用于空间电荷陷阱能量测量的热刺激放电法与光刺激放电法的比较(英文) |
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作者姓名: | 朱智恩 张冶文 安振连 郑飞虎 雷清泉 |
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作者单位: | Department of Electrical Engineering, Tongji University;NARI Group Corporation (State Grid Electric Power Research Institute);State Key Laboratory Breeding Base of Dielectrics Engineering, Harbin University of Science and Technology |
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基金项目: | Project supported by National Natural Science Foundation of China (51077101, 51277133);National Basic Research Program of China (973 Program) (2009CB 724505) |
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摘 要: | The space charge behavior of a dielectric under HVDC is influenced by the charge trap energy distribution in it. Hence, we in- vestigated the charge trap distributions in several kinds of typical polymer materials using thermally stimulated discharge (TSD) and photo-stimulated discharge (PSD) methods, respectively. The experimental results show that,there is a significant difference between the trap energy distributions obtained by the two methods, but the difference decreases with the increase of the melting point of polymers. This is attributed to the change of the trap center environment during TSD caused by the increasing movements of both main chains and branched chains in polymers. PSD method is more accurate for investigating charge trap distribution in dielectrics, especially for polymers with low melting points.
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关 键 词: | photo-stimulated discharge thermally stimulated discharge space charge charge trap energy distribution polymer dielectrics melting point |
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