On Plastic Deformation Behavior of Cryorolled AA8090 Alloy

AA8090 alloy was rolled up to 50 and 75 % reductions at both liquid nitrogen (LNR) and room temperatures (RTR). Both hardness and tensile behavior were evaluated on rolled samples. Optical microscope, TEM and EBSD were used for detailed microstructural examination of rolled samples. Williamson-Hall peak broadening analysis on X-ray diffraction data was made to evaluate crystallite size, lattice strain and dislocation density. An enhanced tensile strength was evidenced in LNR samples when compared to RTR samples without sacrificing ductility, which was ascribed to the higher density of dislocations in LNR samples than RTR samples. A large number of dislocation tangled regions along with ultrafine grain structure were evidenced through TEM and EBSD. Significant fraction of special boundaries in combination with increased fraction of texture components like S, Brass, Cu and Goss would be another reason for enhanced properties in LNR conditions than that of RTR. These components were observed to be strengthened with increased rolling reduction. Work hardening behavior clearly evidenced the variation in amount of work hardening and recovery phenomenon. It showed large variation in recovery in the case of 50 % reduction than that of 75 % reduction, which was attributed to significantly higher density of dislocations in 75 % rolled samples in RTR and LNR.     

Economic in-line inspection sampling strategy with learning effects

This paper presents an innovative approach to a wafer inspection strategy that incorporates learning dynamics in semiconductor manufacturing factories. Using the data from fabrication lines (fabs) we demonstrate algorithms for computing the sampling strategy in terms of the percentage of wafers to sample for a process in different phases of a product life cycle. The average selling price and wafer starts per weeks are considered in the model. The paper provides an optimal solution methodology and concludes that the learning benefits of quality control activities may achieve the most cost-effective operations.     

Cellular network configuration with co-channel and adjacent-channel interference constraints

Design of cellular networks has drawn much recent interest from the OR scientific community. A challenging issue is the handling of channel interference constraints. Co-channel interference occurs when the same channel is reused within a threshold distance. Adjacent-channel interference occurs when two channels with adjacent or nearby frequencies are used in the same cell tower. We present a mathematical programming formulation for this channel allocation problem with both types of interference constraints—it also includes decisions on location of cell towers. Our focus is on the special case where a cell tower and/or channel can interfere with at most two other towers/channels. By establishing theoretical properties for channel allocation amongst towers under this circumstance, we develop an efficient solution procedure. An iteration of the procedure uses a heuristic to locate the cell towers, then allocates the channels to the towers using a polynomial-time algorithm, and finally improves this allocation using a simulated annealing procedure. The iterative steps are embedded within an external simulated annealing method. This nested simulated annealing procedure provides encouraging computational results compared to a standard commercial solver like ILOG CPLEX 8.1. The major contribution of the work is the simultaneous consideration of co-channel and adjacent-channel interference constraints.     

Supply management in assembly systems with random yield and random demand

In this paper, we consider an assembly system where a firm faces random demand for a finished product which is assembled using two critical components. The components are procured from the suppliers who, due to production yield losses, deliver a random fraction of the order quantity. We formulate the exact cost function where the decision variables are the target level of finished products to assemble, and the order quantity of the components from the suppliers. Since the exact cost function is analytically complex to solve, we introduce a modified cost function and derive bounds on the difference in the objective function values. Using the modified cost function, we determine the combined component ordering and production (assembly) decisions for the firm. The benefit of coordinating ordering and assembly decisions is numerically demonstrated by comparing the results with two heuristic policies commonly used in practice. In an extension to the model, we consider the case when the firm has the added option of ordering both the components in a set from a joint supplier. First, we consider the case when the joint supplier is reliable in delivery and obtain dominance conditions on the suppliers to be chosen. The maximum price a firm would be willing to pay to ensure reliable supply of components is determined. Later, we consider the uncertainty in the deliveries from the joint supplier and determine conditions under which there is no diversification, that is, either the individual suppliers are used, or the joint supplier is used, but never both.     

Control of batch processing systems in semiconductor waferfabrication facilities

Loading policies for a batch processing machine, i.e. a machine that can process more than one job at a time, when the arrival times of jobs to the machine are uncertain, are described. The motivation for the study is the structure of process flows and the predominance of batch processing systems in a semiconductor wafer fabrication facility. A two stage serial-batch system with the serial stage (e.g. photolithography) feeding the batch (e.g. furnace) is considered. Machines in the serial stage process one job at a time; further, these machines are subject to failure. A control limit policy for loading the batch machine is assumed, i.e. load if the queue length ⩾Q, else wait until the number of jobs in queue is at least Q. The basic tradeoffs considered are delay (waiting too long) vs. capacity utilization (loading early with very few jobs). An average cost analysis is done and optimized to compute the critical number Q. In an extension to the basic model, the effect of due dates on the critical number is analyzed. Comparison with simulation results is very encouraging     

Growth of CsLiB6O10 thin films on Si substrate by pulsed laser deposition using SiO2 and CaF2 as buffer layers

CsLiB₆O₁₀ (CLBO) thin films are grown on Si (100) and (111) substrates using lower index SiO₂ and CaF₂ as buffer layers by pulsed KrF (248 nm) excimer laser ablation of stoichiometric CLBO targets over a temperature range of 425 to 725°C. A CaF₂ buffer layer is grown on Si by laser ablation while SiO₂ is prepared by standard thermal oxidation. From extended x-ray analysis, it is determined that CaF₂ is growth with preferred orientation on Si (100) at temperatures lower than 525°C while on Si (111) substrate, CaF₂ is grown epitaxially over the temperature range; this agrees well with observed reflection high energy electron diffraction patterns. X-ray 2θ-scans indicate that crystalline CLBO are grown on SiO₂/Si and CaF₂/Si (100). Analysis of reflectance spectra from CLBO/SiO₂/Si yields the absorption edge at 182 nm. Surface roughness of the CaF₂ and CLBO/CaF₂/Si film are 19 and 15 nm, respectively. This relatively rough surface caused by the ablation of wide bandgap CaF₂ and CLBO limits the application of CLBO for waveguiding measurement.     

In-line yield prediction methodologies using patterned waferinspection information

Due to the advances in in-line inspection technology it is now possible to obtain an early in-line prediction of yield. This paper introduces and compares two new in-line yield prediction methodologies: (1) multilayer critical area method and (2) defect-type-size kill-ratio method. These methods are more accurate than the past and other current approaches used in the semiconductor industry. The first method uses the design layout information along with the in-line defect data, whereas the second method uses the defect and yield data to empirically derive the kill-ratios. We demonstrate our methodologies using data collected in a real wafer fabrication facility at the polysilicon gate (Poly), and the first and second interconnect (Metal 1 and Metal 2) post etch inspection layers. We compare our in-line predictions with the actual yield     

Micropipelined asynchronous discrete cosine transform (DCT/IDCT)processor

We describe the design and implementation of an asynchronous discrete cosine transform/inverse discrete cosine transform (DCT/IDCT) processor core compliant with the CCITT recommendation H.261. First, a micropipelined implementation with level-sensitive latches is shown. This is improved by replacing the level-sensitive latches with dual-edge triggered flip-flops to save power and using completion-detection adders in the critical stage of the pipeline to exploit the data-dependent processing delay. Gate-level simulation of extracted layouts indicates that the performance of asynchronous implementations is comparable with that of a synchronous implementation based on an identical architecture. This is because part of the penalty introduced by handshaking circuitry in an asynchronous pipeline can be recovered by exploiting data-dependent processing delays with completion-detection circuitry. In pipelines with significant arithmetic processing such as the DCT/IDCT processor, this is easily accomplished. Our results are encouraging because asynchronous designs do not employ global clocking. In the near future when clock generation, clock distribution, and the power consumed in the clock circuitry become limiting factors in the design of large synchronous application specific integrated circuits (ASICs), asynchronous implementation methodology could be pursued as a real alternative     

Influence of entrained air on frequency response of hydraulic actuator controlled by open center three way spool valveAuswirkungen von mitgeführter luft auf den frequenzgang eines hydraulischen systems mit asymmetrischem linearem antrieb

A theoretical investigation on the effect of entrained air frequency response of hydraulic actuator controlled by open center three way spool valve is made. It is shown that entrainment of air gives rise to additional non-linearity into the system equation. Both nonlinear and linearized system equations, derived in dimensionless form, are solved numerically and analytically respectively. Increase of air content or decrease of area ratio in presence of air increases the resonant peak amplitude and decreases the resonant frequency leading to a reduction in bandwidth. Similar effect is observed also when the process of change of state of entrained air is adiabatic rather than isothermal. Entrainment of air also reduces the allowable open loop gain making the stability in the closed loop inferior.