Fe颗粒含量对Sn35Bi/Cu钎焊接头组织性能影响

采用扫描电镜(SEM)、能谱仪(EDS)以及万能力学试验机等研究了Fe颗粒含量对Sn35Bi-xFe/Cu钎焊接头组织和性能的影响,并研究了Fe颗粒含量对Sn35Bi-Fe合金钎料的铺展面积和润湿性的影响.结果表明:向Sn35Bi合金钎料中加入少量Fe颗粒,会在Fe颗粒周围生成很薄的FeSn2化合物,降低固相/液相的界面能,提高相的形核率,细化接头的组织;当Fe颗粒含量为1 mass％时,接头组织的细化程度最佳;向Sn35Bi合金钎料中加入Fe颗粒,可以有效提高合金钎料的润湿性和力学性能,当Fe含量为1 mass％时,Sn35Bi-1Fe合金钎料的铺展面积最大,润湿角最小,润湿性能最佳,Sn35Bi-1Fe/Cu接头的剪切强度达到最大,为50.23 MPa,与Sn35Bi/Cu接头相比,提高了37.7％.     

Al元素对亚共晶SnBi钎料接头组织及力学性能影响

通过向亚共晶Sn30Bi钎料中添加Al元素,制备新型Sn-30Bi-xAl低温无铅钎料,采用扫描电镜和拉伸力学实验等研究了时效前后Sn30Bi-Al钎料合金的微观组织及力学性能。结果表明:向亚共晶Sn30Bi钎料中加入Al元素,能够一定程度上抑制焊后接头中形成网状共晶组织,以及Bi相团聚,当Sn30Bi-Al合金中Al元素含量为0.3%时,对网状共晶组织形成和Bi相团聚的抑制作用最佳;在时效过程中,向Sn30Bi合金中添加Al元素,能够一定程度上抑制Bi相团聚,降低界面IMC层生长速率;当Al含量为0.3%时,Sn30Bi-0.3Al接头的力学性能最佳。     

Bi对SnXCuNi焊料性能和焊点界面层组织的影响

为了获得低成本和性能良好的无铅焊料,本文在Sn-4.1X-1.5Cu-Ni焊料中添加质量分数为0.6％的Bi元素,对其微观组织及物相成分、熔点、润湿性和剪切强度进行了分析研究,并对焊点等温时效后其界面组织进行了SEM和EDS分析.结果表明,Sn-4.1 X- 1.5Cu-Ni-0.6Bi焊料中主要由β-Sn、Cu6Sn5、XSn和SnBi组成,Bi的加入能有效地降低焊料的熔点和提高焊料的润湿性,焊点也保持较高的剪切强度.随着等温时效时间的延长,Sn-4.1X-1.5Cu-Ni/Cu和Sn-4.1X- 1.5Cu-Ni-0.6Bi/Cu界面金属间化合物(IMC)层厚度也增加,其界面IMC的增厚主要由扩散机制控制,界面IMC主要成份为Cu6Sn5、Cu3Sn和(Cu,Ni)6Sn5.Bi能抑制等温时效过程中界面IMC的形成和生长,从而提高了焊点的可靠性,其中Sn-4.1 X- 1.5 Cu-Ni/Cu的IMC生长速率为2.95×10-17m2/s,Sn-4.1X-1.5Cu-Ni-0.6Bi/Cu的IMC生长速率为2.78× 10-17m2/s.     

Ni-CNTs增强颗粒对Sn58Bi-0.1Er焊点组织与力学性能的影响

采用真空熔炼方法制备了不同Ni-CNTs含量的Sn58Bi-0.1Er钎料合金,研究不同Ni-CNTs含量对Sn58Bi-0.1Er复合钎料在Cu 基板上的润湿性能的影响,并对不同Ni-CNTs含量下接头界面处金属间化合物的组织形貌及接头的剪切性能进行了分析. 结果表明,当Ni-CNTs 增强颗粒的添加为0.01% ~ 0.05%(质量分数)时,复合钎料合金在铜板上的润湿性得到了提高,随着Ni-CNTs含量的进一步增加,复合钎料在铜板上的润湿性开始呈下降趋势;随着Ni-CNTs的加入,Sn58Bi/Cu界面金属间化合物由锯齿状的Cu₆Sn₅转变成薄层状的(Cu, Ni)₆Sn₅, Ni-CNTs增强颗粒的加入可以有效减小界面金属间化合物层的厚度;Ni-CNTs增强颗粒的加入提高了Sn58Bi/Cu接头的剪切力,当Ni-CNTs的添加量为0.1%时,接头的剪切力最高为432.86 N,较Sn58Bi-0.1Er钎料接头的剪切力提升了两倍以上. Ni-CNTs增强颗粒的添加有效地改善了Sn58Bi-0.1Er接头的力学性能.     

焊接时间及焊接温度对Sn35Bi0.3Ag/Cu焊接接头性能的影响

分别在不同焊接时间和不同焊接温度下制备了Sn35Bi0.3Ag/Cu焊接接头,采用扫描电子显微镜(SEM)、万能拉伸试验机、超声波成像无损探伤检测仪等测试手段,研究了焊接时间(1～9 min)和焊接温度(210～290℃)对Sn35Bi0.3Ag/Cu焊接接头微观结构和力学性能的影响.结果表明,在焊接过程中,Cu元素扩散到焊接界面处,形成了(Cu₆Sn₅,Cu₃Sn)界面层,同时发现生成的Ag3Sn相能够抑制界面层的生长.随着焊接时间的延长或焊接温度的升高,反应层变厚,抗剪强度先增大后减小.对焊接接头断口形貌分析发现,焊接接头的断裂由Bi相颗粒及Cu₆Sn₅颗粒共同作用.焊接接头的断裂发生在IMC/焊料一侧,Bi相颗粒及Cu6Sn5颗粒共同影响着接头的抗剪强度.此外,当焊接时间为3 min、焊接温度为230℃时,接头的钎着率最大,为99.14%,抗剪强度达到最大值,为51.8 MPa.     

时效时间对Sn-58Bi-xCe/Cu焊点组织及显微硬度的影响

研究了时效时间对Sn-58Bi/Cu和Sn-58Bi-0.5Ce/Cu焊点组织和显微硬度的影响。结果表明:随着时效时间增加,Sn-58Bi/Cu和Sn-58Bi-0.5Ce/Cu焊点组织逐渐粗化,界面IMC厚度不断增加;同一时效时间下,Sn-58Bi-0.5Ce/Cu焊点的晶粒尺寸和界面IMC层厚度均低于Sn-58Bi/Cu焊点。焊点的显微硬度均随时效时间增加先增大后降低,且Sn-58Bi-0.5Ce/Cu焊点的显微硬度均高于Sn-58Bi/Cu焊点。Ce颗粒的添加可有效抑制时效过程中焊点组织的粗化及界面IMC层厚度的增加,从而获得较高的显微硬度。     

Cu/Sn-58Bi-0.5Ce/Cu钎焊接头的热时效行为

对比研究了不同时效温度下Sn-58Bi和Sn-58Bi-0.5Ce钎焊接头的组织、界面IMC形态、厚度及接头拉伸性能和断口形貌。结果表明:Ce颗粒的添加细化了Sn-58Bi钎料的组织,抑制了Sn-58Bi钎料接头时效过程中组织的粗化、IMC形貌变化及厚度的增大。随时效温度的升高,Cu/Sn-58Bi-0.5Ce/Cu钎焊接头IMC形貌从扇贝状逐渐趋于平整,厚度逐渐增大,抗拉强度逐渐降低,拉伸断口由韧性断裂转变为脆性断裂。     

热循环对Sn58Bi-0.1Ti/Cu焊点界面与性能影响

为了改善Sn58Bi低温钎料的性能,通过在Sn58Bi低温钎料中添加质量分数为0.1%的纳米Ti颗粒制备了Sn58Bi-0.1Ti纳米增强复合钎料。研究了纳米Ti颗粒的添加对-55～125℃热循环过程中Sn58Bi/Cu焊点的界面金属间化合物(IMC)生长行为的影响。结果表明:回流焊后,在Sn58Bi/Cu焊点和Sn58Bi-0.1Ti/Cu焊点的界面处都形成一层扇贝状的Cu6Sn5IMC层。在热循环300次后,在Cu_6Sn_5/Cu界面处形成了一层Cu_3Sn IMC。Sn58Bi/Cu焊点和Sn58Bi-0.1Ti/Cu焊点的IMC层厚度均和热循环时间的平方根呈线性关系。但是,Sn58Bi-0.1Ti/Cu焊点的IMC层厚度明显低于Sn58Bi/Cu焊点,这表明纳米Ti颗粒的添加能有效抑制热循环过程中界面IMC的过度生长。另外计算了这2种焊点的IMC层扩散系数,结果发现Sn58Bi-0.1Ti/Cu焊点的IMC层扩散系数(整体IMC、Cu_6Sn_5和Cu_3Sn IMC)明显比Sn58Bi/Cu焊点小,这在一定程度上解释了Ti纳米颗粒对界面IMC层生长的抑制作用。     

共晶SnBi/CU焊点界面处Bi的偏析

利用SEM,TEM,XRD分析了共晶SnBi／Cu焊点经120℃时效7d后界面组织结构的变化,焊点界面处金属间化合物厚度由原来初始态的约2μm增至时效态的10μm,并且化合物也由原来单一的Cu6Sn5转变为Cu6Sn5和Cu3Sn相,进一步研究表明,在Cu3Sn与Cu之间界面处偏析了大量尺寸约100nm的Bi颗粒,双缺口试样的断裂韧性实验表明,热时效促使焊点断裂韧性快速下降,同时该焊点的断口也由原来初始态的韧性断裂转变为时效后Cu3Sn与Cu界面处的脆性断裂,脆性断裂后一侧断口为鲜亮的Cu表面,在TEM下,通过与220℃／5d时效态纯Sn／Cu焊点相同界面的比较,可以断定引起该焊点失效的原因是Bi颗粒在此界面处的偏析,含Bi无Pb焊料由于Bi在界面析出而引发的脆断将会是微电子器件长期使用中的一个潜在危害。     

添加Fe颗粒对SnBi钎料电迁移的影响

分别研究了SnBi钎料和添加0.1%的微米级Fe颗粒的SnBi复合钎料的电迁移现象。结果表明:随着通电时间的增加,SnBi钎料显微组织发生明显的粗化,白色的富Bi相尺寸不断增加,阳极和阴极IMC厚度呈现极性效应,抗拉强度变化明显。当添加Fe颗粒后,随着通电时间的增加,SnBi-Fe复合钎料的显微组织粗化不明显,阴极和阳极界面IMC厚度变化减缓,复合钎料接头的抗拉强度变化减缓。这表明Fe颗粒可以有效抑制SnBi钎料的电迁移。     

热循环对Sn58Bi(纳米Ti)/Cu焊点界面与性能影响

为了改善Sn-58Bi低温钎料的性能,通过在Sn-58Bi低温钎料中添加质量分数为0.1%的纳米Ti颗粒制备了Sn-58Bi-0.1Ti纳米增强复合钎料。在本文中,研究了纳米Ti颗粒的添加对-55～125 _^oC热循环过程中Sn-58Bi/Cu焊点的界面金属间化合物(IMC)生长行为的影响。研究结果表明：回流焊后,在Sn-58Bi/Cu焊点和Sn-58Bi-0.1Ti/Cu焊点的界面处都形成一层扇贝状的Cu₆Sn₅ IMC层。在热循环300次后,在Cu₆Sn₅/Cu界面处形成了一层Cu₃Sn IMC。Sn-58Bi/Cu焊点和Sn-58Bi-0.1Ti/Cu焊点的IMC层厚度均和热循环时间的平方根呈线性关系。但是,Sn-58Bi-0.1Ti/Cu焊点的IMC层厚度明显低于Sn-58B/Cu焊点,这表明纳米Ti颗粒的添加能有效抑制热循环过程中界面IMC的过度生长。另外计算了这两种焊点的IMC层扩散系数,结果发现Sn-58Bi-0.1Ti/Cu焊点的IMC层扩散系数(整体IMC、Cu₆Sn₅和Cu₃Sn IMC)明显比Sn-58Bi/Cu焊点小,这在一定程度上解释了Ti纳米颗粒对界面IMC层的抑制作用。     

Investigation of small Sn–3.5Ag–0.5Cu additions on the microstructure and properties of Sn–8Zn–3Bi solder on Au/Ni/Cu pads

The formation of intermetallic compounds and the shear strength of Sn–Zn–Bi solder alloys with various (0, 1, 3, 5 and 7 wt%) weight percentages of Sn–Ag–Cu were investigated on Au/Ni metallized Cu pads depending on the number of reflow cycles. In Sn–Zn–Bi solder joints, scallop-shaped AuZn₃ intermetallic compound (IMC) particles were found at the interfaces and in the solder ball regions, fine Bi- and needle-shaped Zn-rich phase were observed in the Sn matrix. After Sn–Ag–Cu additions, an additional Ag–Zn intermetallic compound layer was adhered to the top surface of the AuZn₃ layer at the interface and fine spherical-shaped AgZn₃ intermetallic compound particles were detected in the solder ball regions together with Bi- and Zn-rich phase volumes. After the addition of Sn–Ag–Cu, the shear strength of Sn–Zn–Bi solder joints increased due to the formation of the fine AgZn₃ intermetallic compound particles. The shear strengths of Sn–Zn–Bi and Sn–Zn–Bi/7 wt% Sn–Ag–Cu solder joints after one reflow cycle were about 44.5 and 53.1 MPa, respectively and their shear strengths after eight reflow cycles were about 43.4 and 51.6 MPa, respectively.     

Retarding the electromigration effects to the eutectic SnBi solder joints by micro-sized Ni-particles reinforcement approach

Electromigration (EM) has become one of the reliability concerns to the electronic solder joint due to its increasing capacity to bear the high current density (10⁴ A/cm²). Although the failure induced by EM can trigger a large void across the entire cathode interface, no effective solutions are presented throughout years of effort on this problem. Here, the composite solder joints are addressed to demonstrate their potential roles on solving the EM issue in the eutectic SnBi solder joints. Micro-sized Ni particles were selected to intentionally add into the solder matrix due to their extensive application as a barrier layer in the under-bump-metallization (UBM) of flip chip solder joints. The ultimate results illustrated that the Ni particles can react with Sn to form the cluster-type Sn-Ni intermetallic compounds (IMCs) inside the solder matrix after the first reflow. Accordingly, the phase segregation of Sn and Bi was significantly inhibited during the current stressing, demonstrating the Sn-Ni IMCs can act as the obstacles to obstruct the movement of dominant diffusion entity (Bi atoms/ions) along the phase boundaries.     

Evolution of Ag3Sn at Sn-3.0Ag-0.3Cu-0.05Cr/Cu joint interfaces during thermal aging

The intermetallic compounds (IMC) in the solder and at the interface of Sn-3.0Ag-0.5Cu (SAC)/Cu and Sn-3.0Ag-0.3Cu-0.05Cr (SACC)/Cu joints were investigated after isothermal aging at 150 °C for 0, 168 and 500 h. Different shaped Ag₃Sn phases were found near the IMC layer of the latter joint. Interestingly, fine rod-shaped and branch-like Ag₃Sn were detected near the interface after soldering and long Ag₃Sn changed into shorter rods and small particles during aging. It is investigated that the Cr addition and thermal aging have effect on the evolution of Ag₃Sn morphologies and it is controlled by interfacial diffusion. Energy minimization theory and the redistribution of elements are used to explain the morphological evolution of Ag₃Sn. Small Ag₃Sn particles were also found on the IMC layer after aging, unlike the large Ag₃Sn at that of SAC/Cu joints. In conclusion, a favorable morphology of the joint interface leads to better bonding properties for SACC/Cu joints against thermal aging than that for SAC/Cu.     

超低银SAC钎料焊点界面显微组织演化

研究了复合添加Ga/Nd元素的超低银Sn-0.3Ag-0.7Cu钎料在长期时效过程中的微焊点界面组织演化情况. 结果表明,复合添加适量Ga/Nd元素可以显著改善时效后微焊点界面组织,抑制微焊点界面附近大块状金属间化合物以及稀土相的生成. 经720 h时效后,即使在含有过量Nd元素的微焊点界面仍没有发现明显的Ag₃Sn相和稀土相,取而代之的是小块状的新相,结合EDS和XRD分析结果推测该相含有Ga₂Nd与Cu₆Sn₅. 经过长期时效处理后,微焊点抗剪力接近Sn-3.8Ag-0.7Cu焊点抗剪力的90%,具有较好的力学性能.     

Zn元素对Sn0.5Ag0.7Cu/Cu接头剪切性能和时效接头组织结构的影响

为了改善Sn0.5Ag0.7Cu/Cu接头组织结构和力学性能,通过在Sn0.5Ag0.7Cu钎料中添加Zn元素,以Sn0.5Ag0.7Cu-xZn (x=0, 0.1, 0.4, 0.7, 1)钎料合金对紫铜基板进行了熔钎焊试验,并对接头进行微观组织及力学性能分析. 结果表明,改变了接头结合界面处金属间化合物(intermetallic compound,IMC)组织结构,增强了接头剪切断裂的韧性断裂特征,提高了接头抗剪强度. 当Zn元素的加入量为0.4% (质量分数)时,接头抗剪强度达到最高的47.81 MPa. 添加Zn元素等温时效处理后,对接头中IMC层的生长有着抑制作用,并且随着时效温度的提高和时效时间的延长,脆性层Cu₅Zn₈会破碎直至消失,因此在改善接头结合界面处IMC组织性能的同时,不会改变其组成和结构.     

Cu基板退火处理的Cu/Sn58Bi/Cu钎焊接头界面微结构

研究了铜基板退火处理对Cu/Sn58Bi界面微结构的影响. 结果表明,在回流以及时效24 h后Cu/Sn58Bi/Cu界面只观察到Cu₆Sn₅. 随着时效时间的增加,在界面形成了Cu₆Sn₅和Cu₃Sn的双金属间化合物(IMC)层,并且IMC层厚度也随之增加. 长时间时效过程中,在未退火处理的铜基板界面产生了较多铋偏析,而在退火处理的铜基板界面较少产生铋偏析. 比较退火处理以及未退火处理的铜基板与钎料界面IMC层生长速率常数,发现铜基板退火处理能减缓IMC层生长,主要归因于对铜基板进行退火处理能够有效的消除铜基板的内应力与组织缺陷,从而减缓Cu原子的扩散,起到减缓IMC生长的作用.