一种精度可编程的低功耗SAR ADC

设计了一种精度可编程的低功耗逐次逼近型模数转换器(SAR ADC)。采用电阻电容混合结构的数模转换(DAC)阵列,通过对低位电阻阵列的编程控制,实现了12,0,8位的转换精度,对应不同的精度,电路支持1,5,10 MS/s的转换速率。采用一种改进的单调开关控制逻辑以降低功耗和面积,同时避免了原有单调开关逻辑存在信号馈通的缺点。根据不同的精度要求,对比较器所用预放大器的个数进行编程控制,进一步提高了ADC的功耗效率。电路基于0.18 μm的CMOS工艺设计,在1.8 V电源电压下,精度从高到低对应的功耗分别为0.56,0.48,0.42 mW;SNDR分别为73.2,61.3,48.2 dB;SFDR分别为96.3,84.6,62.8 dB。芯片内核面积仅为(0.6×0.9)mm²,适用于通用片上系统(SoC)。     

衬底电压自举结构的10位120 MS/s SAR ADC

基于采样管衬底电压自举结构,提出了一种高线性低阻抗采样开关技术。在保证采样开关等效输入阻抗较小的同时,实现了采样开关的源/漏极与衬底之间的寄生电容不随输入信号幅度的变化而变化;减小了动态比较器输入管的等效导通电阻,提高了动态比较器输入管的跨导,解决了动态比较器的速度与噪声折中的难题。基于65 nm CMOS工艺,设计了一种10位120 MS/s SAR ADC。在1 V电源电压下,功耗为1.2 mW,信号噪声失真比SNDR> 55 dB,无杂散动态范围SFDR> 68 dB,在奈奎斯特采样情况下,优值(FoM)为22 fJ/(conv·step)。     

一种高速低功耗10位逐次逼近模数转换器设计

通过分析并优化逐次逼近模数转换器(SAR ADC)的工作时序,设计并实现了一种高速、低功耗、具有误差补偿的10位100 MS/s A/D转换器。该芯片采用TSMC 0.13 μm CMOS工艺进行设计。后仿真结果表明,在1.2 V电源电压、20.3125 MHz输入信号频率、100 MHz采样频率下,模数转换器的无杂散动态范围(SFDR)为68.1 dB,有效位数(ENOB)达到9.41位,整体功耗为0.865 mW,FoM值为15 fJ/conv。芯片核心电路面积为(0.02×0.02) mm²。     

一种基于VCM开关切换的12位20 MS/s SAR ADC

设计了一种12位、采样率为20 MS/s的逐次逼近型模数转换器(SAR ADC)。整体电路为全差分结构,采用了一种基于VCM开关切换的分段式电容阵列。同时,比较器结合了前置运放和动态锁存器,与异步时序相配合,实现了SAR ADC高速工作。此外,采样电路采用栅压自举技术,提高采样的线性度。芯片基于TSMC 180 nm 1P5M CMOS工艺设计。仿真结果表明,当采样率为20 MS/s时,SAR ADC有效位数为11.94 bit,无杂散动态范围为86.53 dBc,信噪比为73.66 dB。     

一种带二进制校正的10位100 MS/s SAR ADC

基于SMIC 65 nm CMOS工艺,设计了一种带二进制校正的10位100 MS/s逐次逼近型模数转换器(SAR ADC),主要由自举开关、低噪声动态比较器、电容型数模转换器(C-DAC)、异步SAR逻辑以及数字纠错电路组成。电容型数模转换器采用带2位补偿电容的拆分单调电容转换方案,通过增加2位补偿电容,克服了电容型数模转换器在短时间内建立不稳定和动态比较器失调电压大的问题,使SAR ADC的性能更加稳定。数字纠错电路将每次转换输出的12位冗余码转换成10位的二进制码。使用Spectre进行前仿真验证,使用Virtuoso进行版图设计,后仿真结果表明,当电源电压为1.2 V、采样率为100 MS/s、输入信号为49.903 MHz时,该ADC的SNDR达到58.1 dB,而功耗仅为1.3 mW。     

一种10位50MS/s两级逐次逼近流水线混合型A/D转换器

本文在0.18μm CMOS工艺下,实现了一款10位50MS/s两级逐次逼近流水线混合型模数转换器（pipeline SAR ADC）。其由基于逐次逼近的增益模数单元和逐次逼近ADC组成,并采用1位冗余位放宽了子模数转换器的比较误差。通过采用逐次逼近结构,增益减半MDAC技术,动态比较器及动态逐次逼近控制逻辑,降低了模数转换器的功耗和面积。流片测试结果表明,在1.8V电源电压,50MS/s采样速率下,信噪失真比(SFDR)和功耗分别为56.04dB和5mV。     

采用采样开关线性增强技术的12位100 MS/s SAR ADC

提出了一种采用采样开关线性增强技术的12位100 Ms /s SAR模数转换器(ADC)。首先采用了一种基片浮动技术,随着输入信号的变化,采样开关的寄生电容变化减小,总寄生电容降低。其次采用了一种采样开关基片升压技术,降低了采样开关的导通阻抗。最后,采用40 nm CMOS工艺制作了一种12位100 MS/s SAR ADC。测试结果表明,在电源电压1 V下,该ADC的SNDR为64.9 dB,SFDR为83.2 dB,消耗功率为2 mW。该ADC的核心电路尺寸为0.14 μm×0.14 μm。FoM值为13.8 fJ/(conv·step) @Nyquist频率。     

一种12位4 MS/s异步SAR ADC

设计了一种12位4 MS/s的异步逐次逼近型模数转换器(SAR ADC)。采用一种既能节省开关动态功耗又能减小电容面积的开关切换策略,与传统结构相比,开关动态切换功耗节省了95%,电容总面积减小了75%。为了避免使用高频时钟,采用了异步控制逻辑,采样开关采用栅压自举开关以便提高ADC的线性度,动态锁存比较器的使用减小了静态功耗,片上集成了电压参考电路和相关驱动电路。基于SMIC 0.18 μm CMOS工艺,在1.8 V电源电压和4 MS/s转换速率条件下,经后仿真得到ADC的信号噪声失真比SNDR为70.2 dB,功耗仅为0.9 mW,品质因素FOM为109 fJ/conversion-step。     

一种14位100 MS/s的流水线模数转换器

设计了一种14位100 MS/s的流水线模数转换器(ADC)。采样保持电路与第1级2.5位乘法数模转换器(MDAC1)共享运放,降低了功耗。提出了一种改进的跨导可变双输入开关运放,以满足采样保持和MDAC1对运放的不同要求,并消除记忆效应和级间串扰。ADC后级采用5级1.5位运放共享结构。基于0.18 μm CMOS工艺,ADC核心面积为1.4 mm²。后仿真结果表明,在1.8 V电源电压下,当采样速率为100 MS/s、输入信号频率为46 MHz时,ADC的信噪比(SNR)为82.6 dB,信噪失真比(SNDR)为78.7 dB,无杂散动态范围(SFDR)为84.1 dB,总谐波失真(THD)为-81.0 dB,有效位数(ENOB)达12.78位。ADC整体功耗为116 mW。     

一种低功耗8位300MS/s异步SAR ADC

设计了一种单循环8位300 MS/s低功耗异步SAR ADC。设计基于内部时钟电路,实现异步算法,使得ADC整体速度得到提升。采用分裂式顶端采样DAC阵列、高速比较器、自举开关以及低功耗动态逻辑单元,使得电路在高速转换下可以保持低功耗。基于SMIC 65 nm工艺实现,在1.2V电源电压以及300 MS/s的采样频率下,总功耗为0.84 m W。ADC的信噪失真比(SNDR)达到47.9 d B,有效位数(ENOB)达到7.6位,品质因数为16.6 f J/Conv。     

A 10-bit 110 MHz SAR ADC with asynchronous trimming in 65-nm CMOS

A 10-bit 110 MHz SAR ADC with asynchronous trimming is presented. In this paper, a high linearity sampling switch is used to produce a constant parasitical barrier capacitance which would not change with the range of input signals. As a result, the linearity of the SAR ADC will increase with high linearity sampled signals. Farther more, a high-speed and low-power dynamic comparator is proposed which would reduce the comparison time and save power consumption at the same time compared to existing technology. Additionally, the proposed comparator provides a better performance with the decreasing of power supply. Moreover, a highspeed successive approximation register is exhibited to speed up the conversion time and will reduce about 50% register delay. Lastly, an asynchronous trimming method is provided to make the capacitive-DAC settle up completely instead of using the redundant cycle which would prolong the whole conversion period. This SAR ADC is implemented in 65-nm CMOS technology the core occupies an active area of only 0.025 mm² and consumes 1.8 mW. The SAR ADC achieves SFDR > 68 dB and SNDR > 57 dB, resulting in the FOM of 28 fJ/conversion-step. From the test results, the presented SAR ADC provides a better FOM compared to previous research and is suitable for a kind of ADC IP in the design SOC.     

A low power 12-bit 200-kS/s SAR ADC with a differential time domain comparator

A low power 12-bit 200-kS/s SAR ADC is proposed.This features a differential time domain comparator whose offset is cancelled by using a charge pump and a phase frequency detector instead of the preamplifiers usually needed in a high resolution comparator.The proposed ADC is manufactured in 0.18-μm CMOS technology and the measured SNR and SNDR are 62.5 dB and 59.3 dB,respectively,with a power consumption of 72μW at a 200-kS/s sampling rate.The device operates with a 1.8-V power supply and achieves a FOM of 477 fJ/conversion-step.     

A 0.6 V 100 KS/s 8–10 b resolution configurable SAR ADC in 0.18 μm CMOS

A resolution configurable ultra-low power SAR ADC in 0.18 μm CMOS process is presented. The proposed ADC has maximum sampling rate of 100 KS/s with configurable resolution from 8 to 10 b and operates at a supply of 0.6 V. Two-stage bootstrapped switch and voltage boosting techniques are introduced to improve the performance of the ADC at low voltage. To reduce the power consumption of the analog components of the ADC, monotonic capacitor switching procedure and fully dynamic comparator are utilized. The implementation of dynamic logic further reduces the power of the digital circuits. Post-layout simulation results show that the proposed SAR ADC consumes 521 nW and achieves an SNDR of 60.54 dB at 10 b mode, resulting in an ultra-low figure-of-merit of 6.0 fJ/conversion-step. The ADC core occupies an active area of only 350 × 280 μm².     

带2位/级的新型转换过程和自锁定比较器的6位600 MS/s 逐次逼近型模数转换器

本文提出了一个在600MHz采样率下的6位逐次逼近寄存器（SAR）。由于对ADC高速的追求,本设计借鉴了2位/级的思想,并在此基础上给出了2位/级的新型转换过程,解决了DAC之间不匹配问题并减少了功耗。同时,采用了改进的分布式比较器拓扑结构以获得速度。通过整合多比较器的输入端减小了时钟馈通效应和失调,引入比较器的自锁技术进一步减小了功耗。测量结果表明,在600MHz采样频率、5.6MHz输入频率下,得到信号与噪声加失真比（SNDR）为32.13 dB,无杂散动态范围（SFDR）为44.05 dB。当输入频率接近奈奎斯特时,SNDR / SFDR分别下降到28.46/39.20 dB。最终该ADC由TSMC 65纳米工艺制造,其设计面积为0.045 mm2。在1.2V电源电压下的功耗为5.01 mW,并得到FoM值为252 fJ/转换过程。     

基于分段电容阵列的改进型逐次逼近型ADC

为缩短高速模数转换器(ADC)中高位(MSB)电容建立时间以及减小功耗,提出了一种基于分段式电容阵列的改进型逐次逼近型(SAR)ADC结构,通过翻转小电容阵列代替翻转大电容阵列以产生高位数字码,并利用180 nm CMOS工艺实现和验证了此ADC结构。该结构一方面可以缩短产生高位数码字过程中的转换时间,提高量化速度;另一方面其可以延长大电容的稳定时间,减小参考电压的负载。通过缩小比较器输入对管的面积以减小寄生电容带来的误差,提升高位数字码的准确度。同时,利用一次性校准技术减小比较器的失配电压。最终,采用180 nm CMOS工艺实现该10 bit SAR ADC,以验证该改进型结构。结果表明,在1.8 V电源电压、780μW功耗、有电路噪声和电容失配情况下,该改进型SAR ADC得到了58.0 dB的信噪失真比(SNDR)。     

高性能低功耗SAR A/D转换器技术发展动态

基于国际公开发表的逐次逼近型A/D转换器(SAR ADC)技术论文,总结了不同架构下高性能SAR结构A/D转换器的技术特点。分析了SAR ADC中主要模块的关键技术,包括高速高线性采样开关技术、高速低功耗比较器技术、高速旁路SAR逻辑技术,以及相关技术在电路级实现时需要考虑的因素。针对SAR ADC的主要模块,介绍了近年来新技术的改进方法。这些高性能低功耗SAR ADC新技术及发展动态的综述对设计者可提供有益的帮助。     

A hybrid CDAC-threshold configuring SAR ADC in 28nm FDSOI CMOS

In this paper, a 9-bit 1.3 GS/s single channel SAR ADC is presented. In conventional SAR ADCs, the capacitive DAC size grows exponentially with respect to converter resolution. This results in both signal bandwidth and conversion speed reduction. The proposed architecture implements binary search through a redundant capacitive DAC for the 5 first MSBs and through programmable comparator thresholds for the remaining 4 LSBs. The DAC capacitance at the front-end remains small enough to achieve high sampling rate with increased input bandwidth. Two asynchronously clocked alternate comparators are used additionally to improve conversion speed. The ADC is designed and simulated in 28 nm FD-SOI CMOS. It consumes 4.1 mW from a 1 V supply, while achieving a SNDR of 52.1 dB and a Figure-of-Merit of 11.4 fJ/conversion-step.     

High power-efficient asynchronous SAR ADC for IoT devices

This paper presents a power-efficient 100-MS/s, 10-bit asynchronous successive approximation register (SAR) ADC. It includes an on-chip reference buffer and the total power dissipation is 6.8 mW. To achieve high performance with high power-efficiency in the proposed ADC, bootstrapped switch, redundancy, set-and-down switching approach, dynamic comparator and dynamic logic techniques are employed. The prototype was fabricated using 65 nm standard CMOS technology. At a 1.2-V supply and 100 MS/s, the ADC achieves an SNDR of 56.2 dB and a SFDR of 65.1 dB. The ADC core consumes only 3.1 mW, resulting in a figure of merit (FOM) of 30.27 fJ/conversionstep and occupies an active area of only 0.009 mm².     

A 10-bit 2.5-MS/s SAR ADC with 60.46 dB SNDR in 0.13-μm CMOS technology

This paper presents a 10-bit 2.5-MS/s successive-approximation-register (SAR) analog- to-digital-converter (ADC) design for micro controller unit of signal process system. Because of the proposed new segmented architecture of 7 MSBs-plus-3 LSBs capacitor–resistor hybrid digital-to-analog-converter using a thermometer decoder for the most significant 5 MSBs, this design achieves superior static nonlinearity and dynamic performance of SNDR, SFDR. Utilizing the proposed deviation calibration technique, the discharging and charging via substrate resulting from deviation of the comparator’s common-mode voltage is cancelled. The ADC is fabricated in a standard 1P5M 0.13-μm CMOS technology. The peak DNL and INL are +0.18/?0.20-LSB, +0.30/?0.25 LSB respectively while the ENOB is 9.52-bit around all process–voltage–temperature corner analysis. At a 2.3-V supply voltage and a 2.5-MS/s sampling rate, the ADC achieves a SNDR of 60.46 dB, SFDR of 75.32 dB while the power dissipation is 0.191-mW, that resulting in a figure of merit of 98.45 fJ/c-s. The die of ADC measures 0.51 × 0.20 mm² resulting in area efficiency of 122.6 μm²/code and compared with the benchmark SAR ADCs, this work is the most area efficient design.     

一种高速高精度比较器的设计

数模转换器(ADC)作为片上集成系统SOC的关键模块,直接决定着SOC的性能.比较器更是在ADC中尤其是逐次逼近型(SAR)ADC中起着非常重要的作用.在SAR ADC中,比较器决定着ADC的速度、精度和功耗等指标,因此说,比较器是SARADC的核心电路.设计了一种应用于12 bit、1 Ms/s采样率SAR ADC的比较器,并提出了估算输入失调电压的新方法.仿真结果表明,在1.8 V,UMC18混合信号工艺下,速度能达到20 MHz,增益达到77 dB,有效分辨的最小电平达到400μV,第一级等效输入噪声仅为94μV.在每级电路存在20 mV失调电压的情况下,该比较器仍能将失调电压有效消除.