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基于小波分析和克隆选择算法的模拟电路故障诊断
引用本文:彭良玉,禹旺兵. 基于小波分析和克隆选择算法的模拟电路故障诊断[J]. 电工技术学报, 2007, 22(6): 12-16
作者姓名:彭良玉  禹旺兵
作者单位:湖南师范大学物理与信息科学学院,长沙,410081;北京航空航天大学仪器科学与光电工程学院,北京,100083;湖南师范大学物理与信息科学学院,长沙,410081
基金项目:湖南省自然科学基金,湖南省教育厅科研项目
摘    要:提出一种基于人工免疫系统的模拟电路故障诊断新方法.该方法首先对电路输出节点的电压信号进行小波分解,提取各频段的能量作为故障样本;然后利用人工免疫算法对每类故障的故障样本进行自学习,得到该类故障的最优聚类中心;最后计算故障样本和学习得到的聚类中心的距离对电路故障样本进行分类,从而实现故障元件定位.计算机仿真实验结果表明,该方法对容差模拟电路故障定位具有较高的准确率.

关 键 词:人工免疫系统  克隆选择算法  小波分析  模拟电路  故障诊断
修稿时间:2006-06-16

Fault Diagnosis of Analog Circuit Based on Wavelet Analysis and Clonal Selection Algorithm
Peng Liangyu,Yu Wangbing. Fault Diagnosis of Analog Circuit Based on Wavelet Analysis and Clonal Selection Algorithm[J]. Transactions of China Electrotechnical Society, 2007, 22(6): 12-16
Authors:Peng Liangyu  Yu Wangbing
Affiliation:1. Hunan Normal University Changsha 410081 China 2. Beijing University of Aeronautics and Astronautics Beijing 100083 China
Abstract:A new method for fault diagnosis of analog circuit based on artificial immune algorithm is presented in this paper. The proposed method uses wavelet analysis as a tool to extract the fault examples,then learns the fault examples to abtain the clustering center of each fault class,and finally localizes the fault component by calculating the distance between the fault example and the clustering centers. The simulation result shows that the proposed method has the capability to diagnose faults in tolerance circuits and achieves satisfactory accuracy.
Keywords:Artificial immune system  clonal selection algorithm  wavelet analysis  analog circuit  fault diagnosis
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