Soft X-ray amplification by Li-like Al10+ and Si11+ ions in recombining plasmas |
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Authors: | Zhi-zhan Xu Zheng-quan Zhang Pin-zhong Fan Shi-sheng Chen Li-huang Lin Pei-xiang Lu Xian-pin Feng Xiao-fang Wang Jin-zhi Zhou Ai-di Qian |
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Affiliation: | (1) Shanghai Institute of Optics and Fine Mechanics, Academia Sinica, P.O. Box 8211, Shanghai, PR China |
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Abstract: | Experimental studies of soft X-ray lasers were carried out on the six-beam laser facility and the LF 12 laser facility of SIOM. Using a home-made one-dimensional spatially resolved grazing incidence grating spectrograph, XUV amplification has been observed in Li-like aluminum and silicon ions, by irradiation of slab targets with a line-focused laser. Based on time-integrated measurement, gain coefficients are 3.1 cm–1 for the 105.7 Å 5f–3d transition in Li-like Al ions, and 1.5 cm–1 and 1.4 cm–1 for the 88.9 Å 5f–3d and the 87.3 Å 5d–3p transitions in Li-like Si ions, respectively. The maximum gain × length products (GL) are about 2.5. |
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Keywords: | 42.55H 07.85 32.20 52.25P |
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