SRAM型FPGA中轨应用可靠性分析

SRAM型FPGA在空间应用面临严重的单粒子效应问题，已有的研究大多集中在GEO和LEO轨道。由于中轨卫星的星上大容量信号处理需求日益增长，迫切需要寻求在容量、寿命与可靠性、成本之间折衷的有效解决方案，SRAM型FPGA能否满足中轨应用的可靠性需求成为关键问题。本文基于1/2恒星日回归轨道的中轨应用场景，选取了四款Xilinx FPGA，在日常辐射环境与太阳质子事件相结合的情况下进行了FPGA的可靠性分析，给出了三模冗余与定期刷新容错手段的选取策略，并讨论了对抗太阳质子事件的可行方案。结果表明，即使在最恶劣的辐射环境下，采用三模冗余结合周期刷新的加固手段，商业级FPGA也可达到同宇航级FPGA相当的可靠性水平。

The Reliability Analysis of SRAM-based FPGA in MEO

SRAM-based FPGAs are very vulnerable to serious radiation-induced Single Event Effects. Most of the existing research focuses on GEO and LEO applications. Due to the growing demand for high capacity onboard signal processing, it is urgent to find an effective solution to a tradeoff between capacity, life, reliability, and cost for MEO satellites. Therefore, whether SRAM-based FPGA can meet the reliability requirements in MEO is a key issue. This paper aims at the MEO which altitude equal to 1/2 sidereal day, selects four Xilinx FPGAs and analyzes their reliability in the combination of solar quiet and solar flare events. The selection strategies of triple modular redundant and periodic scrubbing fault tolerance are proposed. Moreover, this paper studies the processing method to cope with the solar flare. The results show that even in the worst radiation environment, commercial FPGA can achieve almost the same level of reliability compare with space FPGA by using TMR and combined with periodic scrubbing.