首页 | 官方网站   微博 | 高级检索  
     

数据采集片上系统动态性能测试的新方法
引用本文:李倩,马晓燕,鲁华祥. 数据采集片上系统动态性能测试的新方法[J]. 电子技术应用, 2008, 34(1): 111-113
作者姓名:李倩  马晓燕  鲁华祥
作者单位:中国电子信息产业发展研究院信息技术研究所,北京,100846;中国科学院半导体研究所,神经网络实验室,北京,100083
基金项目:国家自然科学基金 , 国家高技术研究发展计划(863计划)
摘    要:提出一种新的方法用于高精度数据采集片上系统的动态性能测试。该方法利用高维空间几何矢量投影的思想,将正弦响应信号向由其各次谐波组成的正交基投影来拟合测试数据,以残差的负熵作为拟合结束的判据,使残差最大限度接近白噪声,避免了传统以残差最小为判据的过拟合问题。实验证明了该方法的有效性。

关 键 词:高维空间投影  负熵  白噪声  动态性能
修稿时间:2007-06-09

A new method for testing the dynamic performance of the data acquisition system on chip
LI Qian,MA Xiao Yan,LU Hua Xiang. A new method for testing the dynamic performance of the data acquisition system on chip[J]. Application of Electronic Technique, 2008, 34(1): 111-113
Authors:LI Qian  MA Xiao Yan  LU Hua Xiang
Affiliation:LI Qian1,MA Xiao Yan2,LU Hua Xiang2 (1. The Institute of Information Technology,China Center of Information Industry Development,Beijing 100846,China) (2. Neural Network Laboratory,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China)
Abstract:A new method is proposed to test the dynamic performance of the high-resolution data acquisition system on chip. The method is based on the thought of the geometric projection in the high dimension space. The test data are approached by projecting them onto several orthonormal harmonic basis vectors. The objective function of the method is the negentropy of the residue in order to make it approach to the white noise. It can avoid the overfitting problem caused by using the least mean square of the residue a...
Keywords:projection in the high dimension space  negentropy  white noise  dynamic performance  
本文献已被 CNKI 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司    京ICP备09084417号-23

京公网安备 11010802026262号