计算机查找方法在集成电路ESD故障定位中的应用

为了缩短复杂集成电路在ESD测试中出现的故障问题的定位次数及定位时间,提出了五种测试定位方法。对这些方法以顺序查找法、二分查找法及分块查找法为基础进行了定位次数及定位时间的通用公式推导,进而进行了定位次数及定位时间的分析对比。针对分块查找法,延伸出了三种不同的查找方法;同时针对这五种查找方法提出了测试定位效率的概念。发现对于超过8个管脚的复杂集成电路,二分法是减少测试定位次数的最佳选择,分块法2是减少测试定位时间及提升测试定位效率的最佳选择;对于少于8个管脚的集成电路,顺序法和二分法是较好的选择方法。

Application of computer search method in failure localization of ESD in IC

In order to shorten the number and time of localization of the failures in ESD testing of complex integrated circuits,five test locating methods are proposed.Based on sequential search method,binary search method and blocking search method,the general formulas of the number and time of localization are deduced,and then the analysis and comparison of the number and time of localization are made.Three different searching methods are extended for blocking search method.At the same time,the concept of test localization efficiency is proposed for these five search methods.It is found that for complex integrated circuits with more than 8 pins,binary search method is the best choice to reduce the number of test localization,while blocking search method 2 is the best choice to reduce the test localization time and improve the test localization efficiency.For IC with less than 8 pins,the sequential search method and binary search method are better choices.