Structural and optical properties of TiO2 thin films grown by sol-gel dip coating process

The mono and bi-layer TiO₂ thin films have been prepared by sol-gel method on glass. X-Ray diffraction, Raman spectroscopy, atomic force microscopy, spectroscopic ellipsometry and m-lines spectroscopy techniques have been used to characterize the TiO₂ films. The mono-layer film is found to be amorphous, while the bi-layer film shows the presence of anatase phase. The bi-layer film exhibits more homogeneous surface with less roughness. The thickness effect on the refractive index, extinction ceofficient, packing density and optical band gap is analysed. The waveguiding measurements of the bi-layer film exhibit single-guided TE₀ and TM₀ polarized modes from which we can measure the refractive index and the film thickness.     

Comparison of Thin Films of Titanium Dioxide Deposited by Sputtering and Sol–Gel Methods for Waveguiding Applications

Semiconductors - In this work, TiO2 thin films were deposited onto glass substrate by two different techniques: sol–gel dip-coating (SG) and reactive DC magnetron sputtering (Sput). The...     

Structural and Optical Properties of MgO Thin Films Prepared by Dip-Coating Process: Effect of Thickness

Semiconductors - Magnesium oxide (MgO) thin films with various thicknesses were successfully developed on glass substrates by sol–gel dip-coating technique. We have investigated the influence...     

Spray Pyrolysis Synthesized and ZnO–NiO Nanostructured Thin Films Analysis with Their Nanocomposites for Waveguiding Applications

Semiconductors - In this work, we have prepared ZnO, NiO, and nanocomposites ZnO–NiO thin films elaborated by the chemical method of spray pyrolysis on glass substrates at a temperature of...