Determination of sulphur and copper depth distribution in patina layers using nuclear reaction techniques

A method for Cu and S profiling in patina layers was developed by applying a combination of nuclear reaction analysis (NRA) and Rutherford backscattering spectroscopy (RBS). The copper profiling was performed by using the 1327 keV γ-ray deexciting the third excited state to the ground state of ⁶³Cu produced by the reaction ⁶³Cu(p,p^′γ)⁶³Cu. For the determination of sulphur the 2230 keV γ-ray was used deexciting the first excited state to the ground state of ³²S formed through the reaction ³²S(p,p^′γ)³²S, which exhibits three sharp resonances at projectile energies 3.094, 3.195 and 3.379 MeV. The relevant cross-sections were measured in the energy range between 3.0 and 3.7 MeV in steps of 20 keV at 125° to the incident proton beam direction. The technique was tested using artificially produced and natural copper patina layers. Supporting information on the depth distribution of the constituent elements of the patina samples was obtained by p-RBS (E_p: 1.5 MeV, θ: 160°).