法精度较高。焊盘寄生参数提取并剥离后,对AMS 0.35μm BiCMOS工艺加工的SiGe HBT的小信号等效电路进行参数提取,其中,外部电阻用基极"过驱动电流"法提取,本征参数用分析法提取,将参数提取结果代入模型进行仿真,仿真得到的S参数在整个测试频率范围内均与测试结果吻合良好。     

SiGe HBT MEXTRAM模型参数的直接提取

提出了一种锗硅异质结双极晶体管(SiGe HBT)MEXTRAM集约模型参数的直接提取方法。该方法通过有效地区分各种器件物理效应对器件性能的影响,无需电路仿真器,就能够提取器件的模型参数,简便实用。通过提取实验制备的SiGe HBT器件的整套MEXTRAM模型参数,仿真曲线与测试数据吻合良好,证实了该方法的精确性和有效性。     

Ⅲ-Ⅴ族HBT小信号模型直接提取方法

介绍了一种较为精确的Ⅲ-Ⅴ族HBT小信号模型的直接提取方法。该方法中的HBT小信号等效电路拓扑结构采用混合PI型结构,并通过在不同偏置状态下的测量进行模型参数的提取。采用该方法对2μm工艺、叉指数为2、发射结面积为2μm×20μm的HBT模型管进行了提取,提取结果在DC-20GHz频率范围内具有较好的精度,提取误差小于6%。     

微波HBT建模技术研究综述

本文对微波异质结双极型晶体管(HBT)发展及其应用现状、用于HBT器件的等效电路模型,以及HBT器件大、小信号建模技术、模型参数提取方法及研究进展进行述评.     

Accurate SOI MOSFET characterization at microwave frequencies fordevice performance optimization and analog modeling

The maturation of low-cost silicon-on-insulator (SOI) MOSFET technology in the microwave domain has brought about a need to develop specific characterization techniques. An original scheme is presented, which, by combining careful design of probing and calibration structures, rigorous in situ calibration, and a new powerful direct extraction method, allows reliable identification of the parameters of the non-quasi-static (NQS) small-signal model for MOSFETs. The extracted model is shown to be valid up to 40 GHz     

A robust and physical BSIM3 non-quasi-static transient and ACsmall-signal model for circuit simulation

A new non-quasi-static (NQS) MOSFET model, which is applicable for both large-signal transient and small-signal ac analysis, has been developed. It employs a physical relaxation time approach to take care of the finite channel charging time to reach equilibrium and the effect of instantaneous channel charge re-distribution. The NQS model is formulated independently from the dc I-V and the charge-capacitor model, thus can be easily applied to any existing simulators. The model has been implemented in the newly released BSIM3 version 3, and comparison has been made among this model, common quasi-static (QS) SPICE models and PISCES two-dimensional (2-D) numerical device simulator. While predicting accurate NQS behavior, the time penalty for using the new model is only about 20-30% more than the common QS models. It is much less than the time required by other NQS models reported. Limitations and compromises between simplicity, efficiency and accuracy are also discussed     

A new approach to model nonquasi-static (NQS) effects for MOSFETs. Part II: Small-signal analysis

We present a new approach to model nonquasi-static (NQS) effects in a MOSFET in a small-signal situation. The model derived here is based on the large-signal NQS model previously proposed. The derivation of the small-signal model is presented. The small-signal parameters obtained with this model prove to be accurate up to very high frequencies. An excellent match between the new model and device simulation results has been observed even when the frequency is many times larger than the cutoff frequency.     

Generalised partitioned-charge-based bipolar transistor modellingmethodology

A generalised formulation of the partitioned-charge-based (PCB) non-quasi-static (NQS) bipolar junction transistor (BJT) model is developed. The methodology, derived by taking moments of the hole (electron) continuity equation, allows the use of arbitrary weighting functions to partition the excess charge in the quasi-neutral base (QNB) to obtain an optimal NQS BJT model within the PCB equivalent network representation     

Investigation of very fast and high-current transients in digitalbipolar IC's using both a new compact model and a device simulator

The design and optimization of high-speed integrated bipolar circuits requires accurate and physical transistor models. For this, an improved version of the compact model HICUM was developed. It is an extension of the small-signal model recently described to the large-signal (transient) case. The model, which takes into account emitter periphery and non-quasi-static (NQS) effects, is semi-physical, allowing the calculation of its elements for arbitrary transistor geometries from specific electrical and technological data. This is an important precondition for transistor optimization in a circuit and for worst case analysis. The model was verified for basic building blocks of high-speed digital circuits like emitter follower and current switch. For this, mixed-mode device/circuit simulation is used instead of measurements, since the latter would give too large errors for the fast transients of interest. It is demonstrated that-in contrast to the obsolete but frequently used SPICE Gummel/Poon model-the new HICUM is well suited for modeling very-high-speed transistor operation also at high current densities. Moreover, it is shown that at very fast transients the influence of NQS effects can no longer be neglected. As a practical application example, a high-speed E²CL circuit is simulated using the new model. The results show again that high-current models are very useful for designing IC's at maximum operating speed. This is because the optimum emitter size is often the minimum size, which is limited by high-current effects. Especially, in the case of current spikes (e.g., in emitter followers) it is difficult to find the optimum emitter size without having adequate transistor models     

Improved small-signal equivalent circuit model and large-signalstate equations for the MOSFET/MODFET wave equation

A simple non-quasi-static small-signal equivalent circuit model is derived for the ideal MOSFET wave equation under the gradual channel approximation. This equivalent circuit represents each Y-parameter by its DC small-signal value shunted by a (trans) capacitor in series with a charging (trans) resistor. A large-signal model for the intrinsic MOSFET is derived by first implementing this RC topology in the time domain. Modified state equations are then introduced to enforce charge conservation. Transient simulations with this approximate large-signal model yield results that are compared with reported exact numerical analysis for the long channel MOSFET for a wide range of bias conditions. This unified small- and large-signal model applies to both the three- and four-terminal intrinsic MOSFET in the region of the channel where the gradual channel approximation is applicable. A non-quasi-static small-signal equivalent circuit for the velocity-saturated MOSFET wave equation is also reported     

A simple subcircuit extension of the BSIM3v3 model for CMOS RFdesign

An accurate and simple lumped-element extension of the BSIM3v3 MOSFET model for small-signal radio-frequency circuit simulation is proposed and investigated. Detailed comparisons of the small-signal y and s parameters with both two-dimensional device simulations and measurement data are presented. A procedure is developed to extract the values of two lumped resistors-the only added elements. The non-quasi-static and substrate effects can be modeled with these two resistors to significantly improve the model accuracy up to a frequency of 10 GHz, which is about 70% of the f_T of the 0.5 μm NMOS transistor     

A Unified Nonquasi-Static MOSFET Model for Large-Signal and Small-Signal Simulations

The spline collocation-based nonquasi-static (NQS) model is further developed to include all regions of operation and small-geometry effects. The new formulation provides a unified (hence consistent) approach to both large-signal and small-signal NQS modeling and is sufficiently flexible to work with any surface-potential-based MOSFET model. The model is verified through comparison with the channel segmentation method, two-dimensional numerical simulations, and experimental results and demonstrates a controlled tradeoff between model accuracy and efficiency. The new NQS model has been implemented into PSP model. Circuit simulations are given to demonstrate the accuracy and applicability of the new model.     

Accurate Characterization of Silicon-On-Insulator MOSFETs for the Design of Low-Voltage, Low-Power RF Integrated Circuits

The maturation of low cost Silicon-on-Insulator (SOI) MOSFET technology in the microwave domain has brought about a need to develop specific characterization techniques. An original scheme is presented, which, by combining careful design of probing and calibration structures, rigorous in-situ calibration, and a new powerful direct extraction method, allows reliable identification of the parameters of the non-quasi-static small-signal model and the high-frequency noise parameters for MOSFETs. The extracted model is shown to be valid up to 40 GHz.