SIMS Determination of μg g−1-Level Fluorine in Geological Samples and its Concentration in NIST SRM 610

The fluorine concentration in NIST SRM 610 was determined by SIMS to be 295 16 μg g⁻¹ (5.40% relative standard deviation). Accuracy of the measurement was determined from a calibration involving the synthesis of glass calibration samples doped with varying concentrations of fluorine and characterized by electron microprobe analysis and SIMS. The calibration was accurate to about 5%. Multiple analyses of the calibration samples and SRM 610 in three different analytical sessions combine to produce a low relative standard deviation of the mean (0.23% RSD) in the mean fluorine value for SRM 610. Analytical uncertainty in the fluorine value was 5.40% (RSD), originating from a combination of calibration and ion counting uncertainties as determined from multiple analyses. Evaluation of the SIMS technique using the new fluorine value in SRM 610 shows that this element can be determined with a precision and accuracy superior to that of EPMA. Measurements of fluorine in igneous and hydrothermal zircon suggest that F-ligands may have been responsible for Zr transportation in hydrothermal fluids also responsible for W-Au mineralisation. Other applications for low-level fluorine determinations may include melt inclusions and nominally anhydrous mineral phases, particularly mantle phases.