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MEMS用Si台面及SiO2/Si衬底上3C-SiC的LPCVD生长
引用本文:孙国胜,王雷,巩全成,高欣,刘兴昉,曾一平,李晋闽.MEMS用Si台面及SiO2/Si衬底上3C-SiC的LPCVD生长[J].人工晶体学报,2005,34(6):982-985,976.
作者姓名:孙国胜  王雷  巩全成  高欣  刘兴昉  曾一平  李晋闽
作者单位:中国科学院半导体研究所,北京,100083;中国科学院半导体研究所,北京,100083;中国科学院半导体研究所,北京,100083;中国科学院半导体研究所,北京,100083;中国科学院半导体研究所,北京,100083;中国科学院半导体研究所,北京,100083;中国科学院半导体研究所,北京,100083
基金项目:Project supported by Special Funds for Major State Basic Research Project ( No. G20000683 )
摘    要:本文报道用在Si台面及热氧化SiO2衬底上3C-SiC薄膜的LPCVD生长,反应生长使用的气体为SiH4和C2H4,载气为H2,采用光学显微镜、X射线衍射(XRD)、X射线光电子能谱(XPS)、扫描电镜(SEM)、以及室温Hall测试对所生长的3C—SiC材料进行了测试与分析,结果表明在3C-SiC和SiO2之间没有明显的坑洞形成。

关 键 词:3C-SiC  LPCVD生长  Si台面  SiO2/Si
文章编号:1000-985X(2005)06-0982-04
收稿时间:2005-07-14
修稿时间:2005-07-14

LPCVD Growth of 3C-SiC on Si Mesas and SiO2/Si Substrates for MEMS Applications
SUN Guo-sheng,WANG Lei,GONG Quan-cheng,GAO Xin,LIU Xing-fang,ZENG Yi-ping,LI Jin-min.LPCVD Growth of 3C-SiC on Si Mesas and SiO2/Si Substrates for MEMS Applications[J].Journal of Synthetic Crystals,2005,34(6):982-985,976.
Authors:SUN Guo-sheng  WANG Lei  GONG Quan-cheng  GAO Xin  LIU Xing-fang  ZENG Yi-ping  LI Jin-min
Affiliation:Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
Abstract:This paper presents the development of LPCVD growth of 3C-SiC thin films grown on Si mesas and thermally oxidized SiO2 masks over Si with an area of 150 × 100μm2 and SiO2/Si substrates. The growth has been performed via chemical vapor deposition using SiH4 and C2H4 precursor gases with carrier gas of H2. 3C-SiC films on these substrates were characterized by optical microscopy, X-ray diffraction ( XRD ), X-ray photoelectron spectroscopy ( XPS), scanning electron microscopy (SEM) and room temperature Hall effect measurements. It is shown that there were no voids at the interface between 3C-SiC and SiO2.
Keywords:3C-SiC  LPCVD growth  Si mesas  SiO2/Si
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