离子迁移谱(IMS)技术中漂移管的多物理场仿真方法研究

漂移管是离子迁移谱(IMS)检测仪的核心部件,设计优劣直接影响IMS仪器的性能。离子在漂移管中的运动十分复杂,受电场及气流、温湿度、压强等多种环境因素的影响。为了研究离子在漂移管中的迁移过程,为IMS漂移管的设计和优化提供指导,本文建立了一种基于SIMION/SDS的多物理场仿真方法,综合考虑了电场、气流、温度及压强等因素的影响,模拟离子在漂移管中的运动。选择IMS标准剂进行实验测试,将仿真结果与实测的离子迁移谱图进行对比分析,验证该仿真方法的正确性。结果表明,漂移管的多物理场仿真方法能够有效地模拟多环境因素影响下离子在漂移管中的迁移情况,对漂移管的设计优化有着重要的意义。

A method of multi-physics simulation for drift tubein ion mobility spectrometer

Drift tube is the core components of ion mobility spectrometer,its design directly affects the performance of IMS instruments.In the drift tube,Ions’ movement is very complex,which is influenced by the electric field,airflow,temperature,humidity,pressure and other environmental factors.In order to study process of ion mobility in drift tube,a multi-physics simulation method based on SIMION/SDS has been established.By integrating factors such as electric field,airflow,temperature and pressure,we simulated ions’ movement in the drift tube. Then experiments were conducted with IMS standard compounds,and the result was analyzed.It shows that the multi-physics simulation method can effectively simulate the migration process of ions under the influence of multi-factor in drift tube,which will provide an important significance for the design and optimization of IMS drift tube.