射频磁控溅射法在玻璃上制备紫外吸收和透明导电双功能薄膜

制备了SnO2:Sb(6%,摩尔分数)靶材和一系列不同摩尔比的CeO2-TiO2靶材;以所制靶材用射频磁控溅射法在普通玻璃基片上沉积了CeO2-TiO2单层和CeO2-TiO2/SnO2:Sb双层薄膜.用紫外-可见光谱、Raman光谱、X射线光电子能谱和X射线衍射对CeO2-TiO2薄膜进行了表征.结果表明:在CeO2/TiO2摩尔比为0.5:0.5和0.6:0.4时沉积得到的CeO2-TiO2薄膜为非晶态结构,并具有高的紫外吸收(平均值＞99%)和高的可见光透过率(平均值＞80%).在CeO2-TiO2薄膜表面存在Ce4 ,Ce3 和Ti4 .对CeO2-TiO2/SnO2:Sb双层薄膜,除具有高的紫外吸收(平均值＞99%)和可见光透过率(平均值＞75%)性能外,还具有导电性,方块电阻在80～90 Ω/口之间,电阻率在(3.2～3.6)×10-3Ω·cm之间.该双层镀膜玻璃具有截止紫外线和透明导电双功能.     

Improved visible transparency of SIO<Subscript>2</Subscript>/ZNO:AL /CEO<Subscript>2</Subscript>-TIO<Subscript>2</Subscript>/SIO<Subscript>2</Subscript> multilayer films with high UV absorption and infrared reflection rate

New visible transparent, UV absorption, and high infrared reflection properties have been realized by depositing multilayer SiO₂/ZnO: Al/CeO₂-TiO₂/SiO₂ films onto glass substrates at low temperature by radio frequency magnetron sputtering. Optimum thickness of SiO₂, ZnO: Al (ZAO) and CeO₂-TiO₂ (CTO) films were designed with the aid of thin film design software. The degree of antireflection can be controlled by adjusting the thickness and refractive index. The outer SiO₂ film can diminish the interference coloring and increase the transparency; the inner SiO₂ film improves the adhesion of the coating on the glass substrate and prevents Ca²⁺, Na⁺ in the glass substrate from entering the ZAO film. The average transmittance in the visible light range increases by nearly 18%-20%, as compared to double layer ZAO/CTO films. And the films display high infrared reflection rate of above 75% in the wavelength range of 10-25 μm and good UV absorption (> 98%) properties. These systems are easy to produce on a large scale at low cost and exhibit high mechanical and chemical durability. The triple functional films with high UV absorption, antireflective and high infrared reflection rate will adapt to application in flat panel display and architectural coating glass, automotive glass, with diminishing light pollution as well as decreasing eye fatigue and increasing comfort.     

Effect of heat-treatment on crystalline phase and UV absorption of 60CeO2-40TiO2 thin films by magnetron sputtering

60CeO2-40TiO2 thin films were deposited on soda-lime silicate glass substrates by R.F. magnetron sputtering. The effects of heat-treatment on the UV-absorption of the thin films were studied on the 60CeO2-40TiO2 thin film with the largest UV cut-off wavelength. The sample films with CeO2:TiO2=60:40 were heated at 773 K, 873 K, 973 K for 30 min. These films are characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), and X-ray photoelectron spectroscopy and spectrometer (XPS). XRD analysis proves that the addition of TiO2 to CeO2 changed the crystalline state of CeO2. But the UV absorption effect of CeO2-TiO2 films with CeO2 crystallite phase is inferior to that of the amorphous phase CeO2-TiO2 films. XPS analysis also indicates that the amorphous phase CeO2-TiO2 films have the most Ce3+ content in these films. Amorphous phase and crystalline phase of the CeO2-TiO2 films have different effects on UV absorption of the thin films.     

紫外光截止镀膜玻璃的射频磁控溅射法制备及表征

制备了摩尔比为1：1的TiO2和CeO2陶瓷靶材。采用射频磁控溅射法在O2和Ar比例为5：95的混合气体中制备了玻璃基TiO2-CeO2薄膜。溅射过程中，工作气压保持在1．8Pa不变，玻璃基片温度从室温（RT）～220℃之间变化。用x射线衍射（XRD）、X射线光电子能谱（XPS）、扫描电镜（SEM）、透射电镜（TEM）和紫外-可见光谱仪研究了薄膜的物相结构、表面组成、表面形貌和镀膜试样的紫外-可见光透过率。结果表明，薄膜表面结构平滑、致密，呈微小晶粒结构，薄膜中Ti和Ce仅以Ti^4＋和Ce^4＋的形式存在；随着基片温度升高，薄膜中的细小晶粒略有长大；TiO2-CeO2镀膜玻璃可以有效地截止紫外线。     

射频磁控溅射法在玻璃基片上沉积CeO2 薄膜的研究

二氧化铈具有高折射率、介电常数和紫外吸收率,因此它广泛地应用于各种光学和电子器件.本文采用射频磁控溅射法在玻璃基片上沉积CeO2薄膜.溅射过程中,首先制备纯二氧化铈靶材,然后在不同的功率上调节不同的基片温度进行溅射.采用光电子能谱、X射线衍射、拉曼光谱和扫描电镜等测试方法表征薄膜的特性.     

P型透明导电SnO2薄膜的研究进展

SnO2薄膜是一种应用广泛的宽禁带半导体材料.近几年来,随着对SnO2的光电性质及其在光电器件方面应用的开发研究,SnO2薄膜成为研究热点之一.制备掺杂的p型SnO2是形成同质p-n结以及实现其实际应用的重要途径.近年来,国内外在p型SnO2薄膜研究方面取得了较大的进展.目前报道的p型SnO2薄膜的最高电导率为5.952Ω-1cm-1.并且得到了具有较好非线性伏安特性的铟锡氧化物的透明p-n结.本文就其最新进展进行了综述.     

SnO2基导电陶瓷靶材的制备及应用性能表征

为了获得高质量的SnO2薄膜,我们需要制备高密度、高导电的优质SnO2靶材。这里以分析纯的SnO2、Sb2O5粉体为制备原料,采用冷等静压加上常压烧结方法制备高导电性Sb∶SnO2(ATO)陶瓷靶材。用X射线衍射(XRD)和扫描电子显微镜(SEM)分析靶材的化学成分和微观形貌并系统研究了不同的成型压力对靶材电学特性和致密度的影响。结果表明:成型压力的大小对于ATO靶材本身的致密度及电学特性都有很大的影响。成型压力为15MPa时,ATO靶材的电阻率最小,为0.38Ω.cm;SnO2靶材的收缩率达10.71%,靶材的致密度为95%;靶材可在射频磁控溅射仪下正常工作,并成功在玻璃基片上沉积性能良好的高红外反射透明导电SnO2薄膜。此制备过程操作方便,工艺简单,降低了靶材的成本,从而能够大大扩大透明导电薄膜的应用领域。     

磁控溅射法制备CeO2-TiO2紫外吸收薄膜

采用射频磁控溅射在玻璃基片上沉积具有紫外吸收CeO2-TiO2混和薄膜。通过制备一系列不同物质的量浓度比的，n（CeO2）：n（TiO2）靶材（1．0：0，0．90：0．10，0．80：020，0．70：0．30，0．60：0．40，0．50：0．50，0．40：0．60，0．30：0．70，0．20：0．80，0．10：0．90，0：1．0），研究其紫外吸收性能最佳的物质的量浓度比：TiO2加入CeO2后，改变CeO2的结晶状态并提高UV吸收．采用Raman和XPS表征薄膜的特性，物质的量浓度比值在n（CeO2）：n（TiO2）=0．5：0．5，0．6：0．4时，薄膜为非晶态，并具有高的紫外吸收（98％）和可见光透过率（70％-80％）；XDS分析表明薄膜存在（F^4＋，Ce^3＋和Ti^4＋。