Effects of Ta5+ doping on microstructure evolution,dielectric properties and electrical response in CaCu3Ti4O12 ceramics

The effects of Ta⁵⁺ substitution on the microstructure, electrical response of grain boundary, and dielectric properties of CaCu₃Ti₄O₁₂ ceramics were investigated. The mean grain size decreased with increasing Ta⁵⁺ concentration, which was ascribed to the ability of Ta⁵⁺ doping to inhibit grain boundary mobility. This can decrease dielectric constant values. Grain boundary resistance and potential barrier height of CaCu₃Ti₄O₁₂ ceramics were reduced by doping with Ta⁵⁺. This results in enhancement of dc conductivity and the related loss tangent. Influence of charge compensations on microstructure and intrinsic electrical properties of grain boundaries resulting from the effects of replacing Ti⁴⁺ with Ta⁵⁺ are discussed. The experimental data and variation caused by the substitution of Ta⁵⁺ can be described well by the internal barrier layer capacitor model based on space charge polarization at the grain boundaries.     

Origin of significantly enhanced dielectric response and nonlinear electrical behavior in Ni2+-doped CaCu3Ti4O12: Influence of DC bias on electrical properties of grain boundary and associated giant dielectric properties

CaCu_3-xNi_xTi₄O₁₂ (x?=?0, 0.05, and 0.10) powders were synthesized using a solid state reaction method. Phase structure and microstructure analyses revealed that all sintered CaCu_3-xNi_xTi₄O₁₂ ceramics were of a pure phase. The CaCu₃Ti₄O₁₂ ceramics had a dense microstructure and grain sizes were enlarged by doping with Ni²⁺. Interestingly, the dielectric permittivity was significantly enhanced, whereas the loss tangent was greatly suppressed to ～0.046–0.034 at 1?kHz. All sintered ceramics exhibited non-Ohmic characteristics. Clarification of the influences of DC bias showed that the dielectric permittivity and loss tangent values were increased by DC bias. The resistance of grain boundaries and the associated conduction activation energy of CaCu_3-xNi_xTi₄O₁₂ ceramics were reduced as the DC bias voltage increased. Therefore, the observed non-Ohmic behavior and significantly enhanced dielectric properties should be closely related to variation in the Schottky barriers at the grain boundaries.     

Giant dielectric behavior of monovalent cation/anion (Li+, F−) co-doped CaCu3Ti4O12 ceramics

Giant dielectric behavior and electrical properties of monovalent cation/anion (Li⁺, F⁻) co-doped CaCu₃Ti₄O₁₂ ceramics prepared by a solid-state reaction route were systematically investigated. Substitution of Li⁺ and F⁻ led to a significantly enlarged mean grain size. A reduced loss tangent (tanδ ~0.06) with the retainment of an ultra-high dielectric permittivity (ε′ ~7.7-8.8 × 10⁴) was achieved in the co-doped ceramics, while the breakdown electric field and nonlinear coefficient of CaCu₃Ti₄O₁₂ ceramics were increased by co-doping with (Li⁺, F⁻). The variations in nonlinear electrical properties and giant dielectric response, as well as the dielectric relaxation, were well explained by the Maxwell-Wagner polarization model for an electrically heterogeneous microstructure, in which a Schottky barrier height at the grain boundaries (GBs) was formed. ε′ was closely correlated to the GB capacitance. Significantly decreased tanδ value and enhanced nonlinear properties were related to a significant increase in the GB resistance, which was attributed to the significantly increased potential barrier height and conduction activation energy at the GBs. The semiconducting nature of the grains was also studied using X-ray photoelectron spectroscopy and found to originate from the presence of Cu⁺ and Ti³⁺ ions.     

(Al3+, Nb5+) co–doped CaCu3Ti4O12: An extended approach for acceptor–donor heteroatomic substitutions to achieve high–performance giant–dielectric permittivity

Substitution of (Al³⁺, Nb⁵⁺) co–dopants into TiO₆ octahedral sites of CaCu₃Ti₄O₁₂ ceramics, which were prepared by a solid state reaction method and sintered at 1090 °C for 18 h, can cause a great reduction in a low–frequency loss tangent (tanδ≈0.045–0.058) compared to those of Al³⁺ or Nb⁵⁺ single–doped CaCu₃Ti₄O₁₂. Notably, very high dielectric permittivities of 2.9 ? 4.1 × 10⁴ with good dielectric–temperature stability are achieved. The room–temperature grain boundary resistance (R_gb≈0.37–1.17 × 10⁹ Ω.cm) and related conduction activation energy (E_gb≈0.781–0.817 eV), as well as the non–Ohmic properties of the co–doped ceramics are greatly enhanced compared to single–doped ceramics (R_gb≈10⁴–10⁶ Ω cm and E_gb≈0.353–0.619 eV). The results show the importance of grain boundary properties for controlling the nonlinear–electrical and giant–dielectric properties of CaCu₃Ti₄O₁₂ ceramics, supporting the internal barrier layer capacitor model of Schottky barriers at grain boundaries.     

Structural and dielectric properties,and nonlinear electrical response of the CaCu3-xZnxTi4O12 ceramics: Experimental and computational studies

CaCu_3-xZn_xTi₄O₁₂ ceramics (x = 0, 0.05, 0.10) were successfully prepared by a conventional solid-state reaction method. Their structural and dielectric properties, and nonlinear electrical response were systematically inspected. The X-ray diffraction results indicated that single-phase CaCu₃Ti₄O₁₂ (JCPDS no. 75–2188) was obtained in all sintered ceramics. Changes in the lattice parameter are well-matched with the computational result, indicating an occupation of Zn²⁺ doping ions at Cu²⁺ sites. The overall tendency shows that the average grain size decreases when x increases. Due to a decrease in overall grain size, the dielectric permittivity of CaCu_3-xZn_xTi₄O₁₂ decreases expressively. Despite a decrease in the dielectric permittivity, it remains at a high level in the doped ceramics (~3,406–11,441). Besides retention in high dielectric permittivity, the dielectric loss tangent of x = 0.05 and 0.10 (~0.074–0.076) is lower than that of x = 0 (~0.227). A reduction in the dielectric loss tangent in the CaCu_3-xZn_xTi₄O₁₂ ceramics is closely associated with the enhanced grain boundary response. Increases in grain boundary resistance, breakdown electric field, and conduction activation energy of grain boundary as a result of Zn²⁺ substitution are shown to play a crucial role in improved grain boundary response. Furthermore, the XPS analysis shows the existence of Cu⁺/Cu²⁺ and Ti³⁺/Ti⁴⁺, indicating charge compensation due to the loss of oxygen lattice. Based on all results of this work, enhanced dielectric properties of the Zn-doped CCTO can be explained using the internal barrier layer capacitor model.     

Microstructural evolution,non‐Ohmic properties,and giant dielectric response in CaCu3Ti4−xGexO12 ceramics

The microstructural evolution, non‐Ohmic properties, and giant dielectric properties of CaCu₃Ti_4?xGe_xO₁₂ ceramics (x=0‐0.10) are systematically investigated. The Rietveld refinement confirms the existence of a pure CaCu₃Ti₄O₁₂ phase in all samples. Significantly enlarged grain sizes of CaCu₃Ti_4?xGe_xO₁₂ ceramics are associated with the liquid phase sintering mechanism. Enhanced dielectric permittivity from 6.90×10⁴ to 1.08×10⁵ can be achieved by increasing Ge⁴⁺ dopant from x=0‐0.10, whereas the loss tangent is remarkably reduced by a factor of ≈10. Non‐Ohmic properties are enhanced by Ge⁴⁺ doping ions. Using impedance and admittance spectroscopies, the underlying mechanisms for the dielectric and nonlinear properties are well described. The improved nonlinear properties and reduced loss tangent are attributed to the enhanced resistance and conduction activation energy of the grain boundaries. The largely enhanced permittivity is closely associated with the enlarged grain sizes and the increase in the Cu⁺/Cu²⁺ and Ti³⁺/Ti⁴⁺ ratios, which are calculated from the X‐ray absorption near‐edge structure.     

Improved non-ohmic and dielectric properties of Cr3+ doped CaCu3Ti4O12 ceramics prepared by a polymer pyrolysis solution route

CaCu_3-xCr_xTi₄O₁₂ (x?=?0.00–0.20) ceramics were prepared via a polymer pyrolysis solution route. Their dielectric properties were improved by Cr³⁺ doping resulting in an optimal dielectric constant value of 7156 and a low tanδ?value of 0.092 in a sample with x?=?0.08. This might have resulted from a decrease in oxygen vacancies at grain boundaries. XANES spectra confirmed the presence of Cu⁺ ions in all ceramic samples with a decreasing Cu⁺/Cu²⁺ ratio due to an increased content of Cr³⁺ ions. All CaCu_3-xCr_xTi₄O₁₂ ceramics showed nonlinear characteristic with improvement in both the breakdown field (E_b) and its nonlinear coefficient (α). Interestingly, the highest values of α, ～ 114.4, and that of E_b, ～8455.0?±?123.6?V?cm^?1, were obtained in a CaCu_3-xCr_xTi₄O₁₂ sample with x?=?0.08. The improvement of dielectric and nonlinear properties suggests that they originate from a reduction of oxygen vacancies at grain boundaries.     

Improved dielectric properties in A′‐site nickel‐doped CaCu3Ti4O12 ceramics

The improved dielectric properties and voltage‐current nonlinearity of nickel‐doped CaCu₃Ti₄O₁₂ (CCNTO) ceramics prepared by solid‐state reaction were investigated. The approach of A′‐site Ni doping resulted in improved dielectric properties in the CaCu₃Ti₄O₁₂ (CCTO) system, with a dielectric constant ε′≈1.51×10⁵ and dielectric loss tanδ≈0.051 found for the sample with a Ni doping of 20% (CCNTO20) at room temperature and 1 kHz. The X‐ray photoelectron spectroscopy (XPS) analysis of the CCTO and the specimen with a Ni doping of 25% (CCNTO25) verified the co‐existence of Cu⁺/Cu²⁺ and Ti³⁺/Ti⁴⁺. A steady increase in ε′(f) and a slight increase in α observed upon initial Ni doping were ascribed to a more Cu‐rich phase in the intergranular phase caused by the Ni substitution in the grains. The low‐frequency relaxation leading to a distinct enhancement in ε′(f) beginning with CCNTO25 was confirmed to be a Maxwell‐Wagner‐type relaxation strongly affected by the Ni‐related phase with the formation of a core‐shell structure. The decrease of the dielectric loss was associated with the promoted densification of CCNTO and the increase of Cu vacancies, due to Ni doping on the Cu sites. In addition, the Ni dopant had a certain effect on tuning the current‐voltage characteristics of the CCTO ceramics. The present A′‐site Ni doping experiments demonstrate the extrinsic effect underlying the giant dielectric constant and provides a promising approach for developing practical applications.     

Effect of cesium and cerium substitution on the dielectric properties of CaCu3Ti4O12 ceramics

In this study, CaCu₃Ti₄O₁₂ (CCTO) ceramics were doped with cesium and cerium atoms to possibly improve the electrical properties of these widely used ceramics. In all cases, pure phase perovskites were produced where cesium doping enhanced the grain growth and cerium doping produced grain growth inhibition. The cesium doping showed an improvement in loss tangent performance, in contrast to the cerium doping which showed a negative result. A high dielectric constant >15,000 with a dielectric loss lower than 0.06 was observed for cesium 2.0 mol% doped at high frequencies. These results were related to the change in microstructure and the properties of grain boundary after doping.     

A novel strategy to enhance dielectric performance and non-Ohmic properties in Ca2Cu2−xMgxTi4O12

A novel strategy to improve the dielectric and non-Ohmic properties of CaCu₃Ti₄O₁₂ ceramics that deliberately created a binary-phase system of CaCu_3−xMg_xTi₄O₁₂/CaTiO₃ was proposed and can be performed with a starting nominal formula of Ca₂Cu_2−xMg_xTi₄O₁₂. Mg²⁺ doping ions were preferentially incorporated only into the CaCu₃Ti₄O₁₂ phase. Substitution of Mg²⁺ into CaCu₃Ti₄O₁₂/CaTiO₃ can cause a significant increase in dielectric permittivity and a large reduction of the loss tangent to <0.015 at 1 kHz; while, retaining excellent temperature dielectric-stability. Sintering time had a slight influence on the dielectric properties, but remarkable effects upon the nonlinear electrical properties of CaCu_3−xMg_xTi₄O₁₂/CaTiO₃ ceramics. Degradation of nonlinear properties with increased sintering time is suggested to be the result of the dominant effect of oxygen vacancies. Impedance spectroscopy analysis demonstrated that improved dielectric and nonlinear properties could be attributed to the enhanced electrical responses of CaCu₃Ti₄O₁₂–CaTiO₃ and CaCu₃Ti₄O₁₂–CaCu₃Ti₄O₁₂ interfaces resulting from Mg²⁺ doping ions.     

Microstructural evolution and dielectric properties of SiO2-doped CaCu3Ti4O12 ceramics

The abnormal grain growth (AGG) behavior of undoped and SiO₂-doped CaCu₃Ti₄O₁₂ (CCTO) ceramics were investigated. With the addition of 2 wt.% SiO₂, the AGG-triggering temperature decreased from 1100 to 1060 °C, and the temperature for obtaining a uniform and coarse microstructure decreased from 1140 to 1100 °C. The lowering of the AGG temperature by SiO₂ addition was attributed to the formation of a CuO-SiO₂-rich intergranular phase at lower temperature. The apparent dielectric permittivity of coarse SiO₂-doped CCTO ceramics was ∼10 times higher than that of fine SiO₂-doped CCTO ceramics at the frequency of 10³–10⁵ Hz. The doping of SiO₂ to CCTO ceramics provides an efficient route of improving the dielectric properties via grain coarsening. The correlation between the microstructure and apparent permittivity suggests the presence of a barrier layer near the grain boundary.     

Extremely Enhanced Nonlinear Current–Voltage Properties of Tb‐Doped CaCu3Ti4O12 Ceramics

Nonlinear current–voltage properties of CaCu₃Ti₄O₁₂ ceramics were extremely enhanced by doping with Tb. Substitution of Tb to CaCu₃Ti₄O₁₂ resulted in a decrease in grain size due to the ability of Tb ions to inhibit grain boundary mobility. The dielectric properties of CaCu₃Ti₄O₁₂ ceramics were degraded after doping with Tb. Surprisingly, the nonlinear electrical properties were strongly enhanced. The best properties with a nonlinear coefficient of ~29.67 and breakdown electric field strength of ~1.52 × 10⁴ V/cm were obtained in the Ca_0.775Tb_0.15Cu₃Ti₄O₁₂ ceramic. These extremely enhanced properties were attributed to modification of grain boundary electrical response due to the effect Tb substitution.     

Enhanced non-linear current-voltage response of Te-doped calcium copper titanate ceramics

The influence of partial replacement of Ti⁴⁺ ions by Te⁴⁺ in calcium copper titanate lattice on dielectric and non-linear current- voltage (I–V) characteristics was systematically studied. There was a remarkable increase in the values of the nonlinear coefficient (α) with Te⁴⁺ doping concentration in CaCu₃Ti_4-xTe_xO₁₂ (where, x=0, 0.1, 0.2).For instance, the α values increase from 2.9 (x=0) to 22.7 (x=0.2) for ceramics sintered at 1323 K/8 h. The room temperature value of current density (J) at the electrical field of 250 V/cm for CaCu₃Ti_3.8Te_0.2O₁₂ ceramics is almost 400 times higher than that of the pure CaCu₃Ti₄O₁₂ ceramics sintered at 1323 K. A systematic investigation into I–V behaviour as a function of temperature gave an insight into the conduction mechanisms of undoped and doped ceramics of calcium copper titanate (CCTO). The calculated potential barrier value for doped ceramics (~ 0.21 eV) dropped down to almost one third that of the undoped ceramics (~ 0.63 eV).     

Colossal dielectric response and relaxation behavior in novel system of Zr4+ and Nb5+ co-substituted CaCu3Ti4O12 ceramics

In this work, we developed a novel system of isovalent Zr⁴⁺ and donor Nb⁵⁺ co-doped CaCu₃Ti₄O₁₂ (CCTO) ceramics to enhance dielectric response. The influences of Zr⁴⁺ and Nb⁵⁺ co-substituting on the colossal dielectric response and relaxation behavior of the CCTO ceramics fabricated by a conventional solid-phase synthesis method were investigated methodically. Co-doping of Zr⁴⁺ and Nb⁵⁺ ions leads to a significant reduction in grain size for the CCTO ceramics sintered at 1060 °C for 10 h. XRD and Raman results of the CaCu₃Ti_3.8-xZr_xNb_0.2O₁₂ (CCTZNO) ceramics show a cubic perovskite structure with space group Im-3. The first principle calculation result exhibits a better thermodynamic stability of the CCTO structure co-doped with Zr⁴⁺ and Nb⁵⁺ ions than that of single-doped with Zr⁴⁺ or Nb⁵⁺ ion. Interestingly, the CCTZNO ceramics exhibit greatly improved dielectric constant (~10⁵) at a frequency range of 10²–10⁵ Hz and at a temperature range of 20–210 °C, indicating a giant dielectric response within broader frequency and temperature ranges. The dielectric properties of CCTZNO ceramics were analyzed from the viewpoints of defect-dipole effect and internal barrier layer capacitance (IBLC) model. Accordingly, the immensely enhanced dielectric response is primarily ascribed to the complex defect dipoles associated with oxygen vacancies by co-doping Zr⁴⁺ and Nb⁵⁺ ions into CCTO structure. In addition, the obvious dielectric relaxation behavior has been found in CCTZNO ceramics, and the relaxation process in middle frequency regions is attributed to the grain boundary response confirmed by complex impedance spectroscopy and electric modulus.     

Ge4+ doped CaCu2.95Zn0.05Ti4O12 ceramics: Two-step reduction of loss tangent

CaCu₃Ti₄O₁₂ ceramics have been extensively studied for their potential applications as capacitors in recent years; however, these materials exhibit very large dielectric losses. A novel approach to reducing the dielectric loss tangent in two steps, while increasing the dielectric permittivity, is presented herein. Doping CaCu₃Ti₄O₁₂ with a Zn dopant reduces the loss tangent of the ceramic material from 0.227 to 0.074, which is due to the increase in grain boundary (GB) resistance by an order of magnitude (from 6.3× 10³ to 3.93 × 10⁴ Ω cm). Zn-doping slightly changes the microstructure and dielectric permittivity of the CaCu₃Ti₄O₁₂ ceramic, which reveals that the primary role of the Zn dopant is to tune the intrinsic properties of the GBs. Surprisingly, the addition of the Ge⁴⁺ dopant into the Zn²⁺-doped CaCu₃Ti₄O₁₂ ceramic sample led to a further decrease in the loss tangent from 0.074 to 0.014, due to enhanced GB resistance (3.1 × 10⁵ Ω cm). The grain size increased remarkably from 2–3 μm to 85–90 μm, corresponding to a significant increase in the dielectric permittivity (~1–4 × 10⁴). The large increase in GB resistance is due to the intrinsic potential barrier height at the GBs and the segregation of the Cu-rich phase in the GB region. First-principles calculations revealed that Zn and Ge are preferentially located at the Cu sites in the CaCu₃Ti₄O₁₂ structure. The substitution of the Ge dopant does not hinder the role of the Zn dopant in terms of improving the electrical properties at the GBs. These phenomena are effectively explained by the internal barrier layer capacitor model. This study provides a way of improving the dielectric properties of ceramics for their practical use as capacitors.     

Effects of LiF addition on microstructure and dielectric properties of CaCu3Ti4O12 ceramics

The effects of small amounts of lithium fluoride sintering aid on the microstructure and dielectric properties of CaCu₃Ti₄O₁₂ (CCTO) ceramics were investigated. CCTO polycrystalline ceramics with 0.5 and 1.0 mol% LiF, and without additive were prepared by solid state synthesis. Good densification (>90% of the theoretical density) was obtained for all prepared materials. Specimens without the sintering aid and sintered at 1090 °C exhibit secondary phases as an outcome of the decomposition reaction. The mean grain size is controlled by the amount of LiF in specimens containing the additive. Impedance spectroscopy measurements on CaCu₃Ti₄O₁₂ ceramics evidence the electrically heterogeneous nature of this material consisting of semiconductor grains along with insulating grain boundaries. The activation energy for grain boundary conduction is lower for specimens prepared with the additive, and the electric permittivity reached 53,000 for 0.5 mol% LiF containing CCTO.     

Origin of giant dielectric response in LiCuNb3O9 distorted perovskite ceramics

LiCuNb₃O₉ ceramics with the distorted cubic perovskite structure were prepared by a solid-state reaction method. The ceramic exhibited a very large value of permittivity (∼4.4 × 10⁴ at 100 kHz) at room temperature (∼300 K) and a low-temperature dielectric relaxation behaviour following the Arrhenius law. The origin of the giant dielectric response of the LiCuNb₃O₉ ceramics was correlated with the structure of the ceramics. The barrier layers in the grain boundaries and the mixed-valent structure of Cu⁺/Cu²⁺ were found to contribute to the giant permittivity of the ceramics and confirmed by X-ray spectroscopy and complex impedance spectroscopy analyses.     

Preparation of CaCu3Ti4O12 ceramics with low dielectric loss and giant dielectric constant by the sol–gel technique

CaCu₃Ti₄O₁₂ precursor powders were synthesized by the sol–gel process. The optimized processing parameters for the synthesis of precursor powders were as follows: the Ti concentration was 0.60 mol/L, the pH value of the sol was 1.58, and the aging time of the sol was 6 h. After sintering at 1100 °C for 15 h, the CCTO ceramics with the highest density and fine-grained microstructure were obtained, exhibiting outstanding dielectric properties: ε′≈3.50×10⁴ and tan δ=0.014 (at 1 kHz). The low dielectric loss was attributed to the highest grain boundary resistance which significantly reduced the leakage current across grain boundaries. A broad dielectric relaxation peak was observed around 300 °C. The complex impedance spectroscopy analysis suggested that the obtained CaCu₃Ti₄O₁₂ ceramics were electrically heterogeneous, consisting of semiconducting grains and insulating grain boundaries. The calculated grain boundary resistance and grain resistance were 0.87 MΩ and 3.50 Ω, respectively.     

Enhancing giant dielectric properties of Ta5+-doped Na1/2Y1/2Cu3Ti4O12 ceramics by engineering grain and grain boundary

Various strategies to improve the dielectric properties of ACu₃Ti₄O₁₂ (A = Sr, Ca, Ba, Cd, and Na_1/2Bi_1/2) ceramics have widely been investigated. However, the reduction in the loss tangent (tanδ) is usually accompanied by the decreased dielectric permittivity (ε′), or vice versa. Herein, we report a route to considerably increase ε′ with a simultaneous reduction in tanδ in Ta⁵⁺–doped Na_1/2Y_1/2Cu₃Ti₄O₁₂ (NYCTO) ceramics. Dense microstructures with segregation of Cu– and Ta–rich phases along the grain boundaries (GBs) and slightly increased mean grain size were observed. The samples prepared via solid-state reaction displayed an increase in ε′ by more than a factor of 3, whereas tanδ was significantly reduced by an order of magnitude. The GB–conduction activation energy and resistance raised due to the segregation of Cu/Ta–rich phases along the GBs, resulting in a decreased tanδ. Concurrently, the grain–conduction activation energy and grain resistance of the NYCTO ceramics were reduced by Ta⁵⁺ doping ions owing to the increased Cu⁺/Cu²⁺, Cu³⁺/Cu²⁺, and Ti³⁺/Ti⁴⁺ ratios, resulting in enhanced interfacial polarization and ε′. The effects of Ta⁵⁺ dopant on the giant dielectric response and electrical properties of the grain and GBs were described based on the Maxwell–Wagner polarization at the insulating GB interface, following the internal barrier layer capacitor model.     

Low temperature preparation of CaCu3Ti4O12 ceramics with high permittivity and low dielectric loss

Low temperature preparation of CaCu₃Ti₄O₁₂ ceramics with large permittivity is of practical interest for cofired multilayer ceramic capacitors. Although CaCu₃Ti₄O₁₂ ceramics have been prepared at low temperatures as previously reported, they have rather low permittivity. This work demonstrates that CaCu₃Ti₄O₁₂ ceramics can not only be prepared at low temperatures, but they also have large permittivity. Herein, CaCu₃Ti₄O₁₂ ceramics were prepared by the solid state reaction method using B₂O₃ as the doping substance. It has been shown that B₂O₃ dopant can considerably lower the calcination and sintering temperatures to 870 °C and 920 °C, respectively. The relative permittivity of the low temperature prepared CaCu₃Ti_4−xB_xO₁₂ ceramics is about 5 times larger than the previously reported results in the literature. Furthermore, the dielectric loss of the CaCu₃Ti_4−xB_xO₁₂ ceramics is found to be as low as 0.03. This work provides a beneficial base for the future commercial applications of CaCu₃Ti₄O₁₂ ceramics with large permittivity for the cofired multilayer ceramic capacitors.