UHF fading in factories |
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Authors: | Rappaport T.S. McGillem C.D. |
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Affiliation: | Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA; |
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Abstract: | The authors detail the results of narrowband propagation measurements performed at five factories. The extensive empirical data indicate that path loss is dependent upon local surroundings and is log-normally distributed, temporal fading is Rician, and small-scale signal fluctuations due to receiver motion are primarily Rayleigh, although Rician and log-normal distributions fit some of the data. Shadowing effects of common factory equipment likely to obstruct indoor radio paths are also examined |
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