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激光熔覆Al2O3+TiO2复合陶瓷涂层的微观结构 总被引:12,自引:0,他引:12
研究了45#钢表面Al2O3+TiO2复合陶瓷激光熔覆层的微观组织和相结构、Al2O3+TiO2复合陶瓷激光熔覆涂层由α-Al2O3,TiO2,γ-TiO2,γ-Al2O3及Al2TiO5相组成,消除了等离子喷涂层的层状组织特征,形成了大致方向的柱状晶,晶内为溶入了Ti及少量底层元素的α-Al2O3;晶界为由TiO2和Al2O3形成的Al2TiO5相,溶有少量的Cr,Fe,Y取代了Al2TiO5 相似文献
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溶胶—凝胶法制备Fe2O3—Mn2O3—SiO2膜 总被引:1,自引:0,他引:1
用溶胶-凝胶法在浮法玻璃上制备了Fe2O3-Mn2O3-SiO2膜。对膜层的形成特性进行了观察。得出了制备良好膜层的工艺参数。对薄膜的微观结构和光谱特性进行了测定。讨论了薄膜中铁与锰的价态和配位状态。 相似文献
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在SiO2质量分散不小于10%的酸性硅溶胶(粒径分别为13.7nm,26.8nm)中,加入钛酸正丁酯异丙醇溶液,发生水解、聚合,生成水合TiO2;紫外可见光谱和红外光谱及透射电镜观察证实了水合TiO2是进一步包覆在硅溶胶胶粒表面,形成了TiO2/SiO2质量比不小于10%的TiO2-SiO2溶胶。大粒径硅溶胶和钛酸正丁酯异丙醇溶液分2次或3次加入,有利于TiO2-SiO2溶胶的生成。包覆在硅溶胶胶 相似文献
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TiO2多孔纳米薄膜的溶胶——凝胶法制备和光催化特性研究 总被引:2,自引:0,他引:2
锐钛矿型TiO2多孔纳米薄膜可以从含聚乙二醇的钛醇盐溶前驱体中通过溶胶-凝胶法制备。涂层的形貌,如孔的大小和孔的分布可以通过聚乙二醇的加入量来控制。当聚乙二醇的加入量为0 ̄2.0g时,孔径大小在0 ̄400nm范围内变化。可见光透过光谱分析表明:随着TiO2薄膜中气孔孔径增大,光的散射增强,透过率减小,该TiO2镀膜玻璃对于紫外线具有吸收作用,有机磷农药敌敌畏水溶液在紫外灯照射和TiO2多孔纳米薄膜 相似文献
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通过在溶胶-凝胶溶液中掺入聚乙烯乙二醇有机聚合物,利用普通釉面砖做衬底,制备了多孔TiO2薄膜,扫描电镜观察表明,一定的热处理条件下,有机聚合物可以显著改变TiO2薄膜的孔结构。光催化结果显示,适当的孔结构可以明显提高TiO2薄膜对有机磷农药的光催化效率。 相似文献
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固体超强酸TiO_2/SO_4~(2-)催化合成富马酸二甲酯 总被引:21,自引:0,他引:21
研究了以TiO2/SO2-4固体超强酸催化富马酸与甲醇合成富马酸二甲酯(DMF)的反应,探讨了催化剂制备条件,原料配比,反应时间,催化剂用量等工艺参数对DMF收率的影响。在适宜的工艺条件下DMF收率达到90%,催化剂的重复使用实验表明TiO2/SO2-4是DMF合成的一个较适宜的催化剂 相似文献
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A modified envelope method, which includes the consideration of the light intensity loss from the back surface of the substrate, was developed and shown to be a simple and convenient tool for obtaining the optical properties and the thickness of the film by using the transmission spectra alone in the medium and weak absorption regions. In the near-optical band gap region, both the transmission and the reflection spectra were used to calculate the optical constants of the films. This technique was applied to the thin films of PZT solid solutions across the entire composition range. The film thickness derived from the envelope method was cross-checked by a computer simulation method and was found to have an accuracy better than 2%. In addition, the refractive indices were fitted to a simple Sellmeier-type equation for determining the dispersion constants for PZT films. The valid wavelength range of these dispersion relations was from 350 to 2000 nm. The refractive index of the PZT films decreased linearly with increasing zirconium content. On the other hand, the optical band gap energy of the PZT films increased with increasing zirconium content. 相似文献
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The fabrication and characterization of 1–3 μm polystyrene thin film integrated optical (IO) waveguides is presented. The polymer films were spun-cast onto quartz and glass microscope slides, yielding waveguides of varying quality. The majority of defects in the polymer films appeared to be introduced during the curing process. Laser light (488 nm) was coupled into the polymer films using the prism coupling technique. The collected Raman emission was used to characterize physical and light guiding properties of acceptable polymer films. The Raman intensity spectra collected as a function of the coupling angle supplied data for the calculation of polymer film thickness and refractive index as well as providing general measure of waveguide suitability. The intensity loss due to scatter of several waveguides was also determined to rigorously evaluate waveguide quality. 相似文献
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本文以钛酸丁酯[Ti(OC4H9)4]、去离子水、盐酸和聚乙二醇(PEG)1000为原料,采用溶胶-凝胶法和旋转涂膜工艺,在玻璃基底上制备纳米TiO2薄膜和TiO2多孔薄膜.利用原子力显微镜(AFM)、X射线衍射仪(XRD)和紫外-可见光谱仪(UV-Vis)对薄膜进行分析表征.结果表明,实验制备的TiO2粉体为锐钛矿晶型,纳米TiO2薄膜的平均粗糙度为17.2nm,TiO2多孔薄膜平均粗糙度为1.55 nm.TiO2多孔薄膜有较高的透射性和光催化活性,可直接用于光催化降解有机物等领域. 相似文献
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《Ceramics International》2016,42(9):11136-11149
Highly oriented Zn doped TiO2 thin films (0, 2, 4, 6 and 8 at%) were deposited by spray pyrolysis technique. X-ray diffraction analysis showed a strong orientation along (101) direction for 6 at% Zn with polycrystalline tetragonal anatase phase. Scanning electron microscopy observations revealed uniform distribution of spherical-shaped grains, whereas columnar arrangement of tetragonal-shaped grains with porous nature was revealed from atomic force microscopy. Transmittance spectra indicated a decrease in the energy band gap with increasing doping concentration; i.e. 3.55 up to 3.21 eV, attributed to grain refinement to the nanoscale regime. The optical constants such as refractive index and extinction coefficient as a function of wavelength, were determined; the low extinction coefficient values confirmed the good quality of the thin films. Photoluminescence spectra showed strong emissions at 423 and 437 nm with a weak emission at 505 nm, which confirmed the lesser defect density in 6 at% Zn film. The electrical properties studied by Hall Effect measurements revealed that the 6 at% Zn led to an increase in the carrier concentration, as well as an increase in the mobility with a least resistivity. The efficiency of dye sensitized solar cells, assembled by using natural dye extracted from Hibiscus Surattensis as sensitizer and Zn-doped TiO2 nanocrystalline thin films as a photoelectrode, was found to be around 1.22%. 相似文献
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The changes in the optical characteristics of lead selenide thin films with different degrees of oxidation are investigated using ellipsometry. It is found that, as the degree of oxidation increases, the refractive index, the optical thickness, and the extinction coefficient of lead selenide films decrease monotonically, whereas the effective film thickness increases. The composition of the films can be determined from the measured refractive index at a wavelength λ = 632.8 nm with the use of the dependences calculated on the basis of the single-layer model. 相似文献
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Sánchez P Lorenzo O Menéndez A Menéndez JL Gomez D Pereiro R Fernández B 《International journal of molecular sciences》2011,12(4):2200-2215
The determination of optical parameters, such as absorption and extinction coefficients, refractive index and the bandgap energy, is crucial to understand the behavior and final efficiency of thin film solar cells based on hydrogenated amorphous silicon (a-Si:H). The influence of small variations of the gas flow rates used for the preparation of the p-a-SiC:H layer on the bandgap energy, as well as on the dopant elements concentration, thickness and conductivity of the p-layer, is investigated in this work using several complementary techniques. UV-NIR spectrophotometry and ellipsometry were used for the determination of bandgap energies of four p-a-SiC:H thin films, prepared by using different B(2)H(6) and SiH(4) fluxes (B(2)H(6) from 12 sccm to 20 sccm and SiH(4) from 6 sccm to 10 sccm). Moreover, radiofrequency glow discharge optical emission spectrometry technique was used for depth profiling characterization of p-a-SiC:H thin films and valuable information about dopant elements concentration and distribution throughout the coating was found. Finally, a direct relationship between the conductivity of p-a-SiC:H thin films and the dopant elements concentration, particularly boron and carbon, was observed for the four selected samples. 相似文献