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Decay of capacitance on ceasing formation of anodic oxide films on tantalum |
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| Authors: | L Young |
| Affiliation: | a Department of Computer and Electrical Engineering, The University of British Columbia, Vancouver, British Columbia, Canada V6T 1Z4 b Advanced Materials and Process Engineering Laboratory (AMPEL), The University of British Columbia, Vancouver, British Columbia, Canada V6T 1Z4 |
| Abstract: | The decrease with time in the capacitance of anodic oxide films on tantalum after ceasing film growth by reducing the field in the oxide was investigated. No dependence was observed of the amount and rate of change in relative dielectric permittivity on the initial current density. The kinetics of this effect are therefore different from those for the decay of the latent ionic conductivity. |
| Keywords: | Anodic oxides Tantalum Capacitance decay Permittivity Ionic conductivity |
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