无铅BGA回流焊残余应力仿真分析

以热弹塑性理论为基础,建立无铅BGA焊点在回流焊工艺中的残余应力有限元模型,采用ANSYS进行热结构耦合分析,得到Sn3.5Ag0.75焊点回流冷却结晶后的残余应力分布规律。并针对焊点的直径、焊点的高度、PCB板的厚度和对流系数四个因素建立正交试验表,分析这四个因素对BGA冷却过程中残余应力影响规律,通过极差分析得出影响程度由大到小分别为对流系数、焊点高度、焊点直径、PCB板厚度,对控制BGA回流冷却残余应力提供理论指导。     

系统级封装焊点可靠性分析与研究

基于有限元分析软件ANSYS,建立系统级封装焊点可靠性分析有限元模型,进行热应力耦合分析,研究封装体及焊点随焊接降温后产生的应力分布规律和可能出现的失效形式。分析结果显示：封装体在焊接降温后产生的应力值会影响到各个部件的性能,通过对比试验可以得出,影响封装体焊接降温后产生应力值大小的因素主要包括降温温度、焊点材料、焊点直径。通过正交试验分析可知,其影响程度为：降温温度>焊点材料>焊点直径,该结果对系统级封装焊接工艺设计提供参考。     

残余应力对混合组装BGA热循环可靠性影响

研究混装球栅阵列(Ball grid array,BGA)回流焊后产生的残余应力对热循环寿命产生影响。根据Sn63Pb37/Sn3.0Ag0.5Cu均匀混装BGA封装实体,建立有铅和混装BGA封装体ANSYS有限元模型。通过加载不同峰值温度(220~265℃)和不同降温速度(1~6℃/s)的回流温度曲线后,得到BGA封装体焊点残余应力、应变。随后选取峰值温度243℃、降温速度3℃/s条件下的回流焊后BGA封装体模型施加热循环载荷,根据修正Coffin-Manson方程预测焊点寿命。研究结果表明:回流焊中降温速度对焊后应力占主导因素,应力降温速度的增加逐渐由27.9 MPa增加到32.5 MPa,而峰值温度对焊后应变影响明显;热循环分析中BGA焊球左上角区域始终处于高应力应变状态,均匀混装BGA寿命稍低于SnPb焊点BGA;回流焊工艺后进行热循环加载结果表明残余应力对Sn63Pb37/Sn3.0Ag0.5C均匀混装BGA寿命影响不大。     

BGA无铅焊点再流焊焊后残余应力分析与优化

建立BGA无铅焊点再流焊焊后残余应力有限元分析模型,对其进行热结构耦合条件下的焊后残余应力分析;基于钻孔应变法设计并完成了焊后残余应力测量验证性试验;基于灵敏度法分析焊点高度、焊点直径、焊盘直径和焊点间距对焊点残余应力影响的显著性及大小排序;以对残余应力影响显著的因素为变量,采用响应面-遗传算法对焊点结构参数进行了优化。结果表明,验证试验结果证明了仿真分析结果的有效性;置信度为90%时,焊点直径、焊点间距和焊点高度对焊点残余应力影响显著,灵敏度从大到小排序为焊点直径焊点间距焊点高度;焊点焊后残余应力最小的最优结构参数水平组合如下:焊点直径0.55mm、焊点高度0.36mm、焊点间距1.07mm;对该焊点仿真验证表明最大焊后残余应力下降了0.998MPa。研究结果对减小BGA焊点焊后残余应力具有一定的指导意义和参考价值。     

跌落碰撞下球栅阵列无铅焊点寿命分析

基于跌落试验与有限元模拟结果进行球栅阵列(ball grid array,BGA)无铅焊点的跌落碰撞寿命分析。首先用统计学的方法,建立跌落碰撞下不同脉冲幅值与脉冲时间的BGA封装无铅焊点寿命预测模型,并通过其寿命预测模型定量评估BGA无铅焊点的跌落碰撞寿命;接着用Power原理建立一个将焊点最大拉应力与焊点失效时跌落次数联系起来的焊点寿命预测模型。无铅焊点寿命预测模型的研究对封装的设计及其可靠性提高具有一定的指导意义。     

回流焊工艺中PBGA焊点失效研究

在PGBA封装中,焊点不仅提供机械支撑、电传导和热传导等作用,同时承受着电子设备的高温运行中,频繁的受热、机械、电载荷作用。因此,考虑到焊点质量直接关系到PGBA产品在实际应用中的可靠性,采用有限元方法研究了PBGA焊点在回流焊工艺中热应力、应变的分布规律,确定最大应力、应变位置,进而预测PBGA焊点结构失效危险点。结果表明,PBGA焊点最大应力、应变均出现在焊点与BGA、PCB连接面拐角位置,由此可知,PBGA拐角处焊点为结构失效危险点。     

基于焊点形态分析的小节距BGA焊盘尺寸设计

为了寻找BGA焊点体积、焊盘尺寸及焊点节距之间的最佳匹配关系以提高焊接成品率,研究了焊点形态对焊接高度的影响。通过Runge-Kutta方法求解带体积约束的Young-Laplace方程,仿真分析了特定节距下焊点体积与焊盘尺寸对焊接效果的影响。结果表明,焊点体积的变化会使得整个焊点高度与承载力的关系曲线向左或者向右平移,而焊盘直径则对焊点的最大高度影响更加明显。需要同时改变焊点体积及焊盘直径以得到能够适应相应封装形式的翘曲变形。最后,按照中兴通讯股份有限公司某封装的0.4mm节距BGA的标准,分析了0.35mm节距及0.3mm节距BGA封装下焊点体积与焊盘直径的最佳匹配关系。     

气孔缺陷位置对SMT焊点热疲劳寿命影响的数值分析

通过用统一的粘塑性本构方程描述SMT焊点的力学行为，对气孔缺陷在SMT焊点中不同位置的情况建立二维有限元分析模型，并采用有限元方法分析了气孔位置对SMT焊点疲劳寿命的影响。分析发现，与无缺陷焊点相比，气孔使焊点中应力应变分布发生了改变，使焊点疲劳寿命缩短；焊角、焊趾和焊点中部位置的气孔对焊点中的应力应变和焊点的疲劳寿命影响较小，而焊点根部气孔的影响则显著。     

板级光互连模块BGA焊点温振耦合应力应变有限元分析

基于Ansys软件建立了板级光互连模块有限元模型,并对模型进行了温振耦合加载分析,获取了耦合条件下应力应变的数据,分析了焊点高度、焊盘直径和焊球体积三种焊点形态参数的变化对焊点应力应变的影响。结果表明:焊点阵列内应力应变由中间位置处焊点向两端边角处焊点逐渐增大;最大应力应变出现于焊点阵列边角处的焊点上;随着焊点高度的增加,焊点阵列的最大应力应变逐渐增大,随着焊盘直径增大和焊球体积的增加,最大应力应变逐渐减小。     

无铅微互连焊点力学行为尺寸效应的试验及数值模拟

采用高精度微拉伸试验和有限元数值模拟方法研究不同微尺度的Sn-Ag-Cu无铅钎料模拟互连焊点力学行为和性能演变的尺寸效应。结果表明,当焊点高度恒定(225μm)而焊点直径逐渐减小(475～200μm)时,拉伸断裂强度显著提高且远高于体钎料的抗拉强度,断裂应变也逐渐增加;焊点的断裂位置及模式由较大直径时的界面低延性断裂转变为小直径时焊点中间部位的大变形颈缩断裂。模拟结果表明,由于焊点内力学拘束水平的不同,小直径焊点的界面应力较低且最大应力分布在焊点中间部分,易导致断裂发生在焊点中部,接头强度应较高;而大直径焊点中最大应力处于焊点界面,易导致界面金属间化合物层在较低外加应力下起裂,焊点断裂强度应较低。     

钢板点焊翘曲缺陷对平均应力强度因子的影响

车身焊接易造成翘曲缺陷,显著影响其疲劳寿命。针对翘曲缺陷对平均应力强度因子的影响,基于力学理论和有限元法,将焊点模型模块化,对比分析仿真得出的合格焊点平均应力强度因子ΔKqua与翘曲缺陷焊点平均应力强度因子ΔKdef。通过寻找影响因素及影响规律,提出翘曲因子C的概念并通过仿真验证其适用性。仿真分析与理论推导得出的平均应力强度因子间的平均误差小于6%。试验结果表明,经翘曲因子修正的翘曲缺陷焊点ΔKdef的平均准确率为84.6%。     

Reliability Evaluation of QFN Devices Soldered Joints with Creep Model

The solder joint reliability of quad flat non-lead (QFN) package,which has become very popular over the past few years,has received intense interest.The finite element method (FEM) is essential to evaluate the reliability of QFN device.In this paper,Garofalo-Arrheninus model was implemented to simulate the deformation of QFN soldered joints.Equivalent creep strain of the soldered joints was calculated by means of finite element analyses,and was used to evaluate the reliability of QFN packages.It is found that the critical soldered joint of QFN is located the package corner while the maximum creep strain is obtained at the top interface of peripheral soldered joint.The creep strain is provided with periodicity and additivity as the thermal cycling.Nonlinear analysis of QFN package with different lead counts was presented as well,in which the phenomenon that the value of induced creep strain arise as the package size decreasing is noted.Moreover,SnPb and two lead-free solders,namely,Sn3.5Ag/Sn3.8Ag0.7Cu,were both taken into consideration.Simulated results indicate that the creep strain value of lead-free soldered joints is lower than that of SnPb soldered joints,which can be attributed to the difference of stiffness and coefficient of thermal expansion among three solders.Garofalo-Arrheninus model is used to calculate the creep strain of the QFN device for the first time in this study.The results provide an important basis for evaluating the reliability of QFN package.     

Fatigue life estimation of FBGA memory device under vibration

This paper predicts the fatigue life of fine-pitch ball grid array (FBGA) solder joints in memory devices due to harmonic excitation through experiments and finite element analysis. Finite element models of the memory device with simplified solder joints and with detailed solder joints were developed as a global model and a local model, respectively. A global-local modeling technique was used in the finite element simulation to calculate the stress magnitude of solder joints in the memory device under vibration. Stress versus life (S-N) curve was generated for the memory devices under various vibration levels to derive the fatigue constants of solder material. The fatigue life of the memory device was then determined by using the Basquin equation and Miner’s rule. It was experimentally verified that the predicted fatigue life of the memory device under cumulative damage conditions matches the experimental results within reasonable accuracy.     

BGA结构无铅微焊点的低周疲劳行为研究

基于塑性应变能密度概念提出微焊点低周疲劳裂纹萌生、扩展和寿命预测模型,阐明其与连续介质损伤力学的联系,评估应力三轴度对预测模型的影响,并通过试验和数值计算相结合的方法确定出微米尺度球栅阵列(Ball grid array,BGA)结构单颗Sn3.0Ag0.5Cu无铅焊点(高度为500～100 μm,焊盘直径为480 μm)疲劳裂纹萌生和扩展模型中的相关常数。研究结果表明,疲劳裂纹萌生和扩展循环数与每个循环所产生的塑性应变能密度均呈幂函数关系;应力三轴度会影响疲劳裂纹扩展速率,并最终影响焊点的疲劳寿命;应力三轴度与加载方式有关,拉伸载荷下焊点的应力应变行为受异种材料界面和封装结构力学约束作用的影响,应力三轴度随焊点高度降低而明显升高;而剪切载荷作用下焊点中的力学约束十分有限,焊点高度变化对应力三轴度的影响非常小;测得的高度为100 μm焊点的疲劳裂纹扩展相关常数可以很好地用于预测其他不同高度焊点的疲劳寿命,表明所提出的预测模型可以有效地减小由几何结构和体积变化造成的塑性应变能集中现象对焊点疲劳寿命的影响。     

Prediction enhancement of the J-lead interconnection reliability of land grid array sockets

The solder joint is a key component in land grid array (LGA) sockets. A simplified solder joint has been widely used in finite element model (FEM) computations because the J-lead interconnection solder joint is relatively complex. Therefore, there are discrepancies between the physical phenomenon and FEM simulations. In this study, an alternative method to simulate the J-lead interconnection solder joint through an interface program using surface evolver software is presented. Simulations of the J-lead interconnection solder joint were improved to reduce the mismatch between the actual physical shape and the simplified finite element models that are typically used to predict component reliability. To perform these simulations, an interface program capable of simulating solder interconnections for twelve different pad–solder combinations was developed. Predictions of J-lead interconnection solder joints were carried out using the interface program. Geometric comparisons between experimental data and predictions showed good agreement, with the exception of wetting height. To evaluate the prediction accuracy of the simulated J-lead solder joints, FEM analysis was performed for the static load and the thermal cycle.

     

A study on μBGA solder joints reliability using lead-free solder materials

In this study, the numerical prediction of the thermal fatigue life of a μBGA (Micro Ball Grid Array) solder joint was focused. Numerical method was performed using the three-dimensional finite element analysis for various solder alloys such as Sn-37%Pb, Sn-3.5%Ag, Sn-3.5%Ag0.7%Cu and Sn-3.5%Ag-3%In-0.5%Bi during a given thermal cycling. Strain values obtained by the result of mechanical fatigue tests for solder alloys, were used to predict the solder joint fatigue life using the Coffin-Manson equation. The numerical results showed that Sn-3.5%Ag with the 50-degree ball shape geometry had the longest thermal fatigue life in low cycle fatigue. A practical correlation for the prediction of the thermal fatigue life was also suggested by using the dimensionless variable γ. Additionally Sn-3.5Ag-O.75Cu and Sn-2.0Ag-0.5Cu-2.0Bi were applied to 6X8μBGA obtained from the 63Sn-37Pb Solder. This 6X8μBGA were tested at different aging conditions at 130°C, 150°C, 170°C for 300, 600 and 900 hours. Thickness of the intermetallic compound layer was measured for each condition and the activation energy for their growth was computed. The fracture surfaces were analyzed using SEM (Scanning Electron Microscope) with EDS (Energy Dispersive Spectroscopy).