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Simulation Investigation on Particle Transmission Characteristics of Two Different Ion Barrier Films
The simulation calculation and analysis of electron transmittance and ion stopping power for ion barrier films (IBFs) of Al2O3 and SiO2 are performed by Monte Carlo methods. The interaction model between particles and solids are described. It is found that at the same conditions, the electron transmittance for SiO2 IBF is relatively higher than that of Al2O3 IBF, and the ion stopping power of SlOE IBF is relatively lower than that of Al2O3 by Monte Carlo simulations. It is also indicated that SiO2 is one of the ideal materials for fabricating IBFs. 相似文献
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宏孔硅阵列(MSA)在光子晶体、硅微通道板、MEMS 器件等领域应用前景广阔,引起人们广泛关注。为制备理想的MSA结构,本文开展了MSA光电化学方法腐蚀实验,重点研究了腐蚀电流密度对宏孔形貌的影响。给出了n型硅抛光片背面光照情况下在氢氟酸溶液中的电流-电压扫描曲线,讨论了临界电流密度JPS的意义和MSA稳定生长的基本电流密度条件。提出了一种间接地测量JPS与腐蚀时间关系的方法,并根据JPS的测量结果调整腐蚀电流,实现了理想的MSA等径生长,制备出孔深度为295m,长径比为98的MSA结构。 相似文献
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覆有防离子反馈膜的微通道板是第三代微光像增强器的核心部件之一。真空高温烘烤除气过程对防离子反馈膜粒子阻透特性会产生破坏性的影响。文中利用分子动力学方法模拟计算并得到Al2O3 薄膜的膜层密度随环境温度的变化规律。利用蒙特卡洛方法模拟计算了Al2O3 薄膜的电子透过率和离子阻挡率随入射粒子能量的变化曲线。得到Al2O3 薄膜的死电压在235 V 左右,同时得出防离子反馈膜离子阻挡率在入射离子能量降低后有所增加。在入射离子能量降低为250 eV 时,C、N、O 离子被Al2O3 薄膜阻挡的比率高达96%-99%。综合以上因素分析得出,随着外部温度的升高,电子透过率线性增加,而离子阻挡率非线性的下降。合理优化并调整高温烘烤时间和量值将有助于防离子反馈膜工作性能的改善。 相似文献
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The influence of voltage on photo-electrochemical etching(PEC) of macroporous silicon arrays(MSA) was researched.According to the theory of the space charge region,I-V scan curves and the reaction mechanism of the n-type silicon anodic oxidation in HF solution under different current densities,the pore morphology influenced by the working voltage were studied and analyzed in detail.The results show that increasing the etching voltage will lead to distortion of the pore morphology,decreasing etching volta... 相似文献
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Macroporous silicon arrays(MSA) have attracted much attention for their potential applications in photonic crystals,silicon microchannel plates,MEMS devices and so on.In order to fabricate perfect MSA structure,photo-electrochemical (PEC) etching of MSA and the influence of etching current on the pore morphology were studied in detail.The current-voltage curve of a polished n-type silicon wafer was presented in aqueous HF using back-side illumination.The critical current density J_(PS) was discussed and ... 相似文献
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