共查询到18条相似文献,搜索用时 85 毫秒
1.
焊点的质量与可靠性很大程度决定了电子产品的质量。随着环境保护意识的增强,无铅焊料、无铅焊点成为了近年来的研究热点问题。无铅焊点由于焊料的差异和焊接工艺参数的调整,必不可少的会给焊点可靠性带来新的影响。本文从设计、材料、及工艺角度分析了影响无铅焊点可靠性的因素,对无铅焊点可靠性测试方法做了介绍。 相似文献
2.
曹浩龙 《电子产品可靠性与环境试验》2017,35(Z1)
焊点的质量和可靠性很大程度上决定了电子产品的质量.随着环境保护意识的增强,无铅焊料、无铅焊点成为了近年来的研究热点.无铅焊点由于焊料的差异和焊接工艺参数的调整,其可靠性势必会受到新的影响.从设计、材料和工艺角度分析了影响无铅焊点的可靠性的因素,最后分析了焊点的常见的可靠性问题产生的原因,并给出了相应的解决办法. 相似文献
3.
4.
杨宗亮 《现代表面贴装资讯》2006,5(3):65-68
电子产品的质量很大程度上取决于焊点的质量与可靠性。在无铅化进程中,由于无铅焊点焊料的不同和焊接工艺参数的调整,必然会给焊点可靠性带来许多新的影响。本文进行了焊点的失效分析,并从PCB和模板设计、表面组装材料、及工艺角度分析了影响无铅焊点可靠性的因素,最后分析了焊点的常见的可靠性问题的产生原因及解决办法等。 相似文献
5.
6.
7.
8.
9.
Harald Fockenberger Terence Ho Gerhard Pfennich Dongkai Shangguan Leow Ching Tat 《中国电子商情》2005,(6):40-42
本文考察了使用无铅焊料的焊膏通孔工艺(PIH)的板设计和工艺优化结果,集中关注几种设计和工艺变量与PIH焊点质量之间的关系,并对若干方面进行了重点观察,包括填充孔特性、焊点量及可靠性。[编者按] 相似文献
10.
11.
12.
有限元数值模拟方法因其可以有效研究IC封装中无铅焊点的可靠性,被国内外专家学者所青睐,使得无铅焊点可靠性数值模拟成为IC封装领域的重要研究课题。综述了有限元法在球珊阵列封装(BGA)、方型扁平式封装(QFP)、陶瓷柱栅阵列封装(CCGA)3种电子器件无铅焊点可靠性方面的研究成果。浅析该领域国内外的研究现状,探究有限元方法在无铅焊点可靠性研究方面的不足及解决办法,展望无铅焊点可靠性有限元模拟的未来发展趋势,为IC封装领域无铅焊点可靠性的研究提供理论支撑。 相似文献
13.
在从有铅向无铅转换过程中,电子产品制造商不可避免会碰到同一组装过程中有铅和无铅的混合情况.因此,有必要对形成的混合焊点进行可靠性分析.对混合焊点的失效形式和混合焊点的失效机理进行了分析,并进一步介绍了影响这类焊点可靠性的因素. 相似文献
14.
15.
阐述了冷却速率对无铅再流焊质量影响的研究现状,总结了冷速对无铅钎料以及SMT 焊点可靠性的影响。研究现状表明快速冷却有助于减少焊接缺陷,提高焊点可靠性。 相似文献
16.
J. Liang S. Downes N. Dariavach D. Shangguan S. M. Heinrich 《Journal of Electronic Materials》2004,33(12):1507-1515
Reliability of lead-free solder joints has been a hot topic widely debated in the electronic industry. Most published data
indicate that a change to lead-free soldering has the potential benefit of more reliable solder joints than the current Sn-Pb
eutectic solder joints. However, in reality many mechanical, metallurgical, thermal, and environmental factors affect the
service reliability of solder joints. This paper tries to shed some light on the effects of mechanical loading and thermal
conditions on solder joint reliability. These conditions are determined not only by external environments but also by the
solder alloy itself and the joint geometry. Analyses with first principles are carried out on solder joints of both areal
array and peripheral packages. Effects on fatigue life of solder joint geometry, thermal and mechanical characteristics of
components and substrate materials, and application conditions are discussed. The analysis helps explain why lead-free solder
joints may not be more reliable in certain application conditions than the current Sn-Pb eutectic solder joints. 相似文献
17.
18.
As the electronics industry is moving towards lead-free manufacturing processes, more effort has been put into the reliability study of lead-free solder materials. Various tin–silver–copper-based solders have become widely accepted alternatives for tin–lead solders. In this study, we have tested three different SnAgCu solder compositions. The first consisted of a hypoeutectic 96.5Sn/3.0Ag/0.5Cu solder, the second of a eutectic 95.5Sn/3.8Ag/0.7Cu solder, and the third of a hypereutectic 95.5Sn/4.0Ag/0.5Cu solder. A eutectic SnPb solder was used as a reference. The test boards were temperature-cycled (−40 to +125 °C) until all samples failed. The results of the temperature cycling test were analyzed, and cross-section samples were made of the failed joints. Scanning electron and optical microscopy were employed to analyze the fracture behavior and microstructures of the solder joints. The reliability of lead-free solders and the effect of microstructures on joint reliability are discussed. 相似文献