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N型Ni基SiC欧姆接触比接触电阻的精确求解
引用本文:郭辉,张义门,张玉明,汤晓燕,冯倩.N型Ni基SiC欧姆接触比接触电阻的精确求解[J].西安电子科技大学学报,2008,35(5):842-845.
作者姓名:郭辉  张义门  张玉明  汤晓燕  冯倩
作者单位:(西安电子科技大学 宽禁带半导体材料与器件教育部重点实验室,陕西 西安 710071)
基金项目:国家自然科学基金,陕西省西安市科技计划
摘    要:精确求解一维定态薛定谔方程得到电子通过三角形势垒的隧穿几率,用其代替WKB近似计算的隧穿几率精确提取比接触电阻.针对N型Ni基SiC欧姆接触的实验结果进行了计算比较,结果表明采用该方法提取的比接触电阻比采用WKB近似计算的传统方法更加精确和符合实际情况.

关 键 词:碳化硅  欧姆接触  比接触电阻  直接隧穿  WKB近似  
收稿时间:2007-09-24

Accurate calculation of the specific contact resistance for Ni based Ohmic Contacts to the N-type SiC
GUO Hui,ZHANG Yi-men,ZHANG Yu-ming,TANG Xiao-yan,FENG Qian.Accurate calculation of the specific contact resistance for Ni based Ohmic Contacts to the N-type SiC[J].Journal of Xidian University,2008,35(5):842-845.
Authors:GUO Hui  ZHANG Yi-men  ZHANG Yu-ming  TANG Xiao-yan  FENG Qian
Affiliation:(Ministry of Education Key Lab. of Wide Band-Gap Semiconductor Materials and Devices, Xidian Univ., Xi’an 710071, China) ;
Abstract:The specific contact resistance of ohmic contact is deduced accurately based on the electron tunneling probabilities through the triangular barrier to be solved by the one-dimensional time-independent Schrdinger equation. The experimental results of Ni based ohmic contacts on the N-type SiC are compared with that of the simulation. The proposed method has the advantages over the WKB approximation of better accuracy and adaptation to SiC ohmic contacts.
Keywords:SiC  ohmic contact  specific contact resistance  direct tunneling  WKB approximation  
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