共查询到17条相似文献,搜索用时 109 毫秒
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两电极多层阳极键合实验研究 总被引:1,自引:0,他引:1
介绍了用2个电极通过一次电极反接的方式实现多层样片之间阳极键合的操作工艺和键合机理,并以玻璃-硅-玻璃三层结构为例对其进行了实验研究。结果显示:多余的玻璃对第一次键合过程的电流特性影响不大,而第一次键合的玻璃对第二次键合电流产生显著的影响,电流出现不规则的突变。而且,在第二次键合过程中,第一次键合的玻璃在键合面上会出现由于钠元素积聚而产生的黄褐色斑点。拉伸强度实验的结果表明:第二次键合过程中在第一次键合面形成的反向电压会减弱键合的强度;通过合理选择键合参数可以得到满足MEMS封装要求的键合强度。 相似文献
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硅牌键合技术的研究进展 总被引:2,自引:0,他引:2
硅片键合技术是指通过化学和物理作用将硅片与硅片、硅片与玻璃或其它材料紧密地结合起来的方法.硅片键合往往与表面硅加工和体硅加工相结合,用在MEMS的加工工艺中.常见的硅片键合技术包括金硅共熔键合、硅/玻璃静电键合、硅/硅直接键合以及玻璃焊料烧结等.文中将讨论这些键合技术的原理、工艺及优缺点. 相似文献
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硅片键合技术的研究进展 总被引:8,自引:0,他引:8
硅片键合技术是指通过化学和物理作用将硅片与硅片,硅片与玻璃或其它材料紧密地结合起来的方法,硅片键合往往与表面硅加工和体硅加工相结合,用在MEMS的加工工艺中,常见的硅片键合技术包括金硅共熔键合,硅/玻璃静电键合,硅/硅直接键合以及玻璃焊料烧结等,文中将讨论这些键合技术的原理,工艺及优缺点。 相似文献
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Svetlana Tatic-Lucic John Ames Bill Boardman David McIntyre Paul Jaramillo Larry Starr Myoungho Lim 《Sensors and actuators. A, Physical》1997,60(1-3):223-227
A simple testing method is presented that allows the comparison of the bond quality for anodically bonded wafers. An array of parallel metal lines of predetermined thickness is formed on a glass wafer. The estimation of the bond quality can be performed by visual inspection after the bonding. This method enables comparison of the anodic-bonding process performance for different glasses, for intermediate layers and various bonding conditions. The optimization of silicon-glass anodic bonding with an intermediate phosphosilicate glass (PSG) layer is shown using this technique. 相似文献
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Silicon fusion bonding is studied as an enabling technology for the fabrication of microrobotic mechanisms. The effects of both surface activation technique and annealing temperature on bond strength are considered using a crack-opening technique. As part of the study, the relationship between patterned silicon feature size and the resulting bond strength is explored. Based on the experimental results, recommendations for an optimal silicon fusion bonding process for micromechanism fabrication are presented. The experimental results indicate that bulk silicon bonding strength can be achieved independent of feature size at temperatures as low as 300°C, with positive implications for micromechanism fabrication. 相似文献
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Junshan Hongchao Chong Zheng Yongqian Liding 《Sensors and actuators. B, Chemical》2009,141(2):646-651
Fracture of integrated metal microelectrodes likely happens during the thermal bonding process of PMMA [poly (methylmethacrylate)] microfluidic chips. In this paper, the fracture behaviors are studied. The fracture is mainly caused by the plastic deformation of the electrode plate (the PMMA plate with microelectrodes) and the thermal stress of microelectrodes, which is due to the high bonding temperature. To decrease the bonding temperature, a plasma assisted thermal bonding method is evaluated and first used to eliminate the fracture of microelectrodes. In this process, the surface of the cover plate (the PMMA plate with microchannels) is modified using oxygen plasma before the electrode plate is thermally bonded to the cover plate. The parameters of the oxygen plasma treatment are optimized, and the contact angle is decreased from 71.7° to 43.6°. The thermal bonding temperature is optimized, which decreases the temperature from 100 °C to 85 °C. Testing of bonding strength shows an average failure pressure of 1.75 MPa, which is comparable to the bonding strength of 1.46 MPa for chips bonded at 100 °C without plasma modification. In order to demonstrate this bonding method, a PMMA microfluidic chip with integrated copper interdigitated microelectrode arrays for AC electroosmotic pump is fabricated. 相似文献