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UHF fading in factories
Authors:Rappaport   T.S. McGillem   C.D.
Affiliation:Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA;
Abstract:The authors detail the results of narrowband propagation measurements performed at five factories. The extensive empirical data indicate that path loss is dependent upon local surroundings and is log-normally distributed, temporal fading is Rician, and small-scale signal fluctuations due to receiver motion are primarily Rayleigh, although Rician and log-normal distributions fit some of the data. Shadowing effects of common factory equipment likely to obstruct indoor radio paths are also examined
Keywords:
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