Measurement of thermal expansivity of low-expansion glasses by interferometric methods: Results of an interlaboratory comparison |
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Authors: | H. Imai M. Okaji T. Kishii H. Sagara H. Aikawa R. Kato |
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Affiliation: | (1) National Research Laboratory of Metrology, 1-1-4 Umezono, Tsukuba, 305 Ibaraki, Japan;(2) Toshiba Glass Corporation, 3583-5 Kawajiri, Yoshida-machi, Kanbara-gun, 421-03 Sizuoka, Japan;(3) Hoya Corporation, 572 Miyazawa-cho, Akishima-shi, 196 Tokyo, Japan;(4) Shinku-Riko Inc., 300 Hakusan-cho, Midori-ku, 226 Yokohama, Japan |
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Abstract: | An interlaboratory testing program on the measurement of the linear thermal expansion coefficient of low-expansion glasses has been carried out. Three different types of interferometric dilatometers, each located at three different organizations, and two kinds of low-expansion glass materials were selected for the experiments. As a result of the comparison, a reasonable agreement among the different measuring instruments was confirmed, and it was determined that the thermal expansion coefficient for low-expansion glasses can be measured with an accuracy of ±4×10–8 K–1 by using commercially available interferometric dilatometers. |
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Keywords: | coefficient of linear thermal expansion dilatometry interferometric dilatometer low-expansion glasses reference method thermal expansion standardization |
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