首页 | 官方网站   微博 | 高级检索  
相似文献
 共查询到20条相似文献,搜索用时 328 毫秒
1.
宋淑芳  赵建建  谭振  孙浩 《激光与红外》2013,43(11):1252-1255
利用传输线方法(TLM)重点研究了低掺杂浓度(2×1017at/cm3)n型GaAs接触层的欧姆接触,通过改变AuGe/Ni的厚度比、合金化的温度和时间等参数,获得了最优化的制备条件:AuGe/Ni/Au的厚度为50nm/25nm/100 nm,退火温度为400 ℃,退火时间为120s时,欧姆接触电阻率为最低3.52×10-4Ωcm-2,这一结果为量子阱结构太赫兹探测器芯片的制备奠定了基础。  相似文献   

2.
熔体外延法生长的截止波长12 μm的InAs0.04Sb0.96的电学性质   总被引:1,自引:1,他引:0  
用Van der Pauw法研究了熔体外延(ME)法生长的截止波长为12 μm的InAs0.04Sb0.96单晶电学性质,测量了其电学性质随温度的变化,结果为300 K时,n=2.3×1016 cm-3,μ=6×104 cm2/Vs;200 K时,n=1×1015 cm-3,μ=1×105 cm2/Vs.分析了石墨舟和石英舟中生长的外延材料不同的电学特性及其散射机理.结果表明,电离杂质散射控制所有样品在低温时的电子输运过程,而高温时材料的电子迁移率主要由极性光学声子的散射过程决定;C的沾污对石墨舟中生长的InAs0.04Sb0.96单晶在200 K以下的电子迁移率有明显的影响.  相似文献   

3.
在高纯半绝缘4H-SiC偏8°衬底上同质外延生长了高质量的外延层,利用X射线双晶衍射、原子力显微镜(AFM)、汞探针C-V以及霍尔效应等测试方法,对样品的结晶质量、表面粗糙度、掺杂浓度以及电子迁移率进行了分析测试,证实外延层的结晶质量相对于衬底有着很大的改善。在同质外延7.5μm的外延层后,其半高宽从衬底的30.55arcsec减小到27.85arcsec;外延层表面10μm×10μm的粗糙度(RMS)为0.271nm;室温下,样品的掺杂浓度为1×1015cm-3时,霍尔迁移率高达987cm2/(V.s);浓度为1.5×1016cm-3时,霍尔迁移率为821cm2/(V.s)。77K时,霍耳迁移率分别为1.82×104cm2/(V.s)和1.29×104cm2/(V.s)。掺杂浓度的汞探针C-V测试结果与霍尔效应的实验数据一致。  相似文献   

4.
采用分子束外延设备 (MBE) , 外延生长了InAs/AlSb二维电子气结构样品.样品制备过程中, 通过优化AlGaSb缓冲层厚度和InAs/AlSb界面厚度、改变AlSb隔离层厚度, 分别对比了材料二维电子气特性的变化, 并在隔离层厚度为5nm时, 获得了室温电子迁移率为20500cm2/V·s, 面电荷密度为2.0×1012/cm2的InAs/AlSb二维电子气结构样品, 为InAs/AlSb高电子迁移率晶体管的研究和制备提供了参考依据.  相似文献   

5.
刘雪强  毕卫红  张彤 《半导体学报》2010,31(12):124007-3
利用甲基丙烯酸甲酯-甲基丙烯酸环氧丙脂为栅绝缘层制备了酞箐铜有机薄膜晶体管,在电压为10V时器件具有较好的性能,栅绝缘层的漏电流密度低至2×10-8A/cm2 。测量其电容特性,该绝缘薄膜的介电常数介于3.9-5.0 。通过对绝缘层的减薄,阈值电压由 -3.5V 升至-2.0V,该酞箐铜有机薄膜晶体管可以在低电压下工作,其场效应迁移率为1.2×10-3 cm2/Vs 。  相似文献   

6.
以杂化白光结构ITO/HAT-CN(10 nm)/TAPC(30 nm)/TCTA(10 nm)/TCTA:PO -01(10 nm ,4%)/MADN:DSA-ph(10 nm,5%)/BPhen(40 n m)/Liq(1nm)/Al(100 nm)为基础,分别用CBP 、SO和SO:TCTA作为间隔层,调节厚度及掺杂比例,研究不同间隔层对杂化白光器件性能的 影响。实验结果表明,SO作间隔层可以有效提高电子与空穴在黄光层的复合,增大器件电子 传输能力而使器件偏向白光,提高器件效率,且由于SO高的三线态能级,可以有效控制激子 复合区域的移动,器件色稳定性也得到提高。再将TCTA与SO掺杂作为间隔层,增强空穴传输 ,调控空穴和电子的传输与平衡,进一步提升器件性能,当SO∶TCTA掺杂比为9∶1时,有最大电流效 率31.60 cd/A,最大功率效率30.16 lm/W,电 流密度为10 mA/cm2时,CIE色坐标为(0.39 ,0.43),从0.1 mA/cm2-80 mA/cm2电流密度变化下色坐标变化(Δx,Δy)仅为(0.02),色坐标漂移小,色稳定性好。  相似文献   

7.
梯度掺杂生长绒面结构ZnO:B-TCO薄膜及其特性研究   总被引:2,自引:2,他引:0  
采用新的金属有机化学气相淀积(MOCVD)-ZnO镀膜工艺技术-梯度掺杂技术生长绒面结构。研究ZnO:B-TCO薄膜。结果表明,梯度掺杂技术可有效增加薄膜晶粒尺寸和提高光散射作用。并且,梯度掺杂技术有效地提高了薄膜在近红外区域的光学透过率,有利于应用于宽谱域薄膜太阳电池。生长获得的MOCVD-ZnO薄膜,其薄膜电子迁移率为24 cm2/V,电阻率为2.17×10-3Ω.cm,载流子浓度为1.20×1020cm-3,且在小于1 000 nm波长范围内的平均透过率大于85%。  相似文献   

8.
研究了GaN/AlGaN异质结背照式p-i-n结构可见盲紫外探测器的制备与性能。GaN/AlGaN外延材料采用金属有机化学气相沉积(MOCVD)方法生长,衬底为双面抛光的蓝宝石,缓冲层为AlN,n型层采用厚度为0.8 μm的Si掺杂Al0.3Ga0.7N形成窗口层,i型层为0.18 μm的非故意掺杂的GaN,p型层为0.15 μm的Mg掺杂GaN。采用Cl2、Ar和BCl3感应耦合等离子体刻蚀定义台面,光敏面面积为1.96×10-3 cm2。可见盲紫外探测器展示了窄的紫外响应波段,响应区域为310~365 nm,在360 nm处响应率最大,为0.21 A/W,在考虑表面反射时,内量子效率达到82%;优质因子R0A为2.00×108 Ω·cm2,对应的探测率D*=2.31×1013 cm·Hz1/2·W-1;且零偏压下的暗电流为5.20×10-13 A。  相似文献   

9.
通过对MBE工艺中影响GaAs和AlGaAs材料质量的生长关键工艺实验研究,优化了MBE生长AlxGa1-xAs/GaAs调制掺杂结构工艺。用GEN-ⅡMBE设备生长AlxGa1-xAs/GaAs调制掺杂结构材料,得到了高质量的AlxGa1-xAs/GaAs调制掺杂结构材料。用范德堡法研究材料特性,得到材料参数的典型值:二维电子气浓度在室温时为5.6×1011cm-2,电子迁移率为6000cm2/V·s;在77K低温时浓度达3.5×1011cm-2,电子迁移率为1.43×105cm2/V·s。用C-V法测量其浓度分布表明,分布曲线较陡。典型的器件应用结果为:单管室温直流跨导达280mS/mm,在12GHz时均有8dB以上的增益。  相似文献   

10.
报道了第一支0.25um栅长n型Si/SiGe调制掺杂场效应晶体管的制作和器件特性结果,器件用于超高真空/化学汽相淀积(UHV/CVD)制作的器件,在300K(77K)下,应变Si沟道的迁移率和电子薄层载流子的深度为1500(9500)cm2/V.s和2.5×10^12(1.5*10^10)cm^-2,器件电流和跨导分别为325mA/mm和600mS/mm,这些值远优于Si MESFET,它们可与所获得的GaAs/Al-GaAs调制掺杂晶体管的结果相媲美。  相似文献   

11.
12.
13.
A comprehensive compilation of various thermodynamic data required for a complete analysis of copper matte converting reactions is presented. The data comprise estimated free energies of formation for such gases as SeO, SeS, TeO, TeS, BiO, BiS, SbO, SbS, AsO, and AsS, as well as activity coefficients in dilute copper alloys and vapor pressures of various elements and compounds. The volatilization of minor elements in steady-state reactors comprising gas and several condensed phases is mathematically formulated, and a parameter which governs the volatilization in such reactors is defined and named volatilization constant. The vapor pressures of various volatile species are calculated thermodynamically for the Noranda Process reactor by assuming equilibrium conditions. The volatilization constants of various minor elements are expressed explicitly as functions of oxygen and sulfur activities. Formerly Associate Professor, Department of Metallurgical Engineering, University of Utah, Salt Lake City, UT  相似文献   

14.
We report first-principles density functional calculations of the polarizations, piezoelectric stress constants, and elastic constants for the II-VI oxides MgO, ZnO, and CdO in the wurtzite structure. Using our pseudopotential self-interaction corrected implementation of density functional theory, we obtain polarization values of −0.060, −0.022, and −0.10 C/m2, and piezoelectric constants, e33 (e31) of 1.64 (−0.58), 1.34 (−0.57), and 1.67 (−0.48) C/m2 for structurally relaxed MgO (with its in-plane lattice parameter fixed to that calculated for ZnO), ZnO, and CdO, respectively. The large polarization gradients between the end-point compounds in the MgO-ZnO-CdO system augur well for the production of large internal fields in ZnO-based polarization field effect transistors.  相似文献   

15.
The general formulae are derived which allow calculation of the weight of each molten phase (copper, matte, slag) in the Noranda Process reactor as a function of matte grade and suspension indices. These expressions and the volatilization constants are then inserted in the steady-state volatilization equation (derived in the Part III) to calculate the overall distribution of minor elements and their concentrations in all the reactor products(i.e., copper, matte, slag, and offgas) in the Noranda Process. The overall distribution of ten minor elements can be predicted for any set of controllable process parameters such as feed composition, temperature, degree of oxygen enrichment, slag composition (or magnetite activity), and matte grade. The computer predictions are in good agreement with the commercially observed values with the exception of selenium. Formerly Associate Professor, Department of Metallurgical Engineering, University of Utah, Salt Lake City, UT  相似文献   

16.
The specific features of the kinetics of local probe oxidation of ultrathin V, Nb, Ta, Ti, TiN, and W metal films are studied. It is established that the kinetics of the oxidation process depends on such properties of the material to be oxidized as the resistivity, the presence of a natural surface oxide film and its thickness, the relationship between the densities of the metal and oxide, and the electrochemical constant of the oxidation process. For the material that provides a high efficiency of formation of local insulator nanoregions, vanadium is chosen, since this metal exhibits the maximum rate of anodic probe oxidation.  相似文献   

17.
通过Ulmann缩合反应合成了在有机电致发光(OEL)显示器件上有使用前景的四苯基联苯二胺类空穴传输材料N,N′-二苯基-N,N′-双(3-甲基苯基)-[1,1′-联苯][-4,4′-二胺,N,N′-二苯基-,N′-(4-甲基苯基)-[1,1-′-联苯]-4,4′-二胺和N,N,N′,N′-四苯基-[-1,1′-联苯]-4,4′-二胺,对产品从混合物中分离的方法作了改进。其产率及含量分别为85%,97.6%,95%,98.5%,70%,98.1%,。以3种化合物均用红外光谱进行了表征。′  相似文献   

18.
The authors show that a public key cryptosystem due to Yoo, Hong, Lee, Lim, Yi and Sung is insecure, as it is susceptible to an attack based on the LLL algorithm  相似文献   

19.
20.
In signal processing, four functions of one variable are commonly used. They are the signal in time, the spectrum, the auto-correlation function of the signal, and the auto-correlation function of the spectrum. The variables of these functions are denoted, respectively, as time, frequency, lag, and Doppler. In time-frequency analysis, these functions of one variable are extended to quadratic functions of two variables. In this paper, we investigate a method for creating quartic functions of three of these variables as well as a quartic function of all four variables. These quartic functions provide a meaningful representation of the signal that goes beyond the well-known quadratic functions. The quartic functions are applied to the design of signal-adaptive kernels for the Cohen class and shown to provide improvements over previous methods  相似文献   

设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司    京ICP备09084417号-23

京公网安备 11010802026262号