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Soft X-ray amplification by Li-like Al10+ and Si11+ ions in recombining plasmas
Authors:Zhi-zhan Xu  Zheng-quan Zhang  Pin-zhong Fan  Shi-sheng Chen  Li-huang Lin  Pei-xiang Lu  Xian-pin Feng  Xiao-fang Wang  Jin-zhi Zhou  Ai-di Qian
Affiliation:(1) Shanghai Institute of Optics and Fine Mechanics, Academia Sinica, P.O. Box 8211, Shanghai, PR China
Abstract:Experimental studies of soft X-ray lasers were carried out on the six-beam laser facility and the LF 12 laser facility of SIOM. Using a home-made one-dimensional spatially resolved grazing incidence grating spectrograph, XUV amplification has been observed in Li-like aluminum and silicon ions, by irradiation of slab targets with a line-focused laser. Based on time-integrated measurement, gain coefficients are 3.1 cm–1 for the 105.7 Å 5f–3d transition in Li-like Al ions, and 1.5 cm–1 and 1.4 cm–1 for the 88.9 Å 5f–3d and the 87.3 Å 5d–3p transitions in Li-like Si ions, respectively. The maximum gain × length products (GL) are about 2.5.
Keywords:42.55H  07.85  32.20  52.25P
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